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原子力顕微鏡

品質多機能原子力顕微鏡低騒音物質顕微鏡 MFM EFM PFMモード工場 — 多機能原子力顕微鏡低騒音物質顕微鏡 MFM EFM PFMモード

Multi Functional Atomic Force Microscope With MFM EFM PFM Modes Product Description: One of the key features of the AFM is its low noise levels in both the Z direction and XY direction, ensuring accurate and reliable measurements. The noise level in the Z direction is an impressive 0.04 Nm, providing exceptional sensitivity for capturing subtle surface variations and interactions. In the XY direction, the noise level is maintained at 0.4 Nm, further enhancing the precision of

品質高安定性AFM顕微鏡 0.1 Hz - 30 Hz AFMシステム材料生物学および電子イメージング用工場 — 高安定性AFM顕微鏡 0.1 Hz - 30 Hz AFMシステム材料生物学および電子イメージング用

High Stability AFM For Materials Biology And Electronics Imaging Product Description: The Atomic Force Microscope is a cutting-edge scientific instrument that offers high-resolution imaging and precise measurements for a wide range of applications in nanotechnology, material science, and biological research. This advanced microscope utilizes XYZ Three-axis Full Sample Scanning method, allowing for detailed analysis of samples with exceptional accuracy. One of the key features

品質 0.1 Hz - 30 Hz 原子力顕微鏡 0.04 Nm 高精度顕微鏡多モード対応工場 — 0.1 Hz - 30 Hz 原子力顕微鏡 0.04 Nm 高精度顕微鏡多モード対応

Advanced AFM With Multiple Modes For Nanoscale Characterization Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-precision surface analysis and nanoscale characterization. With a noise level in the Z direction of 0.04 Nm, this microscope offers exceptional sensitivity and accuracy in capturing surface details. One of the key features of this product is its generous sample size capacity of 25 mm, allowing for the examination of a

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カー顕微鏡

品質高解像度顕微鏡微磁気と領域画像のための顕微鏡工場 — 高解像度顕微鏡微磁気と領域画像のための顕微鏡

Advanced Kerr Microscope For Micromagnetics And Domain Imaging Product Description: The Permanent Magnet Kerr Microscope is a cutting-edge tool designed for advanced micromagnetics research, offering high-resolution imaging capabilities for in-depth studies. This innovative microscope features PID closed-loop feedback regulation for precise magnetic field resolution, with an impressive resolution of 0.05 MT. Equipped with an in-plane magnetic field configuration, this

品質非接触磁気計測用ウェーハースケールヒステリシスループトレーサー工場 — 非接触磁気計測用ウェーハースケールヒステリシスループトレーサー

Wafer Scale Hysteresis Tracer For Non Contact Magnetic Metrology Product Description: The Wafer-Level Hysteresis Loop Measurement Instrument is a cutting-edge tool designed for precise and efficient characterization of magnetic properties at the wafer level. This instrument is essential for industries requiring accurate and reliable measurements for quality control and research purposes. One of the key features of this product is its exceptional Sample Repeatability, which is

品質高磁場ケール顕微鏡弱い磁気と2次元材料研究のための高感度MOKEシステム工場 — 高磁場ケール顕微鏡弱い磁気と2次元材料研究のための高感度MOKEシステム

High Sensitivity MOKE For Weak Magnetism And 2D Material Study Product Description: With a variable temperature range spanning from 4.2 K to 420 K, researchers have the flexibility to study a wide range of materials under different thermal conditions. This broad temperature range is ideal for investigating the properties of weak magnetic materials at low temperatures, providing valuable insights into their behavior and magnetic responses. One of the key features of this

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振動サンプル磁力計

品質高速振動サンプル磁気計汎用磁気特性測定システム工場 — 高速振動サンプル磁気計汎用磁気特性測定システム

VSM For Thin Film ,Nanoparticle And Powder Magnetic Characterization Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge magnetic property measurement system that offers precise and reliable magnetic moment measurements. With exceptional repeatability of ±0.5% and stability of ±0.05% full range, this VSM ensures accurate and consistent results for your magnetic material analysis. Equipped with advanced magnetic field parameters, the VSM can generate

