Atomic Force Microscope & Kerr Microscope Manufacture

Atomic Force Microscope

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Kerr Microscope

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Vibrating Sample Magnetometer

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Magneto Optical Cryostat

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Cryogenic Probe Station

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MRAM Tester

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Magnetic Probe Station

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Atomic Force Microscope

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Kerr Microscope

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Vibrating Sample Magnetometer

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Magneto Optical Cryostat

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Cryogenic Probe Station

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MRAM Tester

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Magnetic Probe Station

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Magneto Optic Kerr Microscope 250 nm Spin Test Microscope For Comprehensive Material Characterization

SpinTest MagnetoOptic Kerr Microscope For Comprehensive Material Characterization Product Description: The Multifunctional Spin-Test Magneto-Optic Kerr Microscope is an essential tool for researchers and scientists working with magnetic thin films in the field of spintronics. This advanced MOKE ...

MOKE Wafer Scanner EFEM Wafer Measurement System For Hysteresis And Magnetic Uniformity Maps

MOKE Wafer Scanner For Hysteresis And Magnetic Uniformity Maps Product Description: Introducing the Wafer-Level Hysteresis Loop Measurement Instrument, a cutting-edge tool in Spintronics Metrology designed to meet the demanding requirements of advanced research and development in the field. This ...

In Plane And Vertical Magnetic Probe Station 140 mT Wafer Prober For Advanced Testing

In Plane And Vertical Magnetic Probe Station For Advanced Testing Product Description: The 2D In Plane-Vertical Magnetic Probe Station is a versatile tool designed for precise measurements and analysis in various applications such as electrical flipping measurement and wafer testing. This product ...

Upgradeable 2D Probe Station Magnetic Field Probe Station For Precision Research And Production

Upgradeable 2D Probe Station For Precision Research And Production Product Description: The 2D In Plane-Vertical Magnetic Probe Station is a cutting-edge product designed for precise measurements and analysis of magnetic fields in various applications. This advanced probe station allows for detailed ...

High-Vacuum 4 K Probe: 0-67 GHz, 4-8 Arms & Cost-Effective Electrical Characterization

Product Description: The Cryogenic Probe Station is an advanced and versatile instrument designed for precise cryogenic electrical characterization (I-V/C-V) measurements. It is engineered to meet the demanding requirements of researchers and engineers working with low-temperature semiconductor ...

100 μm×100 μm 3D Scanning For Nanoscale Materials Science Research

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge scientific instrument designed to provide high-resolution imaging and precise surface characterization at the nanoscale. This advanced microscope is engineered to meet the demanding requirements of various research and ...

Multifunctional Atomic Force Microscope

Multi-Functional Atomic Force Microscope Product Model: AtomEdge Pro Product Description: The AtomEdge Pro multi-functional atomic force microscope canperform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. lt features multiple working modes such as ...

Nanoscale Potential Atomic Force Microscopy Adjustable Industrial Microscopes High Resolution

Nanoscale Potential With Atomic Force Microscope For High-Resolution Imaging Product Description: One of the key features of the AFM is its impressive scanning range, measuring at 100 μm X 100 μm X 10 μm. This wide range allows for detailed imaging and analysis of a variety of samples, from small ...

Our Strengths

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HIGH QUALITY

Trust Seal, Credit Check, RoSH and Supplier Capability Assessment. The Company has strictly quality control system and professional test lab.

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RESEARCH&DEVELOPMENT

Internal professional design team and advanced machinery workshop. We can cooperate to develop the products you need.

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MANUFACTURING

Advanced automatic machines, strictly process control system. We can manufacture all the instruments and equipment beyond your demand.

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100% SERVICE

Bulk and customized small packaging, FOB, CIF, DDU and DDP. Let us help you find the best solution for all your concerns.

2019

Year Established

100~200

Employees

15.000.000-20.000.000

Annual Sales

80+

Customers Served

Customer Testimonials

Lead Scientist, Polymer R&D

We chose their Multi-Functional Atomic Force Microscope for its versatile advanced modes beyond just imaging. We consistently get high-quality, repeatable quantitative data (KFM, MFM) on our polymer composites. The expert on-site training was invaluable, helping us accelerate our product development. A reliable workhorse instrument.

★ ★ ★ ★ ★

Metrology Manager, Global Fab

High-resolution wafer metrology is critical for our process control. Their Wafer-Level AFM has been a superb addition. The automated, multi-site measurements provide the repeatable roughness and step-height data we need to quickly troubleshoot issues and improve device yield. An essential and reliable tool for our fab.

★ ★ ★ ★ ★

Dr. Chen, Head of Core Labs

We've purchased several instruments for our shared facility, including a VSM. The entire process from consultation to installation and training was seamless. Their knowledgeable sales and expert service engineers give us great confidence. This company is a reliable partner for our critical research infrastructure.

★ ★ ★ ★ ★

Atomic Force Microscope & Kerr Microscope Manufacture

Atomic Force Microscope

Kerr Microscope

Vibrating Sample Magnetometer

Magneto Optical Cryostat

Cryogenic Probe Station

MRAM Tester

Magnetic Probe Station

Atomic Force Microscope

Kerr Microscope

Vibrating Sample Magnetometer

Magneto Optical Cryostat

Cryogenic Probe Station

MRAM Tester

Magnetic Probe Station

4 K Closed Loop Semiconductor Probe Station Vacuum Wafer Probe Station For 2 Inch Wafer Testing

Precise Cryogenic Probe Station Versatile Optical Probe Station For IV CV Microwave And Optical Testing

Cryogen Free Automated Probe Station Low Temperature Vacuum Probe Station For 4 K Device Measurements

Vacuum Cryogenic Probe Station Electrical Testing Automated Probe Station

MOKE Wafer Scanner EFEM Wafer Measurement System For Hysteresis And Magnetic Uniformity Maps

High Field Wafer Measurement System MOKE Wafer Scanner For MRAM And Magnetic Film Characterization

Wafer Level MOKE System 0.3 Mdeg For Rapid Hysteresis Loops And Process Control

Automatic MRAM Tester Magnetic Chip Final Test Machine High Speed

Professional Automated Test Equipment Versatile Final Tester For Magnetic Chip Production Lines

Versatile MRAM Tester High Resolution ATE Test Equipment For Electrical Chip Properties

MRAM And Spintronic Chip Tester Tri Temp ATE Automated Test Equipment For Automated Batch Testing

Tri Temp Magnetic Chip Tester Precision Final Tester For High Reliability Verification

1D In Plane Semiconductor Probe Station Magnetic Field Probe Station

In Plane Magnetic Probe Station Versatile DC Probe Station For Precision Device Testing

Programmable Probe Station Precise RF Probe Station For Expandable Research And Development

Magnetic Field Probe Station 0.05 mT Probing Station For Variable Temperature Testing

0.05 mT Magnetic Probe Station Precise Semiconductor Prober For Spintronics And Semiconductor Testing

In Plane And Vertical Magnetic Probe Station 140 mT Wafer Prober For Advanced Testing

Upgradeable 2D Probe Station Magnetic Field Probe Station For Precision Research And Production

140 mT Wafer Probe Stations 2D Probing Station For Spintronics And Wafer Level Testing