원자력 현미경

다기능 AFM 원자력 현미경 정밀 생물학 현미경

Multi-Functional Atomic Force Microscope Product Model: AtomEdge Pro Product Description: The AtomEdge Pro multi-functional atomic force microscope canperform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. lt features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy,

웨이퍼 레벨 원자력 현미경

Wafer-Level Atomic Force Microscope Product Model: AtomMax Product Overview: Using micro-cantilever probe structures, this instrument enables 3D morphology characterization of conductive, semiconductive, and insulating solid materials, achieving wafer-level large-sample morphology characterization. Combined with an optical image, the electrically driven sample positioning stage allows for 1 μm positioning accuracy within a 200 x 200 mm area. with fully automated operations

고정밀 나노 스케일 재료 특성 분석을 위한 저소음 Z축

Product Introduction The AtomEdge Pro Multifunctional Atomic Force Microscope enables sub-nanometer-scale 3D scanning, imaging and characterization of materials, electronic devices, biological samples, and other specimens, and is widely used in fields such as materials science, chemistry and environmental science, semiconductors, microelectronics, biomedicine, and more. Featuring multiple operating modes including contact, tapping, and non-contact, it offers users greater

맞춤형 AFM 시스템 과학 산업 재료 현미경, 강력한 확장성

Customizable AFM System with Strong Scalability for Your Research Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-precision imaging and analysis in various scientific and industrial applications. With its advanced technology and superior performance, this instrument offers unparalleled capabilities for researchers and engineers working in fields such as nanotechnology, materials science, and semiconductor research. One of the key

모든 것 하나에 원자력 현미경 다기능 생물학 현미경 유연한 정밀 작동

All In One Atomic Force Microscope For Flexible Precise Operation Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool designed for nanoscale electrical measurement and analysis. This advanced instrument offers unparalleled capabilities in scanning and imaging at the nanoscale level, making it an essential device for researchers and scientists working in various fields. Key Product Attributes: Scanning Range: 100 μm X 100 μm x 10 μm Noise Level in the

고 스캔 힘 현미경 0.15 Nm 고 해상도 현미경

High Scanning Force Microscope For Wafe Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument used for high-resolution imaging and surface analysis in various fields such as nanotechnology, materials science, and biology. With its advanced capabilities and precise measurements, the AFM is an essential tool for researchers and scientists seeking detailed insights into surface properties at the nanoscale level. One of the key features of the AFM is

다기능 원자력 현미경 저소음 재료 현미경 (MFM, EFM, PFM 모드)

Multi Functional Atomic Force Microscope With MFM EFM PFM Modes Product Description: One of the key features of the AFM is its low noise levels in both the Z direction and XY direction, ensuring accurate and reliable measurements. The noise level in the Z direction is an impressive 0.04 Nm, providing exceptional sensitivity for capturing subtle surface variations and interactions. In the XY direction, the noise level is maintained at 0.4 Nm, further enhancing the precision of

0.15 Nm 고해상도 현미경 맞춤형 원자 현미경

Advanced Atomic Force Microscope For High-Resolution Imaging Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-resolution imaging and nanoscale analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM offers atomic resolution imaging capabilities that are essential for a wide range of research applications. Equipped with multiple imaging modes including Contact, Tapping, Non-Contact, Lateral Force, Force Modulation, and

생물학적 원자력 현미경 고정도 스캔 탐사 현미경 0.15 Nm 해상도

High Precision Scanning Probe Microscope 0.15 Nm Resolution Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers exceptional capabilities for nanometer resolution surface analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM product provides precise imaging and measurement of samples with dimensions up to 200 mm. One of the key features of this AFM is its versatility in probe types. Users can choose from a variety of

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