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Biological Atomic Force Microscope High Precision Scanning Probe Microscope 0.15 nm Resolution
High Precision Scanning Probe Microscope 0.15 nm Resolution Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers exceptional capabilities for nanometer resolution surface analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM product provides ...
Precision MRAM Tester Automated Final Test System For Magnetic Chip Production Lines
Automated Final Test System For Magnetic Chip Production Lines Product Description: Excitation System1: One of the key features of this magnetic chip final test machine is the excitation system's capability to generate a maximum magnetic field intensity of ±2000 Oe along the X-axis. This high ...
140 mT Wafer Probe Stations 2D Probing Station For Spintronics And Wafer Level Testing
2D Magnetic Probe Station For Spintronics And Wafer Level Testing Product Description: The Vector Magnetic Probe Station is a cutting-edge tool designed for precise measurements of magnetic fields in Spintronic devices. It is equipped with advanced features to accurately analyze the magnetic ...
Superconducting Magnet Cryostat – Multi-Optical Windows For Low-Temp/High-Field Tests
Product Description: The MO-Cryostat is an advanced Magneto Optical Cryostat designed to provide exceptional performance and versatility for a wide range of low-temperature experimental applications. Engineered with precision and reliability in mind, this cryostat offers a unique combination of ...
4 K Cryogenic Tester with ±1.20 mK Stability and 0-67 GHz Microwave for 2-Inch Samples in a Low-Temperature Probe Station
PS-Cryo 4 K Cryogenic Probe Station The PS-Cryo 4 K cryogenic probe station is a state-of-the-art solution designed for precise electrical testing of samples at ultra-low temperatures ranging from 4 K to 420 K. This cost-effective system meets demanding requirements for researchers and engineers ...
Low-Leakage 4 K System: 2-Inch Compatibility, 0-67 GHz & ±1.20 mK Stability
Product Description: The PS-Cryo 4 K cryogenic probe station is a state-of-the-art multi-probe (4-8 arms) cryogenic optoelectronic and microwave probe station designed to meet the demanding needs of advanced research and development in low-temperature environments. Engineered for precision and ...
Low-Noise Z-Axis For High-Precision Nanoscale Materials Characterization
Product Introduction The AtomEdge Pro Multifunctional Atomic Force Microscope enables sub-nanometer-scale 3D scanning, imaging and characterization of materials, electronic devices, biological samples, and other specimens, and is widely used in fields such as materials science, chemistry and ...
MFM/KPFM Modes For High-Precision Nanoscale Materials Characterization
Product Description: The Atomic Force Microscope (AFM) is a state-of-the-art scanning force microscope designed to provide unparalleled imaging and measurement capabilities at the nanoscale. With its advanced XYZ three-axis full-sample scanning method, this AFM allows precise and comprehensive ...
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News
Recently, the research team from the Center for Spintronics and Quantum Systems at the School of Materials Science and Engineering, Xi'an Jiaotong...
News
Recently, the research team from the Research Institute of Clean Energy and Fuel Chemistry, School of Chemical Engineering at the University of...
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