品質高感度振動サンプル磁気計幅広い温度範囲 VSM 高級材料研究用工場 — 高感度振動サンプル磁気計幅広い温度範囲 VSM 高級材料研究用

VSM With Wide Temperature Range For Advanced Material Research Product Description: The Vibrating Sample Magnetometer features a sweep field speed of 0.5 T/second, allowing for efficient and rapid data collection. With a sample holder rotation range of ±360-degree electric rotation, this instrument offers flexibility and ease of use for various experimental setups. Equipped with impressive magnetic field parameters, the Vibrating Sample Magnetometer boasts a magnetic field

品質高感度VSM 精密磁気特性測定システム工場 — 高感度VSM 精密磁気特性測定システム

High Sensitivity VSM For Accurate Magnetic Property Measurements Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge Magnetic Characterization System that offers precise and automated measurement capabilities for analyzing magnetic properties of various materials. This advanced instrument is equipped with multiple features that make it a valuable tool for research and industrial applications. One of the key features of the VSM is its Sample Holder

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マグニートー光クライオスタット

品質高場光学結晶器 1.7 K - 350 K 温度範囲 MO クリオ多方向光学アクセス工場 — 高場光学結晶器 1.7 K - 350 K 温度範囲 MO クリオ多方向光学アクセス

High Field Optical Cryostat With Multi Directional Optical Access Product Description: The Magneto Optical Cryostat is a cutting-edge research tool designed for precise measurements in the fields of 2D Materials, High Magnetic Field, and Magneto optical measurements. This innovative cryostat offers exceptional performance and versatility, making it ideal for a wide range of experimental setups. Featuring 16 DC Lines and 4 20 GHz RF Lines, the Magneto Optical Cryostat provides

品質高速冷却磁気光学クライオスタット 1 トップウィンドウ MOクライオスタット先端材料研究用工場 — 高速冷却磁気光学クライオスタット 1 トップウィンドウ MOクライオスタット先端材料研究用

Fast Cooldown MO-Cryostat for Advanced Material Research Product Description: The Ultra-Low-Temperature Superconducting-Magnet Integrated Optical Property Measurement Cryostat is a cutting-edge system designed for researchers working with quantum materials and conducting cryogenic microscopy experiments. This advanced cryostat offers precise control over temperature stability, sample space, magnetic field strength, and optical windows, making it an ideal solution for a wide

品質 1 トップウィンドウ磁気光学クライオスタット超伝導磁石クライオスタット低振動光学アクセス付き工場 — 1 トップウィンドウ磁気光学クライオスタット超伝導磁石クライオスタット低振動光学アクセス付き

Superconducting Magnet Cryostats with Low Vibration Optical Access Product Description: The Ultra-Low-Temperature Superconducting-Magnet Integrated Optical Property Measurement Cryostat is a cutting-edge system designed to provide precise and reliable measurements in the field of magneto optical measurements and Raman spectroscopy. This advanced cryostat offers a wide temperature range from 1.7 K to 350 K, making it ideal for a variety of research applications requiring

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極低温プローブステーション

品質精密極低温プローブステーション IV CV マイクロ波および光学試験用多用途光学プローブステーション工場 — 精密極低温プローブステーション IV CV マイクロ波および光学試験用多用途光学プローブステーション

Cryogenic Probe Station For IV CV Microwave And Optical Testing Product Description: Introducing our cutting-edge Cryogenic Probe Station, a revolutionary solution designed for precise and efficient testing in a wide range of applications. This advanced system offers unparalleled performance and versatility, making it an ideal choice for researchers and engineers seeking a cost-effective and reliable testing solution. The Cryogenic Probe Station features a Probe Arm Stroke of

品質 4K 閉ループ半導体探査ステーション 2 インチ・ウェーバー試験用真空・ウェーバー探査ステーション工場 — 4K 閉ループ半導体探査ステーション 2 インチ・ウェーバー試験用真空・ウェーバー探査ステーション

4K Closed Loop Cryogenic Probe Station For 2 Inch Wafer Testing Product Description: The Cryogenic Probe Station is an essential tool for researchers and scientists working in the field of low-temperature measurements. This advanced equipment is designed to provide precise control over the thermal environment during experiments, ensuring accurate and reliable results. With its innovative features and high-performance capabilities, the Cryogenic Probe Station is ideal for a

