Français
Deutsch
Italiano
Русский
Español
Português
Nederlandse
Ελληνικά
日本語
한국
Polski
فارسی
বাংলা
ไทย
Tiếng Việt
العربية
हिन्दी
Türkçe
Indonesia
Magnetic Field Probe Station 0.05 mT Probing Station For Variable Temperature Testing
Probe Station For Variable Temperature And Magnetic Field Testing Product Description: The 1D In-Plane Magnetic Field Probe Station is a sophisticated tool designed for precise magnetoresistance measurement in research and testing applications. This magnetic probe station is equipped with advanced ...
Low-Leakage 4 K System: 2-Inch Compatibility, 0-67 GHz & ±1.20 mK Stability
Product Description: The PS-Cryo 4 K cryogenic probe station is a state-of-the-art multi-probe (4-8 arms) cryogenic optoelectronic and microwave probe station designed to meet the demanding needs of advanced research and development in low-temperature environments. Engineered for precision and ...
AtomExplorer: The Ideal Atomic Force Microscope For R&D Labs
Product Description: The Basic-type Atomic Force Microscope is a cutting-edge instrument designed to deliver precise, high-resolution surface analysis through advanced scanning capabilities. Utilizing an XYZ three-axis full-sample scanning method, this microscope enables comprehensive and detailed ...
Master Nanoscale Surface Characterization With AtomExplorer AFM
Product Description: The Basic-type Atomic Force Microscope (AFM) is a highly versatile and reliable Scanning Probe Microscope designed specifically for laboratories seeking advanced yet user-friendly AFM equipment. This model provides comprehensive capabilities for material surface characterization...
Basic-type Atomic Force Microscope
Product Name Basic-type Atomic Force Microscope - AtomExplorer Product Introduction The AtomExplorer Basic-type Atomic Force Microscope delivers sub-nanometer resolution for observing material surface topography and texture. It captures fine structures and minute features on material surfaces across ...
Contact/Tap Modes For Sub-nanometer Materials Nanoscale Analysis
Product Description: The Atomic Force Microscope (AFM) is an advanced Scanning Force Microscope designed to provide exceptional imaging and measurement capabilities at the nanoscale. Engineered for precision and versatility, this AFM model supports a wide range of scanning rates from 0.1 Hz up to 30 ...
Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization
Product Description: The Atomic Force Microscope (AFM) is an advanced, all-in-one AFM system designed to deliver unparalleled precision and versatility for nanoscale imaging and measurements. Utilizing an XYZ three-axis full-sample scanning method, this AFM enables comprehensive and accurate surface ...
MFM/KPFM Modes For High-Precision Nanoscale Materials Characterization
Product Description: The Atomic Force Microscope (AFM) is a state-of-the-art scanning force microscope designed to provide unparalleled imaging and measurement capabilities at the nanoscale. With its advanced XYZ three-axis full-sample scanning method, this AFM allows precise and comprehensive ...
Trust Seal, Credit Check, RoSH and Supplier Capability Assessment. The Company has strictly quality control system and professional test lab.
Internal professional design team and advanced machinery workshop. We can cooperate to develop the products you need.
Advanced automatic machines, strictly process control system. We can manufacture all the instruments and equipment beyond your demand.
Bulk and customized small packaging, FOB, CIF, DDU and DDP. Let us help you find the best solution for all your concerns.
News
Recently, the research team from the Center for Spintronics and Quantum Systems at the School of Materials Science and Engineering, Xi'an Jiaotong...
News
Recently, the research team from the Research Institute of Clean Energy and Fuel Chemistry, School of Chemical Engineering at the University of...
Our mission is to offer "High Quality" & "Good Service" & "Fast Delivery" to help our clients to gain more profits.
