Atomic Force Microscope & Kerr Microscope Manufacture

Atomic Force Microscope

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Kerr Microscope

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Vibrating Sample Magnetometer

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Magneto Optical Cryostat

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Cryogenic Probe Station

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MRAM Tester

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Magnetic Probe Station

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Atomic Force Microscope

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Kerr Microscope

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Vibrating Sample Magnetometer

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Magneto Optical Cryostat

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Cryogenic Probe Station

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MRAM Tester

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Magnetic Probe Station

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Biological Atomic Force Microscope High Precision Scanning Probe Microscope 0.15 nm Resolution

High Precision Scanning Probe Microscope 0.15 nm Resolution Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers exceptional capabilities for nanometer resolution surface analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM product provides ...

Magneto Optic Kerr Microscope 250 nm Spin Test Microscope For Comprehensive Material Characterization

SpinTest MagnetoOptic Kerr Microscope For Comprehensive Material Characterization Product Description: The Multifunctional Spin-Test Magneto-Optic Kerr Microscope is an essential tool for researchers and scientists working with magnetic thin films in the field of spintronics. This advanced MOKE ...

Cryogen Free Automated Probe Station Low Temperature Vacuum Probe Station For 4 K Device Measurements

Cryogen Free Probe Station For Automated 4 K Device Measurements Product Description: The Cryogenic Probe Station is a cutting-edge device designed for cryogen-free, cost-effective, and precise cryogenic device characterization. With its advanced features and capabilities, this probe station offers ...

4 K Closed Loop Semiconductor Probe Station Vacuum Wafer Probe Station For 2 Inch Wafer Testing

4 K Closed Loop Cryogenic Probe Station For 2 Inch Wafer Testing Product Description: The Cryogenic Probe Station is an essential tool for researchers and scientists working in the field of low-temperature measurements. This advanced equipment is designed to provide precise control over the thermal ...

Precision MRAM Tester Automated Final Test System For Magnetic Chip Production Lines

Automated Final Test System For Magnetic Chip Production Lines Product Description: Excitation System1: One of the key features of this magnetic chip final test machine is the excitation system's capability to generate a maximum magnetic field intensity of ±2000 Oe along the X-axis. This high ...

Versatile AFM Solutions For Education & Industrial Research

Product Description: The Basic-type Atomic Force Microscope (AFM) is an advanced piece of Laboratory AFM equipment designed to meet the rigorous demands of scientific research. This AFM Microscope combines precision, versatility, and reliability, making it an ideal choice for researchers who require ...

AtomExplorer: Precision Topography Tool For Chips & Nanomaterials

Product Description: The Basic-type Atomic Force Microscope (AFM) is a versatile and high-performance instrument designed to meet the diverse needs of scientific research and industrial R&D applications. This multifunctional AFM is equipped with advanced measurement modes, including Electrostatic ...

Nanoscale 3D Imaging For Semiconductor & Advanced Materials Research

Product Description: The Atomic Force Microscope (AFM) is a highly advanced and versatile instrument designed to provide precise surface characterization through multiple modes of operation. This multifunctional microscope integrates a range of techniques including Electrostatic Force Microscopy ...

Our Strengths

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HIGH QUALITY

Trust Seal, Credit Check, RoSH and Supplier Capability Assessment. The Company has strictly quality control system and professional test lab.

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RESEARCH&DEVELOPMENT

Internal professional design team and advanced machinery workshop. We can cooperate to develop the products you need.

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MANUFACTURING

Advanced automatic machines, strictly process control system. We can manufacture all the instruments and equipment beyond your demand.

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100% SERVICE

Bulk and customized small packaging, FOB, CIF, DDU and DDP. Let us help you find the best solution for all your concerns.

2019

Year Established

100~200

Employees

15.000.000-20.000.000

Annual Sales

80+

Customers Served

Customer Testimonials

Lead Scientist, Polymer R&D

We chose their Multi-Functional Atomic Force Microscope for its versatile advanced modes beyond just imaging. We consistently get high-quality, repeatable quantitative data (KFM, MFM) on our polymer composites. The expert on-site training was invaluable, helping us accelerate our product development. A reliable workhorse instrument.

★ ★ ★ ★ ★

Metrology Manager, Global Fab

High-resolution wafer metrology is critical for our process control. Their Wafer-Level AFM has been a superb addition. The automated, multi-site measurements provide the repeatable roughness and step-height data we need to quickly troubleshoot issues and improve device yield. An essential and reliable tool for our fab.

★ ★ ★ ★ ★

Dr. Chen, Head of Core Labs

We've purchased several instruments for our shared facility, including a VSM. The entire process from consultation to installation and training was seamless. Their knowledgeable sales and expert service engineers give us great confidence. This company is a reliable partner for our critical research infrastructure.

★ ★ ★ ★ ★

Atomic Force Microscope & Kerr Microscope Manufacture

Atomic Force Microscope

Kerr Microscope

Vibrating Sample Magnetometer

Magneto Optical Cryostat

Cryogenic Probe Station

MRAM Tester

Magnetic Probe Station

Atomic Force Microscope

Kerr Microscope

Vibrating Sample Magnetometer

Magneto Optical Cryostat

Cryogenic Probe Station

MRAM Tester

Magnetic Probe Station

4 K Closed Loop Semiconductor Probe Station Vacuum Wafer Probe Station For 2 Inch Wafer Testing

Precise Cryogenic Probe Station Versatile Optical Probe Station For IV CV Microwave And Optical Testing

Cryogen Free Automated Probe Station Low Temperature Vacuum Probe Station For 4 K Device Measurements

Vacuum Cryogenic Probe Station Electrical Testing Automated Probe Station

MOKE Wafer Scanner EFEM Wafer Measurement System For Hysteresis And Magnetic Uniformity Maps

High Field Wafer Measurement System MOKE Wafer Scanner For MRAM And Magnetic Film Characterization

Wafer Level MOKE System 0.3 Mdeg For Rapid Hysteresis Loops And Process Control

Automatic MRAM Tester Magnetic Chip Final Test Machine High Speed

Professional Automated Test Equipment Versatile Final Tester For Magnetic Chip Production Lines

Versatile MRAM Tester High Resolution ATE Test Equipment For Electrical Chip Properties

MRAM And Spintronic Chip Tester Tri Temp ATE Automated Test Equipment For Automated Batch Testing

Tri Temp Magnetic Chip Tester Precision Final Tester For High Reliability Verification

1D In Plane Semiconductor Probe Station Magnetic Field Probe Station

In Plane Magnetic Probe Station Versatile DC Probe Station For Precision Device Testing

Programmable Probe Station Precise RF Probe Station For Expandable Research And Development

Magnetic Field Probe Station 0.05 mT Probing Station For Variable Temperature Testing

0.05 mT Magnetic Probe Station Precise Semiconductor Prober For Spintronics And Semiconductor Testing

In Plane And Vertical Magnetic Probe Station 140 mT Wafer Prober For Advanced Testing

Upgradeable 2D Probe Station Magnetic Field Probe Station For Precision Research And Production

140 mT Wafer Probe Stations 2D Probing Station For Spintronics And Wafer Level Testing