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Biological Atomic Force Microscope High Precision Scanning Probe Microscope 0.15 nm Resolution
High Precision Scanning Probe Microscope 0.15 nm Resolution Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers exceptional capabilities for nanometer resolution surface analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM product provides ...
Force Modulation Scanning Atomic Microscope High Resolution Science Microscope 0.04 nm
Force Modulation Scanning Atomic Force Microscope With High Resolution Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-resolution imaging and analysis at the nanoscale level. With its advanced capabilities, this microscope offers unparalleled ...
Multifunctional MOKE Microscope 250 nm Magneto Optical Kerr Effect Microscope For SOT Analysis
Multifunctional MOKE Microscope For SOT Analysis Product Description: One of the key features of the Multifunctional Spin-Test Magneto-Optic Kerr Microscope is its Microsecond Ultrafast PulseVertical Magnetic Field, which provides a vertical magnetic field strength of 60 mT with a rise time of 0.5 ...
Vacuum Cryogenic Probe Station Electrical Testing Automated Probe Station
Cost Effective Cryo Probe Station For Automated Electrical Testing Product Description: The Cryogenic Probe Station is an essential tool for cryogenic device characterization, providing a cost-effective solution for researchers and engineers in various industries. This closed-cycle probe station ...
Upgradeable 2D Probe Station Magnetic Field Probe Station For Precision Research And Production
Upgradeable 2D Probe Station For Precision Research And Production Product Description: The 2D In Plane-Vertical Magnetic Probe Station is a cutting-edge product designed for precise measurements and analysis of magnetic fields in various applications. This advanced probe station allows for detailed ...
AtomExplorer: The Ideal Atomic Force Microscope For R&D Labs
Product Description: The Basic-type Atomic Force Microscope is a cutting-edge instrument designed to deliver precise, high-resolution surface analysis through advanced scanning capabilities. Utilizing an XYZ three-axis full-sample scanning method, this microscope enables comprehensive and detailed ...
Reliable Surface Texture Analysis: AtomExplorer Basic-type AFM
Product Description: The Basic-type Atomic Force Microscope (AFM) is an advanced piece of laboratory AFM equipment designed to deliver precise and reliable surface characterization across a wide range of materials. Engineered with high stability AFM technology, this instrument offers exceptional ...
Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization
Product Introduction The AtomEdge Pro Multifunctional Atomic Force Microscope enables sub-nanometer-scale 3D scanning, imaging and characterization of materials, electronic devices, biological samples, and other specimens, and is widely used in fields such as materials science, chemistry and ...
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Advanced automatic machines, strictly process control system. We can manufacture all the instruments and equipment beyond your demand.
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News
Recently, the research team from the Center for Spintronics and Quantum Systems at the School of Materials Science and Engineering, Xi'an Jiaotong...
News
Recently, the research team from the Research Institute of Clean Energy and Fuel Chemistry, School of Chemical Engineering at the University of...
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