Found
8
products for "final tester
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트라이 템프 자기 칩 테스터 고신뢰성 검증용 정밀 최종 테스터
Tri Temp Magnetic Chip Tester For High Reliability Verification Product Description: Introducing the cutting-edge Magnetic Chip Final Test Machine, the ultimate solution for ATE for Magnetic Chips. This innovative product is designed to meet the demanding requirements of testing magnetic chips with precision and accuracy. The Socket Test Seat of the Magnetic Chip Final Test Machine is engineered to withstand extreme temperatures ranging from -60°C to 170°C, ensuring reliable -
트리 템프 마그네틱 칩 테스터 높은 신뢰성 검증을 위한 다재다능 최종 테스터
Tri Temp Magnetic Chip Tester For High Reliability Verification Product Description: Introducing the Magnetic Chip Final Test Machine, a cutting-edge product designed for non-destructive testing in the semiconductor industry. This advanced MRAM tester is equipped with state-of-the-art features to ensure accurate and reliable testing results. The Electric Displacement Stage Module of the Magnetic Chip Final Test Machine offers precise control with a θ-axis Adjustment Range of -
전문 자동 테스트 장비 자석 칩 생산 라인을 위한 다재다능한 최종 검사기
Automated Final Test System for Magnetic Chip Production Lines Product Description: The Magnetic Chip Final Test Machine is a cutting-edge product designed for precise and efficient testing of magnetic chips. With its advanced features and capabilities, this machine is the perfect solution for conducting thorough and accurate testing processes. One of the key features of this test machine is the Test Ambient Temperature Module. Equipped with a temperature monitoring module, -
정밀 MRAM 검사자 자기 칩 생산 라인을 위한 자동 최종 시험 시스템
Automated Final Test System For Magnetic Chip Production Lines Product Description: Excitation System1: One of the key features of this magnetic chip final test machine is the excitation system's capability to generate a maximum magnetic field intensity of ±2000 Oe along the X-axis. This high magnetic field intensity ensures thorough testing of magnetic chips for a wide range of applications. Excitation System3: Another remarkable attribute of this MRAM tester is the -
자동 MRAM 테스트 자석 칩 최종 테스트 기계 생산 및 팩 최종 테스트
Automated MRAM Tester For Production And Batch Final Testing Product Description: The Magnetic Chip Final Test Machine is an advanced Automated Tri-temp MRAM Tester designed to provide precise and reliable testing for magnetic chips. Equipped with cutting-edge features, this machine ensures accurate results and efficient performance. Excitation System3: The True Zero Value Of The Magnetic Field Under Zero Magnetic Field Is ≤0.1 Oe. This feature guarantees the machine's -
MRAM 및 스핀트로닉스 Chip 테스터 Tri Temp Ate Automated Batch Testing을위한 자동 테스트 장비
MRAM And Spintronic Chip Tester For Automated Batch Testing Product Description: The Magnetic Chip Final Test Machine is a state-of-the-art testing equipment designed to provide accurate and reliable testing for magnetic chips. With advanced features and precise specifications, this machine is an essential tool for ensuring the quality and performance of magnetic chips in various applications. Excitation System3: The True Zero Value Of The Magnetic Field Under Zero Magnetic -
다재다능한 MRAM 검사기 전기 칩 특성을 위한 고해상도 ATE 테스트 장비
ATE For Non Destructive Magnetic And Electrical Chip Properties Product Description: One of the key highlights of this product is its Excitation System2, which ensures the uniformity of the X-axis magnetic field with an impressive accuracy of ≤±1% at 2000 Oe within a Φ35 mm spherical space. This level of precision guarantees consistent and reliable test results, particularly when analyzing in-plane magnetic fields. Moreover, the Excitation System4 of the machine boasts a -
자동 MRAM 테스터 자기 칩 최종 테스트 머신 고속
Automatic Magnetic Chip Final Test Machine Product Introduction Magnetic chips, capable of providing high-speed, low-power non-volatile information storage, are considered key to solving future storage technology bottlenecks. Their excellent perfor-mance and reliability are crucial for the stable operation of electronic devices and data security. This product uses a three-temperature-zone anti-magnetic testing device to simulate magnetic field environments under different