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Atomic Force Microscope
Wafer-Level Atomic Force Microscoperoscope
Wafer-Level Atomic Force Microscope Product Model: AtomMax Product Overview: Using micro-cantilever probe structures, this instrument enables 3D morphology characterization of conductive, semiconductive, and insulating solid materials, achieving wafer-level large-sample morphology characterization. Combined with an optical image, the electrically driven sample positioning stage allows for 1 μm positioning accuracy within a 200 x 200 mm area. with fully automated operations
Wafer-Level Atomic Force Microscoperoscope
Multi Functional Atomic Force Microscope Low Noise Materials Microscope With MFM EFM PFM Modes
Multi Functional Atomic Force Microscope With MFM EFM PFM Modes Product Description: One of the key features of the AFM is its low noise levels in both the Z direction and XY direction, ensuring accurate and reliable measurements. The noise level in the Z direction is an impressive 0.04 Nm, providing exceptional sensitivity for capturing subtle surface variations and interactions. In the XY direction, the noise level is maintained at 0.4 Nm, further enhancing the precision of
Multi Functional Atomic Force Microscope Low Noise Materials Microscope With MFM EFM PFM Modes
High Stability AFM Microscope 0.1 Hz - 30 Hz AFM Systems For Materials Biology And Electronics Imaging
High Stability AFM For Materials Biology And Electronics Imaging Product Description: The Atomic Force Microscope is a cutting-edge scientific instrument that offers high-resolution imaging and precise measurements for a wide range of applications in nanotechnology, material science, and biological research. This advanced microscope utilizes XYZ Three-axis Full Sample Scanning method, allowing for detailed analysis of samples with exceptional accuracy. One of the key features
High Stability AFM Microscope 0.1 Hz - 30 Hz AFM Systems For Materials Biology And Electronics Imaging
Kerr Microscope
Advanced Kerr Microscope High Resolution Microscope For Micromagnetics And Domain Imaging
Advanced Kerr Microscope For Micromagnetics And Domain Imaging Product Description: The Permanent Magnet Kerr Microscope is a cutting-edge tool designed for advanced micromagnetics research, offering high-resolution imaging capabilities for in-depth studies. This innovative microscope features PID closed-loop feedback regulation for precise magnetic field resolution, with an impressive resolution of 0.05 MT. Equipped with an in-plane magnetic field configuration, this
Advanced Kerr Microscope High Resolution Microscope For Micromagnetics And Domain Imaging
Wafer Scale Hysteresis Loop Tracer For Non Contact Magnetic Metrology
Wafer Scale Hysteresis Tracer For Non Contact Magnetic Metrology Product Description: The Wafer-Level Hysteresis Loop Measurement Instrument is a cutting-edge tool designed for precise and efficient characterization of magnetic properties at the wafer level. This instrument is essential for industries requiring accurate and reliable measurements for quality control and research purposes. One of the key features of this product is its exceptional Sample Repeatability, which is
Wafer Scale Hysteresis Loop Tracer For Non Contact Magnetic Metrology
High Magnetic Field Kerr Microscope High Sensitivity MOKE System For Weak Magnetism And 2D Material Study
High Sensitivity MOKE For Weak Magnetism And 2D Material Study Product Description: With a variable temperature range spanning from 4.2 K to 420 K, researchers have the flexibility to study a wide range of materials under different thermal conditions. This broad temperature range is ideal for investigating the properties of weak magnetic materials at low temperatures, providing valuable insights into their behavior and magnetic responses. One of the key features of this
High Magnetic Field Kerr Microscope High Sensitivity MOKE System For Weak Magnetism And 2D Material Study
Vibrating Sample Magnetometer
High Speed Vibrating Sample Magnetometer Versatile Magnetic Property Measurement System
VSM For Thin Film ,Nanoparticle And Powder Magnetic Characterization Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge magnetic property measurement system that offers precise and reliable magnetic moment measurements. With exceptional repeatability of ±0.5% and stability of ±0.05% full range, this VSM ensures accurate and consistent results for your magnetic material analysis. Equipped with advanced magnetic field parameters, the VSM can generate
