AtomExplorer: The Ideal Atomic Force Microscope For R&D Labs

Product Description:

The Basic-type Atomic Force Microscope is a cutting-edge instrument designed to deliver precise, high-resolution surface analysis through advanced scanning capabilities. Utilizing an XYZ three-axis full-sample scanning method, this microscope enables comprehensive and detailed examination of samples, ensuring accurate topographical mapping across all dimensions. This full-sample scanning capability allows researchers and engineers to analyze surface structures with exceptional detail and repeatability, making it ideal for a wide range of scientific and industrial applications.

One of the standout features of this Basic-type Atomic Force Microscope is its multifunctional measurement capabilities. It is equipped to perform Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Force Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), and Magnetic Force Microscopy (MFM). These diverse measurement modes expand the utility of the microscope far beyond simple topographical imaging. Electrostatic Force Microscopy (EFM) allows users to investigate electrical properties at the nanoscale, providing valuable insights into surface charge distribution and electrostatic interactions.

Magnetic Force Microscopy (MFM) is another critical functionality of this microscope, enabling the detailed mapping of magnetic domains and magnetic forces on the sample surface. This feature is particularly useful in research fields such as data storage, spintronics, and nanomagnetism, where understanding magnetic properties at the nanoscale is essential. Additionally, the Scanning Kelvin Probe Force Microscopy (KPFM) mode offers precise measurement of surface potential and work function variations, which are crucial for semiconductor surface inspection and other material science applications.

The Piezoelectric Force Microscopy (PFM) function extends the microscope's capabilities into the study of piezoelectric materials. This mode allows for the visualization and characterization of piezoelectric domains, which is important in the development and optimization of sensors, actuators, and other piezoelectric devices. Together, these multifunctional measurements make the Basic-type Atomic Force Microscope a versatile tool for researchers working across physics, materials science, electronics, and engineering disciplines.

The microscope accommodates samples up to a size of Φ 25 mm, which covers a broad range of typical sample dimensions encountered in research laboratories and industrial environments. This sample size capacity ensures that users can analyze various specimens without the need for extensive sample preparation or size reduction, thereby preserving the integrity of the sample and streamlining the workflow.

In terms of performance, the microscope boasts an exceptionally low Z-axis noise level of 0.04 nm. This ultra-low noise floor is critical for achieving high-resolution imaging and precise force measurements, enabling the detection of minute surface features and subtle variations in sample properties. Such high sensitivity is particularly beneficial when conducting semiconductor surface inspection, where detecting nanoscale defects and variations can be crucial for device performance and reliability.

To protect the delicate probe tips used in atomic force microscopy, the Basic-type Atomic Force Microscope incorporates an advanced Tip Protection Technology known as Safe Needle Insertion Mode. This technology minimizes the risk of tip damage during probe approach and sample engagement, extending the lifespan of the tips and reducing operational costs. Safe Needle Insertion Mode ensures smooth and secure tip placement, protecting both the sample and the instrument from accidental damage.

Overall, the Basic-type Atomic Force Microscope is an indispensable tool for researchers and professionals who require a reliable, multifunctional, and high-precision instrument for nanoscale surface analysis. Its combination of XYZ three-axis full-sample scanning, multifunctional measurement modes—including Electrostatic Force Microscopy EFM and Magnetic Force Microscopy MFM—and robust tip protection make it particularly well-suited for applications such as semiconductor surface inspection and advanced materials research. With its outstanding performance parameters and versatile capabilities, this microscope represents a significant advancement in the field of atomic force microscopy technology.

Features:

• Product Name: Basic-type Atomic Force Microscope
• Image Sampling Points: 32*32 to 4096*4096
• Sample Size Capacity: Φ 25 mm
• Scanning Range: 100 μm * 100 μm * 10 μm / 30 μm * 30 μm * 5 μm
• Multifunctional Measurements including Electrostatic Force Microscope (EFM), Scanning Kelvin Probe Microscope (KPFM), Piezoelectric Force Microscope (PFM), and Magnetic Force Microscope (MFM)
• Z-Axis Noise Level: 0.04 nm
• Ideal for Surface Texture Analysis
• Perfect Industrial R&D Microscope for detailed material inspection
• Options available to Buy Atomic Force Microscope tailored to your research needs

Technical Parameters:

Applications:

The Truth Instruments AtomExplorer Basic-type Atomic Force Microscope (AFM) is an advanced tool designed for a wide range of industrial and research applications. Originating from CHINA, this high stability AFM stands out with its XYZ three-axis full-sample scanning method, enabling precise and comprehensive surface analysis. The AtomExplorer is ideal for professionals seeking reliable and multifunctional measurements in various scientific and industrial environments.

This industrial R&D microscope is perfectly suited for laboratories and research centers focusing on material science, nanotechnology, and semiconductor industries. Its multifunctional measurement capabilities include Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), and Magnetic Force Microscopy (MFM), making it a versatile instrument for studying electrical, magnetic, and piezoelectric properties at the nanoscale.

The product’s tip protection technology, featuring Safe Needle Insertion Mode, ensures the longevity and safety of the probe tips during delicate scanning processes. This feature is especially beneficial in environments where sample integrity and probe preservation are critical. With a sample size capacity of Φ 25 mm and image sampling points ranging from 32*32 to 4096*4096, the AtomExplorer offers detailed, high-resolution imaging suitable for both academic research and industrial quality control.

In practical application, the AtomExplorer Basic-type AFM is used extensively in industrial R&D settings to analyze surface topography, mechanical properties, and electrical characteristics of materials. It supports the development of new materials, the improvement of manufacturing processes, and the quality assurance of finished products. The high stability AFM ensures consistent and accurate results, which are crucial for advancing nanotechnology and microfabrication research.

Businesses and research institutions interested in this cutting-edge microscope can contact Truth Instruments for a detailed quote, as the price is negotiable based on specific requirements. The AtomExplorer is a dependable investment for those aiming to enhance their analytical capabilities with a multifunctional, high-performance atomic force microscope.