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Upgradeable 2D Probe Station Magnetic Field Probe Station For Precision Research And Production
Upgradeable 2D Probe Station For Precision Research And Production Product Description: The 2D In Plane-Vertical Magnetic Probe Station is a cutting-edge product designed for precise measurements and analysis of magnetic fields in various applications. This advanced probe station allows for detailed ...
Low-Leakage 4 K System: 2-Inch Compatibility, 0-67 GHz & ±1.20 mK Stability
Product Description: The PS-Cryo 4 K cryogenic probe station is a state-of-the-art multi-probe (4-8 arms) cryogenic optoelectronic and microwave probe station designed to meet the demanding needs of advanced research and development in low-temperature environments. Engineered for precision and ...
0.04 nm Atomic Force Microscope For Precise Nanoscale Surface Analysis
Atomic Force Microscope For Precise Nanoscale Surface Analysis Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers multi-mode measurement capabilities for surface analysis at the atomic resolution level. This advanced microscope allows for detailed ...
Multi Functional Atomic Force Microscope Low Noise Materials Microscope With MFM EFM PFM Modes
Multi Functional Atomic Force Microscope With MFM EFM PFM Modes Product Description: One of the key features of the AFM is its low noise levels in both the Z direction and XY direction, ensuring accurate and reliable measurements. The noise level in the Z direction is an impressive 0.04 nm, ...
High-Stability AFM With MFM/EFM Modes For Scientific Research
Product Description: The Basic-type Atomic Force Microscope (AFM) is a versatile and high-performance instrument designed specifically for advanced nano structure analysis in both industrial R&D environments and laboratory settings. Combining precision, flexibility, and ease of use, this AFM model ...
Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization
Product Introduction The AtomEdge Pro Multifunctional Atomic Force Microscope enables sub-nanometer-scale 3D scanning, imaging and characterization of materials, electronic devices, biological samples, and other specimens, and is widely used in fields such as materials science, chemistry and ...
Plane Magnetic Field 2 T Air Gap 10 mm Magnetic Domain Observation Featuring PID Closed loop Feedback Regulation Magnetic Field Resolution
Product Description: The Kerr Microscope is an advanced instrument designed for high resolution magnetic microscopy, offering unparalleled performance in the study and analysis of magnetic materials and phenomena. Equipped with a comprehensive set of objectives including 5*, 20*, 50*, 100*, a high...
0.1 Hz - 30 Hz Atomic Force Microscope 0.04 nm High Precision Microscope With Multiple Modes
Advanced AFM With Multiple Modes For Nanoscale Characterization Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-precision surface analysis and nanoscale characterization. With a noise level in the Z direction of 0.04 nm, this microscope offers ...
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Advanced automatic machines, strictly process control system. We can manufacture all the instruments and equipment beyond your demand.
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News
Recently, the research team from the Center for Spintronics and Quantum Systems at the School of Materials Science and Engineering, Xi'an Jiaotong...
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Recently, the research team from the Research Institute of Clean Energy and Fuel Chemistry, School of Chemical Engineering at the University of...
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