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原子力顕微鏡

品質 100μm×100μm ナノスケール材料のための3Dスキャン科学研究工場 — 100μm×100μm ナノスケール材料のための3Dスキャン科学研究

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge scientific instrument designed to provide high-resolution imaging and precise surface characterization at the nanoscale. This advanced microscope is engineered to meet the demanding requirements of various research and industrial applications, particularly in fields such as semiconductors, materials science, and nanotechnology. With its exceptional capability for multi-mode measurement, the AFM offers

品質サブナノメートル材料のナノスケール分析のためのコンタクト/タップモード工場 — サブナノメートル材料のナノスケール分析のためのコンタクト/タップモード

Product Description: The Atomic Force Microscope (AFM) is an advanced Scanning Force Microscope designed to provide exceptional imaging and measurement capabilities at the nanoscale. Engineered for precision and versatility, this AFM model supports a wide range of scanning rates from 0.1 Hz up to 30 Hz, allowing users to tailor the scanning speed according to their specific application needs. Whether conducting detailed surface analysis or rapid sample inspections, this

品質半導体と先進材料の研究のためのナノスケール3D画像工場 — 半導体と先進材料の研究のためのナノスケール3D画像

Product Description: The Atomic Force Microscope (AFM) is a highly advanced and versatile instrument designed to provide precise surface characterization through multiple modes of operation. This multifunctional microscope integrates a range of techniques including Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Force Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), Scanning Capacitive Microscopy (SCM), and Magnetic Force Microscopy (MFM). Additionally, it

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カー顕微鏡

品質マグネト光学ケール効果分析:マイクロ磁気技術のためのKMPL-PM 工場 — マグネト光学ケール効果分析:マイクロ磁気技術のためのKMPL-PM

Product Description: The Kerr Microscope is a highly specialized instrument designed for advanced magnetic field research and material characterization. It offers exceptional precision and stability, making it an indispensable tool for scientists and engineers working in the fields of magnetism and material science. One of the standout features of this microscope is its remarkable temperature stability, maintaining an ultra-fine control within ±50 millikelvin (MK). This

品質高解像度磁気顕微鏡:KMPL-PMで永久磁石の特徴工場 — 高解像度磁気顕微鏡:KMPL-PMで永久磁石の特徴

Product Description: The Kerr Microscope is a highly advanced and versatile instrument designed for Magnetic Domain Observation and Strong Magnetic Field Testing, leveraging the Magneto-Optical Kerr Effect to deliver precise and detailed imaging of magnetic materials. This state-of-the-art microscope is engineered to operate within a wide Variable Temperature Range of 298 K to 798 K, allowing researchers and engineers to study magnetic phenomena across diverse thermal

品質平面磁場 2 T 空間の隙間 10 mm 磁場観測 PID 閉ループフィードバック規制磁場解像度工場 — 平面磁場 2 T 空間の隙間 10 mm 磁場観測 PID 閉ループフィードバック規制磁場解像度

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振動サンプル磁力計

品質低ノイズ振動サンプル磁気計高速VSM 多用性信頼性の高い磁気特性工場 — 低ノイズ振動サンプル磁気計高速VSM 多用性信頼性の高い磁気特性

High Speed VSM For Fast And Reliable Magnetic Characterization Product Description: The Vibrating Sample Magnetometer (VSM) is a powerful tool designed to meet the needs of researchers working with materials such as Multiferroics and Spintronics. This advanced instrument offers precise measurements and reliable performance, making it an essential asset for any laboratory focusing on magnetic materials. One of the key features of the VSM is its low noise level, which is

品質精密制御振動磁気計 77 K - 950 K 温度範囲 VSM 粉末フィルム用工場 — 精密制御振動磁気計 77 K - 950 K 温度範囲 VSM 粉末フィルム用