品質真空極低温プローブステーション電気試験自動プローブステーション工場 — 真空極低温プローブステーション電気試験自動プローブステーション

Cost Effective Cryo Probe Station For Automated Electrical Testing Product Description: The Cryogenic Probe Station is an essential tool for cryogenic device characterization, providing a cost-effective solution for researchers and engineers in various industries. This closed-cycle probe station offers precise control and stability for conducting experiments at low temperatures. Key Features: Vacuum: The Cryogenic Probe Station boasts a low-temperature vacuum level of

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MRAMテスター

品質三温磁気チップテスター高信頼性検証用精密最終テスター工場 — 三温磁気チップテスター高信頼性検証用精密最終テスター

Tri Temp Magnetic Chip Tester For High Reliability Verification Product Description: Introducing the cutting-edge Magnetic Chip Final Test Machine, the ultimate solution for ATE for Magnetic Chips. This innovative product is designed to meet the demanding requirements of testing magnetic chips with precision and accuracy. The Socket Test Seat of the Magnetic Chip Final Test Machine is engineered to withstand extreme temperatures ranging from -60°C to 170°C, ensuring reliable

品質磁気チップ製造ライン向け精密MRAMテスター自動最終テストシステム工場 — 磁気チップ製造ライン向け精密MRAMテスター自動最終テストシステム

Automated Final Test System For Magnetic Chip Production Lines Product Description: Excitation System1: One of the key features of this magnetic chip final test machine is the excitation system's capability to generate a maximum magnetic field intensity of ±2000 Oe along the X-axis. This high magnetic field intensity ensures thorough testing of magnetic chips for a wide range of applications. Excitation System3: Another remarkable attribute of this MRAM tester is the

品質 Tri Temp Magnetic Chip Tester Versatile Final Tester For High Reliability Verification 工場 — Tri Temp Magnetic Chip Tester Versatile Final Tester For High Reliability Verification

Tri Temp Magnetic Chip Tester For High Reliability Verification Product Description: Introducing the Magnetic Chip Final Test Machine, a cutting-edge product designed for non-destructive testing in the semiconductor industry. This advanced MRAM tester is equipped with state-of-the-art features to ensure accurate and reliable testing results. The Electric Displacement Stage Module of the Magnetic Chip Final Test Machine offers precise control with a θ-axis Adjustment Range of

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磁気プローブステーション

品質磁場探査ステーション 0.05 MT 変動温度試験のための探査ステーション工場 — 磁場探査ステーション 0.05 MT 変動温度試験のための探査ステーション

Probe Station For Variable Temperature And Magnetic Field Testing Product Description: The 1D In-Plane Magnetic Field Probe Station is a sophisticated tool designed for precise magnetoresistance measurement in research and testing applications. This magnetic probe station is equipped with advanced features to ensure accurate and reliable data collection, making it an essential instrument for researchers and scientists working in the field of magnetoresistance measurement. The

品質ラボマニュアルワッファー探査ステーション 360 回転する磁場探査ステーション工場 — ラボマニュアルワッファー探査ステーション 360 回転する磁場探査ステーション

Manual Wafer Probe Station With 360 Rotation For Lab Research Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for research and development (R&D) in the field of magnetic field analysis. This innovative probe station offers precise control and accurate measurements for studying in-plane magnetic fields with ease and efficiency. One of the key features of this probe station is its optical magnification capabiliti

品質 50 MT 磁気プローブステーション RH テスト磁性膜測定用ウェーハプローブステーション工場 — 50 MT 磁気プローブステーション RH テスト磁性膜測定用ウェーハプローブステーション

Cost Effective Wafer Probe Station For Magnetic Film Measurement Product Description: Introducing the Wafer-Level Manual In-Plane Magnetic Field Probe Station, a cutting-edge solution for wafer-level electrical measurement with a focus on RH Testing. This innovative probe station is designed to provide precise testing functions for in-plane magnetic fields with a magnetic field resolution of PID Closed-loop Feedback Regulation and an impressive resolution of 0.05 MT. One of

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