Contact/Tap Modes For Sub-nanometer Materials Nanoscale Analysis

Product Description:

The Atomic Force Microscope (AFM) is an advanced Scanning Force Microscope designed to provide exceptional imaging and measurement capabilities at the nanoscale. Engineered for precision and versatility, this AFM model supports a wide range of scanning rates from 0.1 Hz up to 30 Hz, allowing users to tailor the scanning speed according to their specific application needs. Whether conducting detailed surface analysis or rapid sample inspections, this instrument ensures optimal performance and reliable data acquisition.

One of the standout features of this Atomic Force Microscope is its multi-mode operating capability. It supports Contact Mode, Tap Mode, Phase Imaging Mode, Lift Mode, and Multi-Directional Scanning Mode, offering unparalleled flexibility in how samples are examined. Contact Mode is particularly valuable for high-resolution surface topography measurements and is widely used in nanoscale electrical measurement. This mode enables precise interaction between the probe tip and the sample surface, allowing the detection of electrical properties with nanoscale spatial resolution. The availability of various modes ensures the AFM can be effectively utilized across diverse research fields, from materials science to biology.

The system is compatible with samples having a diameter of up to 25 mm, making it suitable for a broad spectrum of specimens, including wafers, thin films, and biological samples. This compatibility allows researchers to analyze a wide variety of materials without the need for extensive sample preparation or modification, thus streamlining experimental workflows.

Precision is a critical aspect of any AFM, and this model excels in this regard with excellent nonlinearity specifications. The nonlinearity in the XY direction is limited to just 0.02%, while the Z direction nonlinearity is maintained at 0.08%. These values indicate that the instrument provides highly accurate positioning and height measurements, minimizing distortion and ensuring that the topographical data produced is both reliable and repeatable. Such accuracy is essential for quantitative nanoscale studies, where even slight deviations can significantly impact the interpretation of results.

Image resolution and detail are further enhanced by the wide range of image sampling points supported by the microscope. Users can select from a minimum of 32*32 points up to an impressive 4096*4096 points, enabling highly detailed imaging suitable for various applications. The ability to adjust the sampling density allows the AFM to balance between scan speed and image resolution, making it adaptable to both quick surveys and in-depth surface characterization.

In summary, this Atomic Force Microscope combines a robust scanning rate range, versatile operating modes including Contact Mode, and exceptional precision with low nonlinearity, making it an indispensable tool for nanoscale electrical measurement and surface analysis. Its compatibility with reasonably sized samples and extensive image sampling options further reinforce its position as a leading Scanning Force Microscope for researchers seeking detailed and accurate nanoscale insights. Whether you are exploring surface morphology, electrical properties, or mechanical characteristics, this AFM delivers the performance and flexibility needed to push the boundaries of nanotechnology research.

Features:

• Product Name: Atomic Force Microscope
• Scanning Method: XYZ Three-Axis Full-Sample Scanning
• Scanning Angle: 0~360°
• Image Sampling Points: 32*32 - 4096*4096
• Sample Size: Compatible With Samples With A Diameter Of 25 mm
• Scanning Rate: 0.1 Hz - 30 Hz
• Nanoscale Characterization Platform for precise surface analysis
• Supports Multiple Modes for versatile nanoscale measurements
• Advanced Nanoscale Characterization Platform enabling detailed imaging and measurement

Technical Parameters:

Applications:

The Truth Instruments AtomEdge Pro Atomic Force Microscope, originating from China, is an advanced and versatile tool designed for a wide range of scientific and industrial applications. Its multifunctional measurement capabilities, including Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Force Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), Scanning Capacitive Microscopy (SCM), and Magnetic Force Microscopy (MFM), make it an essential instrument for researchers and engineers working in nanotechnology, materials science, and surface analysis.

One of the key application occasions for the AtomEdge Pro is in the field of surface analysis, where atomic resolution imaging is critical. The microscope’s ability to scan at angles from 0 to 360 degrees combined with an exceptionally low Z-axis noise level of 0.04 nm ensures highly precise topographical and material property measurements. This precision is vital for characterizing surface morphology, defects, and material properties at the nanoscale, which is indispensable for semiconductor manufacturing, thin film research, and biomaterials development.

Magnetic Force Microscopy (MFM), one of the multifunctional modes available on the AtomEdge Pro, is used extensively in magnetic domain imaging and magnetic material characterization. This capability supports applications in data storage research, spintronics, and magnetic sensor development, where understanding magnetic properties at the nanoscale is essential. The instrument’s low nonlinearity in both XY (0.02%) and Z (0.08%) directions ensures accurate force measurements and repeatability, which are crucial for reliable magnetic force microscopy data.

The AtomEdge Pro’s scanning rate range from 0.1 Hz to 30 Hz allows users to balance speed and resolution according to their experimental needs, making it suitable for both routine surface inspections and detailed scientific investigations. Additionally, the optional Conductive Atomic Force Microscopy (C-AFM) mode expands its utility to electrical property measurements, enabling applications in nanoelectronics and materials science research.

Overall, the Truth Instruments AtomEdge Pro Atomic Force Microscope is ideal for laboratories and industries requiring high-resolution imaging and comprehensive surface analysis capabilities. Its multifunctionality, precise scanning technology, and robustness make it a powerful tool for advancing research and product development in various scientific fields.