Hoge resolutie atoomKrachtmicroscoop 0,04 nm industriële microscoop voor nanoschaalanalyse
High-Resolution Atomic Force Microscope For Nanoscale Analysis Product Description: The Atomic Force Microscope (AFM) is a versatile tool for surface analysis, commonly used in various scientific and industrial applications. This cutting-edge device offers exceptional scanning capabilities and ...
Permanente magneet Kerr-microscoop VectorMOKE-microscoop 450 nm voor 3D-analyse van harde magnetische materialen
Vector MOKE Microscope For 3D Analysis Of Hard Magnetic Materials Product Description: The Permanent Magnet Kerr Microscope is a cutting-edge tool designed for high-resolution imaging and detailed observation of magnetic materials. With a variable temperature range of 298 K to 798 K, this microscope ...
Vacuüm cryogene proefstation elektrische testen geautomatiseerde proefstation
Cost Effective Cryo Probe Station For Automated Electrical Testing Product Description: The Cryogenic Probe Station is an essential tool for cryogenic device characterization, providing a cost-effective solution for researchers and engineers in various industries. This closed-cycle probe station ...
Vector Magnetische Probe Station Schaalbare Wafer Probe Station Voor 2D Apparaatkarakterisering
Vector Magnetic Probe Station For 2D Device Characterization Product Description: The 2D In Plane-Vertical Magnetic Probe Station is an advanced tool designed for precise measurements of magnetic fields, specifically focusing on the vertical component. With exceptional features and capabilities, ...
Programmeerbare probeerstation
Programmable Probe Station For Expandable Research And Development Product Description: The 1D In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for precise and efficient testing of DC and RF devices. This versatile probe station offers a wide range of features and capabilities ...
Hoogvacuüm 4 K Probe: 0-67 GHz, 4-8 Arms & Kosteneffectieve Elektrische Karakterisering
Product Description: The Cryogenic Probe Station is an advanced and versatile instrument designed for precise cryogenic electrical characterization (I-V/C-V) measurements. It is engineered to meet the demanding requirements of researchers and engineers working with low-temperature semiconductor ...
AtomEdge Pro: Multifunktioneel AtoomKrachtmicroscoop 3D beeldvorming voor materialen
Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument designed for high-precision surface analysis and characterization at the nanometer scale. This multifunctional measurement tool integrates several advanced microscopy techniques, including Electrostatic Force ...
Multi Functionele Atomic Kracht Microscoop Low Noise Materialen Microscoop Met MFM EFM PFM Modi
Multi Functional Atomic Force Microscope With MFM EFM PFM Modes Product Description: One of the key features of the AFM is its low noise levels in both the Z direction and XY direction, ensuring accurate and reliable measurements. The noise level in the Z direction is an impressive 0.04 nm, ...
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