กล้องจุลทรรศน์แรงปรมาณู

กล้องจุลทรรศน์อุตสาหกรรมปรับได้สำหรับวัดศักย์ไฟฟ้าด้วยเทคนิคอะตอมมิกฟอร์ซในระดับนาโนเมตร ความละเอียดสูง

Nanoscale Potential With Atomic Force Microscope For High-Resolution Imaging Product Description: One of the key features of the AFM is its impressive scanning range, measuring at 100 μm X 100 μm X 10 μm. This wide range allows for detailed imaging and analysis of a variety of samples, from small nanoparticles to larger structures. With a scan speed ranging from 0.1Hz to 30Hz, the AFM offers versatility in capturing dynamic processes and obtaining quick results. Researchers

กล้องจุลทรรศน์แรงอะตอม 0.04 นาโนเมตร 0.1Hz - 30Hz สำหรับการวิเคราะห์พื้นผิวระดับนาโนที่แม่นยำ

Atomic Force Microscope For Precise Nanoscale Surface Analysis Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers multi-mode measurement capabilities for surface analysis at the atomic resolution level. This advanced microscope allows for detailed examination of samples with a size of up to 25 mm, providing researchers with invaluable insights into various materials and structures. One of the key features of the Atomic Force

กล้องจุลทรรศน์ AFM เสถียรภาพสูง ระบบ AFM 0.1 Hz - 30 Hz สำหรับการถ่ายภาพวัสดุ ชีววิทยา และอิเล็กทรอนิกส์

High Stability AFM For Materials Biology And Electronics Imaging Product Description: The Atomic Force Microscope is a cutting-edge scientific instrument that offers high-resolution imaging and precise measurements for a wide range of applications in nanotechnology, material science, and biological research. This advanced microscope utilizes XYZ Three-axis Full Sample Scanning method, allowing for detailed analysis of samples with exceptional accuracy. One of the key features

กล้องจุลทรรศน์แรงอะตอม 0.1 Hz - 30 Hz ความแม่นยำสูง 0.04 Nm พร้อมโหมดหลากหลาย

Advanced AFM With Multiple Modes For Nanoscale Characterization Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-precision surface analysis and nanoscale characterization. With a noise level in the Z direction of 0.04 Nm, this microscope offers exceptional sensitivity and accuracy in capturing surface details. One of the key features of this product is its generous sample size capacity of 25 mm, allowing for the examination of a

ระบบ AFM ที่สามารถปรับแต่งได้ วัสดุอุตสาหกรรมวิทยาศาสตร์ มิครสโกปที่มีความสามารถในการปรับขนาดที่แข็งแรง

Customizable AFM System with Strong Scalability for Your Research Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-precision imaging and analysis in various scientific and industrial applications. With its advanced technology and superior performance, this instrument offers unparalleled capabilities for researchers and engineers working in fields such as nanotechnology, materials science, and semiconductor research. One of the key

กล้องจุลทรรศน์แรงอะตอมแบบออลอินวัน อเนกประสงค์สำหรับชีววิทยา เพื่อการใช้งานที่ยืดหยุ่นและแม่นยำ

All In One Atomic Force Microscope For Flexible Precise Operation Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool designed for nanoscale electrical measurement and analysis. This advanced instrument offers unparalleled capabilities in scanning and imaging at the nanoscale level, making it an essential device for researchers and scientists working in various fields. Key Product Attributes: Scanning Range: 100 μm X 100 μm x 10 μm Noise Level in the

มิกรอสโกปแรงสแกนสูง มิกรอสโกปความละเอียดสูง 0.15 Nm สําหรับวาว

High Scanning Force Microscope For Wafe Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument used for high-resolution imaging and surface analysis in various fields such as nanotechnology, materials science, and biology. With its advanced capabilities and precise measurements, the AFM is an essential tool for researchers and scientists seeking detailed insights into surface properties at the nanoscale level. One of the key features of the AFM is

ไมโครสโกปพลังอะตอมหลายฟังก์ชัน ไมโครสโกปวัสดุที่มีเสียงต่ํา มีโหมด MFM EFM PFM

Multi Functional Atomic Force Microscope With MFM EFM PFM Modes Product Description: One of the key features of the AFM is its low noise levels in both the Z direction and XY direction, ensuring accurate and reliable measurements. The noise level in the Z direction is an impressive 0.04 Nm, providing exceptional sensitivity for capturing subtle surface variations and interactions. In the XY direction, the noise level is maintained at 0.4 Nm, further enhancing the precision of

กล้องจุลทรรศน์ความละเอียดสูง 0.15 นาโนเมตร กล้องจุลทรรศน์อะตอมแบบปรับแต่ง

Advanced Atomic Force Microscope For High-Resolution Imaging Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-resolution imaging and nanoscale analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM offers atomic resolution imaging capabilities that are essential for a wide range of research applications. Equipped with multiple imaging modes including Contact, Tapping, Non-Contact, Lateral Force, Force Modulation, and

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