मिला
59
के लिए उत्पाद "high resolution microscope
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0.15 एनएम उच्च रिज़ॉल्यूशन माइक्रोस्कोप अनुकूलित परमाणु माइक्रोस्कोप
Advanced Atomic Force Microscope For High-Resolution Imaging Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-resolution imaging and nanoscale analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM offers atomic resolution imaging capabilities ... -
उन्नत केर माइक्रोस्कोप उच्च रिज़ॉल्यूशन माइक्रोस्कोप माइक्रोगणक और डोमेन इमेजिंग के लिए
Advanced Kerr Microscope For Micromagnetics And Domain Imaging Product Description: The Permanent Magnet Kerr Microscope is a cutting-edge tool designed for advanced micromagnetics research, offering high-resolution imaging capabilities for in-depth studies. This innovative microscope features PID ... -
बहुमुखी केर माइक्रोस्कोप स्थायी चुंबक विशेषता के लिए उच्च संकल्प माइक्रोस्कोप
Kerr Microscope For High Resolution Permanent Magnet Characterization Product Description: The Permanent Magnet Kerr Microscope is a cutting-edge tool designed for advanced magneto-optical microscopy applications, offering exceptional optical resolution of 450 nm. This microscope is equipped with ... -
उच्च स्कैनिंग बल माइक्रोस्कोप 0.15 एनएम उच्च संकल्प माइक्रोस्कोप के लिए
High Scanning Force Microscope For Wafe Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument used for high-resolution imaging and surface analysis in various fields such as nanotechnology, materials science, and biology. With its advanced capabilities and precise ... -
फोर्स मॉड्यूलेशन स्कैनिंग परमाणु माइक्रोस्कोप उच्च संकल्प विज्ञान माइक्रोस्कोप 0.04 एनएम
Force Modulation Scanning Atomic Force Microscope With High Resolution Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-resolution imaging and analysis at the nanoscale level. With its advanced capabilities, this microscope offers unparalleled ... -
उच्च रिज़ॉल्यूशन परमाणु बल माइक्रोस्कोप 0.04 एनएम औद्योगिक माइक्रोस्कोप नैनोस्केल विश्लेषण के लिए
High-Resolution Atomic Force Microscope For Nanoscale Analysis Product Description: The Atomic Force Microscope (AFM) is a versatile tool for surface analysis, commonly used in various scientific and industrial applications. This cutting-edge device offers exceptional scanning capabilities and ... -
उच्च-रिज़ॉल्यूशन चुंबकीय माइक्रोस्कोपीः केएमपीएल-पीएम के साथ स्थायी चुंबकों की विशेषता
Product Description: The Kerr Microscope is a highly advanced and versatile instrument designed for Magnetic Domain Observation and Strong Magnetic Field Testing, leveraging the Magneto-Optical Kerr Effect to deliver precise and detailed imaging of magnetic materials. This state-of-the-art ... -
250 एनएम केर माइक्रोस्कोप उच्च संकल्प मैग्नेट ऑप्टिकल केर प्रभाव माइक्रोस्कोप
Multifunctional Spin-Test Magneto-Optic Kerr Microscope Product Model: KMPL-S Equipment Description: This instrument enables high-resolution magnetic domain imaging of magnetic materials and spintronic chips, with a resolution of up to 250 nm. It is equipped with a highly intelligent control system ... -
स्थायी चुंबक केर माइक्रोस्कोप उच्च संकल्प चुंबक ऑप्टिकल केर प्रभाव माइक्रोस्कोप 450 एनएम
Permanent Magnet Kerr Microscope Product Introduction Designed for in-depth research on permanent magnet materials, this advanced precision testing instrument enables high-resolution precise measurement and detailed observation of longitudinal, transverse, and vertical magneto-optical Kerr effects ...