Vibrating Sample Magnetometer For Powders Films And Bulk Samples Product Description: A Vibrating Sample Magnetometer (VSM) is an essential tool for researchers and scientists working in the field of magnetic materials and properties. This particular VSM product offers a comprehensive set of features and capabilities that make it a top choice for those in need of a reliable and precise magnetic property measurement system. One of the key highlights of this VSM is its

品質汎用的で敏感な振動サンプル磁気計低騒音磁気特性測定システム工場 — 汎用的で敏感な振動サンプル磁気計低騒音磁気特性測定システム

High Sensitivity VSM Accurate Vibrating Sample Magnetometer Systems Product Description: Introducing the Vibrating Sample Magnetometer, a cutting-edge device designed for precise and efficient magnetic measurements. This advanced instrument is equipped with a range of features that make it an essential tool for researchers and scientists seeking accurate data on magnetic properties. The sample holder of the Vibrating Sample Magnetometer offers a remarkable ±360-degree

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マグニートー光クライオスタット

品質超伝導磁石クリオスタット低時/高場試験のための多光窓工場 — 超伝導磁石クリオスタット低時/高場試験のための多光窓

Product Description: The MO-Cryostat is an advanced Magneto Optical Cryostat designed to provide exceptional performance and versatility for a wide range of low-temperature experimental applications. Engineered with precision and reliability in mind, this cryostat offers a unique combination of features that make it an ideal choice for researchers and scientists working in fields such as condensed matter physics, materials science, and quantum computing. One of the standout

品質超低温＋強磁場超伝導クライオスタット光磁気特性評価用工場 — 超低温＋強磁場超伝導クライオスタット光磁気特性評価用

Product Description: The Magneto Optical Cryostat is a state-of-the-art scientific instrument designed to facilitate advanced research in the field of quantum materials. It offers exceptional temperature stability, high magnetic field capabilities, and precise optical access, making it an ideal choice for studies requiring controlled cryogenic environments combined with magnetic field manipulation. This cryostat is engineered to meet the demanding needs of researchers

品質高磁場超伝導クライオスタット – 高速低温試験用多方向光学系工場 — 高磁場超伝導クライオスタット – 高速低温試験用多方向光学系

Product Description: The Magneto Optical Cryostat is a state-of-the-art instrument designed for advanced research and experimentation involving high magnetic fields and low-temperature environments. This cryostat is specifically engineered to support investigations into 2D materials, delivering exceptional performance and precision required for cutting-edge scientific studies. With a robust configuration and meticulously optimized features, it caters to the demanding needs of

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極低温プローブステーション

品質低流出4Kシステム: 2インチ互換性,0〜67GHz& ±1.20mK安定性工場 — 低流出4Kシステム: 2インチ互換性,0〜67GHz& ±1.20mK安定性

Product Description: The PS-Cryo 4K cryogenic probe station is a state-of-the-art multi-probe (4-8 arms) cryogenic optoelectronic and microwave probe station designed to meet the demanding needs of advanced research and development in low-temperature environments. Engineered for precision and versatility, this probe station offers unparalleled performance for testing and characterizing devices at cryogenic temperatures as low as 4 Kelvin, making it an essential tool for

品質マルチ探査機冷凍テスト: 4K-420K,GMリフレッグ&I-V/C-V/マイクロ波テスト工場 — マルチ探査機冷凍テスト: 4K-420K,GMリフレッグ&I-V/C-V/マイクロ波テスト

Product Description: The PS-Cryo 4K cryogenic probe station is an advanced and highly specialized instrument designed for precision testing and measurement at extremely low temperatures. Engineered to meet the demanding requirements of modern research and development in fields such as quantum computing, semiconductor device characterization, and cryogenic electronics, this probe station offers unparalleled performance and versatility. One of the standout features of the PS

品質高真空4Kプローブ: 0-67GHz,4-8アーム&コスト効率の良い電気特性工場 — 高真空4Kプローブ: 0-67GHz,4-8アーム&コスト効率の良い電気特性

