กล้องจุลทรรศน์แรงปรมาณู

กล้องจุลทรรศน์แรงอะตอม 0.04 นาโนเมตร 0.1Hz - 30Hz สำหรับการวิเคราะห์พื้นผิวระดับนาโนที่แม่นยำ

Atomic Force Microscope For Precise Nanoscale Surface Analysis Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers multi-mode measurement capabilities for surface analysis at the atomic resolution level. This advanced microscope allows for detailed examination of samples with a size of up to 25 mm, providing researchers with invaluable insights into various materials and structures. One of the key features of the Atomic Force

กล้องจุลทรรศน์อุตสาหกรรมปรับได้สำหรับวัดศักย์ไฟฟ้าด้วยเทคนิคอะตอมมิกฟอร์ซในระดับนาโนเมตร ความละเอียดสูง

Nanoscale Potential With Atomic Force Microscope For High-Resolution Imaging Product Description: One of the key features of the AFM is its impressive scanning range, measuring at 100 μm X 100 μm X 10 μm. This wide range allows for detailed imaging and analysis of a variety of samples, from small nanoparticles to larger structures. With a scan speed ranging from 0.1Hz to 30Hz, the AFM offers versatility in capturing dynamic processes and obtaining quick results. Researchers

กล้องจุลทรรศน์ AFM เสถียรภาพสูง ระบบ AFM 0.1 Hz - 30 Hz สำหรับการถ่ายภาพวัสดุ ชีววิทยา และอิเล็กทรอนิกส์

High Stability AFM For Materials Biology And Electronics Imaging Product Description: The Atomic Force Microscope is a cutting-edge scientific instrument that offers high-resolution imaging and precise measurements for a wide range of applications in nanotechnology, material science, and biological research. This advanced microscope utilizes XYZ Three-axis Full Sample Scanning method, allowing for detailed analysis of samples with exceptional accuracy. One of the key features

High-Stability AtomEdge Pro AFM: การสแกน 3 มิติความละเอียด 4096×4096 + EFM/KPFM/PFM

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument designed for high-precision surface analysis and nanoscale electrical measurement. Renowned for its versatility and advanced functionality, this AFM offers a comprehensive suite of features that make it an indispensable tool in both research and industrial applications. With a scanning rate adjustable between 0.1 and 30 Hz, users can tailor the imaging speed to suit a wide range of sample

AtomEdge Pro: ไมโครสโกปพลังอะตอมหลายฟังก์ชัน ภาพ 3 มิติสําหรับวัสดุ

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument designed for high-precision surface analysis and characterization at the nanometer scale. This multifunctional measurement tool integrates several advanced microscopy techniques, including Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), Magnetic Force Microscopy (MFM), and Force Curve measurements. These capabilities make it

การสแกน 3 มิติแบบยืดหยุ่น สําหรับอิเล็กทรอนิกส์, วัสดุชีวภาพ และการใช้งานการวิจัยความแม่นยํา

Product Description: The Atomic Force Microscope (AFM) is a state-of-the-art instrument designed to provide unparalleled precision and versatility in surface property mapping at the nanoscale. Engineered to meet the demanding requirements of advanced research and industrial applications, this AFM offers a comprehensive suite of features that make it an indispensable tool for scientists and engineers working with semiconductors, magnetic materials, and a variety of other

การวัดแบบหลายฟังก์ชัน (MFM/EFM) สำหรับการศึกษาทางวิทยาศาสตร์แบบเจาะจง

Product Description: The Atomic Force Microscope (AFM) is a highly advanced instrument designed for multifunctional measurement, offering unparalleled versatility and precision in nanoscale imaging and analysis. This state-of-the-art AFM integrates a variety of measurement modes, including Electrostatic Force Microscope (EFM), Scanning Kelvin Probe Force Microscope (KPFM), Piezoelectric Force Microscope (PFM), Magnetic Force Microscope (MFM), and Force Curve analysis, making

แพลตฟอร์มการตรวจจับทั้งหมดในตัวเดียว โมดูลที่กําหนดเองและไมโครสโกปีหลายแรงสําหรับวิทยาศาสตร์วัสดุ

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge nanoscale characterization platform designed to provide unparalleled precision and versatility in surface analysis. With a sample size capacity of up to 25 mm, this instrument is ideal for investigating a wide range of materials and structures at the nanoscale, making it an essential tool for researchers and engineers across various scientific disciplines. One of the standout features of this AFM is its

AFM สำหรับการวิเคราะห์พื้นผิวอย่างแม่นยำและการถ่ายภาพระดับนาโนเมตรในการวิจัยทางวิทยาศาสตร์และการประยุกต์ใช้ในอุตสาหกรรม

Multi-Functional Atomic Force Microscope - AtomEdge Pro Product Introduction The AtomEdge Pro multi-functional atomic force microscope can perform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. It features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy, electrostat

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