Atomic Force Microscope

High-Stability AFM With MFM/EFM Modes For Scientific Research

Product Description: The Basic-type Atomic Force Microscope (AFM) is a versatile and high-performance instrument designed specifically for advanced nano structure analysis in both industrial R&D environments and laboratory settings. Combining precision, flexibility, and ease of use, this AFM model ...

AtomExplorer: Sub-Nanometer Resolution Atomic Force Microscope

Product Description: The Basic-type Atomic Force Microscope (AFM) is a highly versatile and reliable instrument designed to deliver precise nanoscale topography imaging with exceptional accuracy and stability. Engineered for researchers and professionals who demand high-performance scanning ...

AtomExplorer AFM: Integrated MFM, EFM & KFM For Material Analysis

Product Description: The Basic-type Atomic Force Microscope (AFM) is a cutting-edge instrument designed to deliver exceptional performance and versatility for a wide range of surface analysis applications. Engineered with advanced technology, this AFM microscope offers sub-nanometer resolution AFM ...

Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization

Product Introduction The AtomEdge Pro Multifunctional Atomic Force Microscope enables sub-nanometer-scale 3D scanning, imaging and characterization of materials, electronic devices, biological samples, and other specimens, and is widely used in fields such as materials science, chemistry and ...

Customizable AFM System Scientific Industrial Materials Microscopes With Strong Scalability

Customizable AFM System with Strong Scalability for Your Research Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-precision imaging and analysis in various scientific and industrial applications. With its advanced technology and superior performance, this ...

100μm×100μm 3D Scanning For Nanoscale Materials Science Research

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge scientific instrument designed to provide high-resolution imaging and precise surface characterization at the nanoscale. This advanced microscope is engineered to meet the demanding requirements of various research and ...

Contact/Tap Modes For Sub-nanometer Materials Nanoscale Analysis

Product Description: The Atomic Force Microscope (AFM) is an advanced Scanning Force Microscope designed to provide exceptional imaging and measurement capabilities at the nanoscale. Engineered for precision and versatility, this AFM model supports a wide range of scanning rates from 0.1 Hz up to 30 ...

Nanoscale 3D Imaging For Semiconductor & Advanced Materials Research

Product Description: The Atomic Force Microscope (AFM) is a highly advanced and versatile instrument designed to provide precise surface characterization through multiple modes of operation. This multifunctional microscope integrates a range of techniques including Electrostatic Force Microscopy ...

Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization

Product Description: The Atomic Force Microscope (AFM) is an advanced, all-in-one AFM system designed to deliver unparalleled precision and versatility for nanoscale imaging and measurements. Utilizing an XYZ three-axis full-sample scanning method, this AFM enables comprehensive and accurate surface ...

« ‹ 1 2 3 4 5 › »