Product Description: The Cryogenic Probe Station is an advanced and versatile instrument designed for precise cryogenic electrical characterization (I-V/C-V) measurements. It is engineered to meet the demanding requirements of researchers and engineers working with low-temperature semiconductor devices, quantum materials, and other cryogenic applications. This probe station offers exceptional performance, combining flexibility, accuracy, and reliability to facilitate

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MRAMテスター

品質 Tri Temp Magnetic Chip Tester Versatile Final Tester For High Reliability Verification 工場 — Tri Temp Magnetic Chip Tester Versatile Final Tester For High Reliability Verification

Tri Temp Magnetic Chip Tester For High Reliability Verification Product Description: Introducing the Magnetic Chip Final Test Machine, a cutting-edge product designed for non-destructive testing in the semiconductor industry. This advanced MRAM tester is equipped with state-of-the-art features to ensure accurate and reliable testing results. The Electric Displacement Stage Module of the Magnetic Chip Final Test Machine offers precise control with a θ-axis Adjustment Range of

品質自動MRAMテスター磁気チップ最終テスト機生産およびバッチ最終テスト用工場 — 自動MRAMテスター磁気チップ最終テスト機生産およびバッチ最終テスト用

Automated MRAM Tester For Production And Batch Final Testing Product Description: The Magnetic Chip Final Test Machine is an advanced Automated Tri-temp MRAM Tester designed to provide precise and reliable testing for magnetic chips. Equipped with cutting-edge features, this machine ensures accurate results and efficient performance. Excitation System3: The True Zero Value Of The Magnetic Field Under Zero Magnetic Field Is ≤0.1 Oe. This feature guarantees the machine's

品質磁気チップ製造ライン向けプロフェッショナル自動試験装置多用途最終試験機工場 — 磁気チップ製造ライン向けプロフェッショナル自動試験装置多用途最終試験機

Automated Final Test System for Magnetic Chip Production Lines Product Description: The Magnetic Chip Final Test Machine is a cutting-edge product designed for precise and efficient testing of magnetic chips. With its advanced features and capabilities, this machine is the perfect solution for conducting thorough and accurate testing processes. One of the key features of this test machine is the Test Ambient Temperature Module. Equipped with a temperature monitoring module,

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磁気プローブステーション

品質機内磁気探査ステーション精密装置試験のための汎用DC探査ステーション工場 — 機内磁気探査ステーション精密装置試験のための汎用DC探査ステーション

In Plane Magnetic Probe Station For Precision Device Testing Product Description: The 1D In-Plane Magnetic Field Probe Station is a versatile and advanced tool designed for precise measurements of magnetic fields in a variety of research and industrial applications. Equipped with a range of source meters including the SR830, N5173B, Keithley 6221, and Keithley 2182A, this probe station offers unparalleled flexibility and compatibility with different experimental setups. One

品質磁場探査ステーション 0.05 MT 変動温度試験のための探査ステーション工場 — 磁場探査ステーション 0.05 MT 変動温度試験のための探査ステーション

Probe Station For Variable Temperature And Magnetic Field Testing Product Description: The 1D In-Plane Magnetic Field Probe Station is a sophisticated tool designed for precise magnetoresistance measurement in research and testing applications. This magnetic probe station is equipped with advanced features to ensure accurate and reliable data collection, making it an essential instrument for researchers and scientists working in the field of magnetoresistance measurement. The

品質 1D 平面半導体探査ステーション磁場探査ステーション工場 — 1D 平面半導体探査ステーション磁場探査ステーション

1D In-Plane Magnetic Field Probe Station Product Introduction The magnetic field probe station is primarily used for testing the electrical and magnetic properties of semiconductor materials, micro/nano devices, magnetic materials, and spintronic devices and related technologies. It can provide a magnetic field or variable temperature environment and perform high-precision DC/RF measurements. Our company designs and manufactures various magnetic field probe stations, which

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