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0.1 Hz - 30 Hz Atomic Force Microscope Nanoscale Scanning Probe Microscopes
Advanced Scanning Probe Microscope for Nanoscale Measurements Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool that offers multi-mode measurement capabilities with nanometer resolution, making it an essential instrument for various research and industrial applications. ...
Magneto Optic Kerr Microscope 250 nm Spin Test Microscope For Comprehensive Material Characterization
SpinTest MagnetoOptic Kerr Microscope For Comprehensive Material Characterization Product Description: The Multifunctional Spin-Test Magneto-Optic Kerr Microscope is an essential tool for researchers and scientists working with magnetic thin films in the field of spintronics. This advanced MOKE ...
High Field Optical Cryostat 1.7 K - 350 K Temperature Range MO-Cryo With Multi Directional Optical Access
High Field Optical Cryostat With Multi Directional Optical Access Product Description: The Magneto Optical Cryostat is a cutting-edge research tool designed for precise measurements in the fields of 2D Materials, High Magnetic Field, and Magneto optical measurements. This innovative cryostat offers ...
Vector Magnetic Probe Station Scalable Wafer Probe Station For 2D Device Characterization
Vector Magnetic Probe Station For 2D Device Characterization Product Description: The 2D In Plane-Vertical Magnetic Probe Station is an advanced tool designed for precise measurements of magnetic fields, specifically focusing on the vertical component. With exceptional features and capabilities, ...
Programmable Probe Station Precise RF Probe Station For Expandable Research And Development
Programmable Probe Station For Expandable Research And Development Product Description: The 1D In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for precise and efficient testing of DC and RF devices. This versatile probe station offers a wide range of features and capabilities ...
140 mT Wafer Probe Stations 2D Probing Station For Spintronics And Wafer Level Testing
2D Magnetic Probe Station For Spintronics And Wafer Level Testing Product Description: The Vector Magnetic Probe Station is a cutting-edge tool designed for precise measurements of magnetic fields in Spintronic devices. It is equipped with advanced features to accurately analyze the magnetic ...
AtomExplorer: High-Precision Scanning Probe Microscope (SPM/AFM)
Product Description: The Basic-type Atomic Force Microscope is a cutting-edge nanoscale microscope designed to provide high-precision imaging and multifunctional measurement capabilities for a wide range of scientific and industrial applications. This advanced instrument employs an XYZ three-axis ...
Plane Magnetic Field 2 T Air Gap 10 mm Magnetic Domain Observation Featuring PID Closed loop Feedback Regulation Magnetic Field Resolution
Product Description: The Kerr Microscope is an advanced instrument designed for high resolution magnetic microscopy, offering unparalleled performance in the study and analysis of magnetic materials and phenomena. Equipped with a comprehensive set of objectives including 5*, 20*, 50*, 100*, a high...
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Internal professional design team and advanced machinery workshop. We can cooperate to develop the products you need.
Advanced automatic machines, strictly process control system. We can manufacture all the instruments and equipment beyond your demand.
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News
Recently, the research team from the Center for Spintronics and Quantum Systems at the School of Materials Science and Engineering, Xi'an Jiaotong...
News
Recently, the research team from the Research Institute of Clean Energy and Fuel Chemistry, School of Chemical Engineering at the University of...
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