Atomic Force Microscope & Kerr Microscope Manufacture

Atomic Force Microscope

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Kerr Microscope

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Vibrating Sample Magnetometer

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Magneto Optical Cryostat

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Cryogenic Probe Station

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MRAM Tester

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Magnetic Probe Station

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Atomic Force Microscope

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Kerr Microscope

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Vibrating Sample Magnetometer

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Magneto Optical Cryostat

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Cryogenic Probe Station

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MRAM Tester

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Magnetic Probe Station

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0.1 Hz - 30 Hz Atomic Force Microscope Nanoscale Scanning Probe Microscopes

Advanced Scanning Probe Microscope for Nanoscale Measurements Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool that offers multi-mode measurement capabilities with nanometer resolution, making it an essential instrument for various research and industrial applications. ...

Wafer Scale Hysteresis Loop Tracer For Non Contact Magnetic Metrology

Wafer Scale Hysteresis Tracer For Non Contact Magnetic Metrology Product Description: The Wafer-Level Hysteresis Loop Measurement Instrument is a cutting-edge tool designed for precise and efficient characterization of magnetic properties at the wafer level. This instrument is essential for ...

Cryogenic Vertical Superconducting Magnetic Field Probe Station

Cryogenic Vertical Superconducting Magnetic Field Probe Station Product Introduction The PS1DP-Cryo closed-loop cryogenic superconducting magnet probe station, based on a 4 K closed-loop cryogenic probe station, adds a ±3 T superconducting magnet, providing a low-temperature strong magnetic field ...

4 K Cryogenic Tester with ±1.20 mK Stability and 0-67 GHz Microwave for 2-Inch Samples in a Low-Temperature Probe Station

PS-Cryo 4 K Cryogenic Probe Station The PS-Cryo 4 K cryogenic probe station is a state-of-the-art solution designed for precise electrical testing of samples at ultra-low temperatures ranging from 4 K to 420 K. This cost-effective system meets demanding requirements for researchers and engineers ...

Permanent Magnet Kerr Microscope High Resolution Magneto Optical Kerr Effect Microscope 450 nm

Permanent Magnet Kerr Microscope Product Introduction Designed for in-depth research on permanent magnet materials, this advanced precision testing instrument enables high-resolution precise measurement and detailed observation of longitudinal, transverse, and vertical magneto-optical Kerr effects ...

AtomExplorer: High-Precision Scanning Probe Microscope (SPM/AFM)

Product Description: The Basic-type Atomic Force Microscope is a cutting-edge nanoscale microscope designed to provide high-precision imaging and multifunctional measurement capabilities for a wide range of scientific and industrial applications. This advanced instrument employs an XYZ three-axis ...

AtomExplorer: Precision Topography Tool For Chips & Nanomaterials

Product Description: The Basic-type Atomic Force Microscope (AFM) is a versatile and high-performance instrument designed to meet the diverse needs of scientific research and industrial R&D applications. This multifunctional AFM is equipped with advanced measurement modes, including Electrostatic ...

AtomExplorer AFM: Integrated MFM, EFM & KFM For Material Analysis

Product Description: The Basic-type Atomic Force Microscope (AFM) is a cutting-edge instrument designed to deliver exceptional performance and versatility for a wide range of surface analysis applications. Engineered with advanced technology, this AFM microscope offers sub-nanometer resolution AFM ...

Our Strengths

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HIGH QUALITY

Trust Seal, Credit Check, RoSH and Supplier Capability Assessment. The Company has strictly quality control system and professional test lab.

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RESEARCH&DEVELOPMENT

Internal professional design team and advanced machinery workshop. We can cooperate to develop the products you need.

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MANUFACTURING

Advanced automatic machines, strictly process control system. We can manufacture all the instruments and equipment beyond your demand.

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100% SERVICE

Bulk and customized small packaging, FOB, CIF, DDU and DDP. Let us help you find the best solution for all your concerns.

2019

Year Established

100~200

Employees

15.000.000-20.000.000

Annual Sales

80+

Customers Served

Customer Testimonials

Lead Scientist, Polymer R&D

We chose their Multi-Functional Atomic Force Microscope for its versatile advanced modes beyond just imaging. We consistently get high-quality, repeatable quantitative data (KFM, MFM) on our polymer composites. The expert on-site training was invaluable, helping us accelerate our product development. A reliable workhorse instrument.

★ ★ ★ ★ ★

Metrology Manager, Global Fab

High-resolution wafer metrology is critical for our process control. Their Wafer-Level AFM has been a superb addition. The automated, multi-site measurements provide the repeatable roughness and step-height data we need to quickly troubleshoot issues and improve device yield. An essential and reliable tool for our fab.

★ ★ ★ ★ ★

Dr. Chen, Head of Core Labs

We've purchased several instruments for our shared facility, including a VSM. The entire process from consultation to installation and training was seamless. Their knowledgeable sales and expert service engineers give us great confidence. This company is a reliable partner for our critical research infrastructure.

★ ★ ★ ★ ★

Atomic Force Microscope & Kerr Microscope Manufacture

Atomic Force Microscope

Kerr Microscope

Vibrating Sample Magnetometer

Magneto Optical Cryostat

Cryogenic Probe Station

MRAM Tester

Magnetic Probe Station

Atomic Force Microscope

Kerr Microscope

Vibrating Sample Magnetometer

Magneto Optical Cryostat

Cryogenic Probe Station

MRAM Tester

Magnetic Probe Station

4 K Closed Loop Semiconductor Probe Station Vacuum Wafer Probe Station For 2 Inch Wafer Testing

Precise Cryogenic Probe Station Versatile Optical Probe Station For IV CV Microwave And Optical Testing

Cryogen Free Automated Probe Station Low Temperature Vacuum Probe Station For 4 K Device Measurements

Vacuum Cryogenic Probe Station Electrical Testing Automated Probe Station

MOKE Wafer Scanner EFEM Wafer Measurement System For Hysteresis And Magnetic Uniformity Maps

High Field Wafer Measurement System MOKE Wafer Scanner For MRAM And Magnetic Film Characterization

Wafer Level MOKE System 0.3 Mdeg For Rapid Hysteresis Loops And Process Control

Automatic MRAM Tester Magnetic Chip Final Test Machine High Speed

Professional Automated Test Equipment Versatile Final Tester For Magnetic Chip Production Lines

Versatile MRAM Tester High Resolution ATE Test Equipment For Electrical Chip Properties

MRAM And Spintronic Chip Tester Tri Temp ATE Automated Test Equipment For Automated Batch Testing

Tri Temp Magnetic Chip Tester Precision Final Tester For High Reliability Verification

1D In Plane Semiconductor Probe Station Magnetic Field Probe Station

In Plane Magnetic Probe Station Versatile DC Probe Station For Precision Device Testing

Programmable Probe Station Precise RF Probe Station For Expandable Research And Development

Magnetic Field Probe Station 0.05 mT Probing Station For Variable Temperature Testing

0.05 mT Magnetic Probe Station Precise Semiconductor Prober For Spintronics And Semiconductor Testing

In Plane And Vertical Magnetic Probe Station 140 mT Wafer Prober For Advanced Testing

Upgradeable 2D Probe Station Magnetic Field Probe Station For Precision Research And Production

140 mT Wafer Probe Stations 2D Probing Station For Spintronics And Wafer Level Testing