High Speed Vibrating Sample Magnetometer Versatile Magnetic Property Measurement System
High Sensitivity Vibrating Sample Magnetometer Wide Temperature Range VSM For Advanced Material Research
VSM With Wide Temperature Range For Advanced Material Research Product Description: The Vibrating Sample Magnetometer features a sweep field speed of 0.5 T/second, allowing for efficient and rapid data collection. With a sample holder rotation range of ±360-degree electric rotation, this instrument offers flexibility and ease of use for various experimental setups. Equipped with impressive magnetic field parameters, the Vibrating Sample Magnetometer boasts a magnetic field
High Sensitivity Vibrating Sample Magnetometer Wide Temperature Range VSM For Advanced Material Research
Accurate Magnetic Property Measurement System High Sensitivity VSM
High Sensitivity VSM For Accurate Magnetic Property Measurements Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge Magnetic Characterization System that offers precise and automated measurement capabilities for analyzing magnetic properties of various materials. This advanced instrument is equipped with multiple features that make it a valuable tool for research and industrial applications. One of the key features of the VSM is its Sample Holder
Accurate Magnetic Property Measurement System High Sensitivity VSM
Magneto Optical Cryostat
High Field Optical Cryostat 1.7 K - 350 K Temperature Range MO Cryo With Multi Directional Optical Access
High Field Optical Cryostat With Multi Directional Optical Access Product Description: The Magneto Optical Cryostat is a cutting-edge research tool designed for precise measurements in the fields of 2D Materials, High Magnetic Field, and Magneto optical measurements. This innovative cryostat offers exceptional performance and versatility, making it ideal for a wide range of experimental setups. Featuring 16 DC Lines and 4 20 GHz RF Lines, the Magneto Optical Cryostat provides
High Field Optical Cryostat 1.7 K - 350 K Temperature Range MO Cryo With Multi Directional Optical Access
Fast Cooldown Magneto Optical Cryostat 1 Top Window MO Cryostat For Advanced Material Research
Fast Cooldown MO-Cryostat for Advanced Material Research Product Description: The Ultra-Low-Temperature Superconducting-Magnet Integrated Optical Property Measurement Cryostat is a cutting-edge system designed for researchers working with quantum materials and conducting cryogenic microscopy experiments. This advanced cryostat offers precise control over temperature stability, sample space, magnetic field strength, and optical windows, making it an ideal solution for a wide
Fast Cooldown Magneto Optical Cryostat 1 Top Window MO Cryostat For Advanced Material Research
1 Top Window Magneto Optical Cryostat Superconducting Magnet Cryostat With Low Vibration Optical Access
Superconducting Magnet Cryostats with Low Vibration Optical Access Product Description: The Ultra-Low-Temperature Superconducting-Magnet Integrated Optical Property Measurement Cryostat is a cutting-edge system designed to provide precise and reliable measurements in the field of magneto optical measurements and Raman spectroscopy. This advanced cryostat offers a wide temperature range from 1.7 K to 350 K, making it ideal for a variety of research applications requiring
1 Top Window Magneto Optical Cryostat Superconducting Magnet Cryostat With Low Vibration Optical Access
Cryogenic Probe Station
Precise Cryogenic Probe Station Versatile Optical Probe Station For IV CV Microwave And Optical Testing
Cryogenic Probe Station For IV CV Microwave And Optical Testing Product Description: Introducing our cutting-edge Cryogenic Probe Station, a revolutionary solution designed for precise and efficient testing in a wide range of applications. This advanced system offers unparalleled performance and versatility, making it an ideal choice for researchers and engineers seeking a cost-effective and reliable testing solution. The Cryogenic Probe Station features a Probe Arm Stroke of
Precise Cryogenic Probe Station Versatile Optical Probe Station For IV CV Microwave And Optical Testing
4K Closed Loop Semiconductor Probe Station Vacuum Wafer Probe Station For 2 Inch Wafer Testing
4K Closed Loop Cryogenic Probe Station For 2 Inch Wafer Testing Product Description: The Cryogenic Probe Station is an essential tool for researchers and scientists working in the field of low-temperature measurements. This advanced equipment is designed to provide precise control over the thermal environment during experiments, ensuring accurate and reliable results. With its innovative features and high-performance capabilities, the Cryogenic Probe Station is ideal for a
