High Resolution Atomic Force Microscope 0.04 nm Industrial Microscope For Nanoscale Analysis
High-Resolution Atomic Force Microscope For Nanoscale Analysis Product Description: The Atomic Force Microscope (AFM) is a versatile tool for surface analysis, commonly used in various scientific and industrial applications. This cutting-edge device offers exceptional scanning capabilities and ...
Permanent Magnet Kerr Microscope Vector MOKE Microscope 450 nm For 3D Analysis Of Hard Magnetic Materials
Vector MOKE Microscope For 3D Analysis Of Hard Magnetic Materials Product Description: The Permanent Magnet Kerr Microscope is a cutting-edge tool designed for high-resolution imaging and detailed observation of magnetic materials. With a variable temperature range of 298 K to 798 K, this microscope ...
Vacuum Cryogenic Probe Station Electrical Testing Automated Probe Station
Cost Effective Cryo Probe Station For Automated Electrical Testing Product Description: The Cryogenic Probe Station is an essential tool for cryogenic device characterization, providing a cost-effective solution for researchers and engineers in various industries. This closed-cycle probe station ...
Magnetic Field Cryogenic Probe Station 360 Degrees Probing Station
Cryo Probe Station For In Plane Magnetic Device Transport Testing Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for advanced research in electrical transport property testing and spin pumping measurement. This versatile system offers precise ...
GM Refrigerated Cryogenic Probe Station with 4 K-420 K Temperature Range, Ultra-Low Electrical Leakage Current, and Multi-Probe (4-8 Arms) for Advanced Research
GM Refrigerated Probe: 4 K-420K, 4-8 Arms & I-V/C-V/Optoelectronic Research Advanced Cryogenic Probe Station The Cryogenic Probe Station is a state-of-the-art 0-67 GHz microwave-compatible 4 K cryogenic probe station designed for advanced research and development in low-temperature physics, ...
AtomEdge Pro: Multi-Functional Atomic Force Microscope – 3D Imaging For Materials
Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument designed for high-precision surface analysis and characterization at the nanometer scale. This multifunctional measurement tool integrates several advanced microscopy techniques, including Electrostatic Force ...
Multifunctional Atomic Force Microscope
Multi-Functional Atomic Force Microscope Product Model: AtomEdge Pro Product Description: The AtomEdge Pro multi-functional atomic force microscope canperform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. lt features multiple working modes such as ...
MFM/KPFM Modes For High-Precision Nanoscale Materials Characterization
Product Description: The Atomic Force Microscope (AFM) is a state-of-the-art scanning force microscope designed to provide unparalleled imaging and measurement capabilities at the nanoscale. With its advanced XYZ three-axis full-sample scanning method, this AFM allows precise and comprehensive ...
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Recently, the research team from the Center for Spintronics and Quantum Systems at the School of Materials Science and Engineering, Xi'an Jiaotong...
Recently, the research team from the Research Institute of Clean Energy and Fuel Chemistry, School of Chemical Engineering at the University of...
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