4K Closed Loop Semiconductor Probe Station Vacuum Wafer Probe Station For 2 Inch Wafer Testing
Vacuum Cryogenic Probe Station Electrical Testing Automated Probe Station
Cost Effective Cryo Probe Station For Automated Electrical Testing Product Description: The Cryogenic Probe Station is an essential tool for cryogenic device characterization, providing a cost-effective solution for researchers and engineers in various industries. This closed-cycle probe station offers precise control and stability for conducting experiments at low temperatures. Key Features: Vacuum: The Cryogenic Probe Station boasts a low-temperature vacuum level of
Vacuum Cryogenic Probe Station Electrical Testing Automated Probe Station
MRAM Tester
Tri Temp Magnetic Chip Tester Precision Final Tester For High Reliability Verification
Tri Temp Magnetic Chip Tester For High Reliability Verification Product Description: Introducing the cutting-edge Magnetic Chip Final Test Machine, the ultimate solution for ATE for Magnetic Chips. This innovative product is designed to meet the demanding requirements of testing magnetic chips with precision and accuracy. The Socket Test Seat of the Magnetic Chip Final Test Machine is engineered to withstand extreme temperatures ranging from -60°C to 170°C, ensuring reliable
Tri Temp Magnetic Chip Tester Precision Final Tester For High Reliability Verification
Precision MRAM Tester Automated Final Test System For Magnetic Chip Production Lines
Automated Final Test System For Magnetic Chip Production Lines Product Description: Excitation System1: One of the key features of this magnetic chip final test machine is the excitation system's capability to generate a maximum magnetic field intensity of ±2000 Oe along the X-axis. This high magnetic field intensity ensures thorough testing of magnetic chips for a wide range of applications. Excitation System3: Another remarkable attribute of this MRAM tester is the
Precision MRAM Tester Automated Final Test System For Magnetic Chip Production Lines
Tri Temp Magnetic Chip Tester Versatile Final Tester For High Reliability Verification
Tri Temp Magnetic Chip Tester For High Reliability Verification Product Description: Introducing the Magnetic Chip Final Test Machine, a cutting-edge product designed for non-destructive testing in the semiconductor industry. This advanced MRAM tester is equipped with state-of-the-art features to ensure accurate and reliable testing results. The Electric Displacement Stage Module of the Magnetic Chip Final Test Machine offers precise control with a θ-axis Adjustment Range of
Tri Temp Magnetic Chip Tester Versatile Final Tester For High Reliability Verification
Magnetic Probe Station
Magnetic Field Probe Station 0.05 MT Probing Station For Variable Temperature Testing
Probe Station For Variable Temperature And Magnetic Field Testing Product Description: The 1D In-Plane Magnetic Field Probe Station is a sophisticated tool designed for precise magnetoresistance measurement in research and testing applications. This magnetic probe station is equipped with advanced features to ensure accurate and reliable data collection, making it an essential instrument for researchers and scientists working in the field of magnetoresistance measurement. The
Magnetic Field Probe Station 0.05 MT Probing Station For Variable Temperature Testing
Lab Manual Wafer Probe Station Magnetic Field Probing Station With 360 Rotation
Manual Wafer Probe Station With 360 Rotation For Lab Research Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for research and development (R&D) in the field of magnetic field analysis. This innovative probe station offers precise control and accurate measurements for studying in-plane magnetic fields with ease and efficiency. One of the key features of this probe station is its optical magnification capabiliti
Lab Manual Wafer Probe Station Magnetic Field Probing Station With 360 Rotation
50 MT Magnetic Probe Station RH Testing Wafer Probe Stations For Magnetic Film Measurement
Cost Effective Wafer Probe Station For Magnetic Film Measurement Product Description: Introducing the Wafer-Level Manual In-Plane Magnetic Field Probe Station, a cutting-edge solution for wafer-level electrical measurement with a focus on RH Testing. This innovative probe station is designed to provide precise testing functions for in-plane magnetic fields with a magnetic field resolution of PID Closed-loop Feedback Regulation and an impressive resolution of 0.05 MT. One of
