原子力顕微鏡
多機能AFM原子間力顕微鏡 精密生物顕微鏡
Multi-Functional Atomic Force Microscope Product Model: AtomEdge Pro Product Description: The AtomEdge Pro multi-functional atomic force microscope canperform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. lt features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy,
多機能AFM原子間力顕微鏡 精密生物顕微鏡
ウェーハレベル原子間力顕微鏡
Wafer-Level Atomic Force Microscope Product Model: AtomMax Product Overview: Using micro-cantilever probe structures, this instrument enables 3D morphology characterization of conductive, semiconductive, and insulating solid materials, achieving wafer-level large-sample morphology characterization. Combined with an optical image, the electrically driven sample positioning stage allows for 1 μm positioning accuracy within a 200 x 200 mm area. with fully automated operations
ウェーハレベル原子間力顕微鏡
多機能原子力顕微鏡 低騒音物質顕微鏡 MFM EFM PFMモード
Multi Functional Atomic Force Microscope With MFM EFM PFM Modes Product Description: One of the key features of the AFM is its low noise levels in both the Z direction and XY direction, ensuring accurate and reliable measurements. The noise level in the Z direction is an impressive 0.04 Nm, providing exceptional sensitivity for capturing subtle surface variations and interactions. In the XY direction, the noise level is maintained at 0.4 Nm, further enhancing the precision of
多機能原子力顕微鏡 低騒音物質顕微鏡 MFM EFM PFMモード
カー顕微鏡
250 nm ケル顕微鏡 高分解能 磁気光学カー効果顕微鏡
Multifunctional Spin-Test Magneto-Optic Kerr Microscope Product Model: KMPL-S Equipment Description: This instrument enables high-resolution magnetic domain imaging of magnetic materials and spintronic chips, with a resolution of up to 250 nm. It is equipped with a highly intelligent control system and multifunctional magnetic field probe station, integrating optical imaging, multi-dimensional magnetic fields, electrical transport characterization, microwave testing, and
250 nm ケル顕微鏡 高分解能 磁気光学カー効果顕微鏡
高解像度顕微鏡 微磁気と領域画像のための顕微鏡
Advanced Kerr Microscope For Micromagnetics And Domain Imaging Product Description: The Permanent Magnet Kerr Microscope is a cutting-edge tool designed for advanced micromagnetics research, offering high-resolution imaging capabilities for in-depth studies. This innovative microscope features PID closed-loop feedback regulation for precise magnetic field resolution, with an impressive resolution of 0.05 MT. Equipped with an in-plane magnetic field configuration, this
高解像度顕微鏡 微磁気と領域画像のための顕微鏡
非接触磁気計測用ウェーハースケールヒステリシスループトレーサー
Wafer Scale Hysteresis Tracer For Non Contact Magnetic Metrology Product Description: The Wafer-Level Hysteresis Loop Measurement Instrument is a cutting-edge tool designed for precise and efficient characterization of magnetic properties at the wafer level. This instrument is essential for industries requiring accurate and reliable measurements for quality control and research purposes. One of the key features of this product is its exceptional Sample Repeatability, which is
非接触磁気計測用ウェーハースケールヒステリシスループトレーサー
振動サンプル磁力計
高精度振動試料型磁力計 低ノイズ VSM システム 高磁場オプション用
Vibrating Sample Magnetometer For Wide Temperature And High Field Options Product Description: The Vibrating Sample Magnetometer is an essential tool for the precise measurement of magnetic materials, offering reliable data for research and industrial applications. With its advanced features and high accuracy, this instrument provides key insights into the magnetic properties of various materials. One of the standout features of this Vibrating Sample Magnetometer is its
高精度振動試料型磁力計 低ノイズ VSM システム 高磁場オプション用
トンキーVSMシステム 高精度振動磁気計 迅速かつ信頼性の高い磁気測定
Turnkey VSM Systems For Fast And Reliable Magnetic Measurements Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge Magnetic Characterization System designed for precise and high-accuracy measurement of magnetic moments in various materials, including Multiferroics. With exceptional capabilities and advanced features, this VSM product offers unmatched performance in magnetic moment measurement, temperature control, sample holder rotation, and
トンキーVSMシステム 高精度振動磁気計 迅速かつ信頼性の高い磁気測定
汎用的で敏感な振動サンプル磁気計 低騒音磁気特性測定システム
High Sensitivity VSM Accurate Vibrating Sample Magnetometer Systems Product Description: Introducing the Vibrating Sample Magnetometer, a cutting-edge device designed for precise and efficient magnetic measurements. This advanced instrument is equipped with a range of features that make it an essential tool for researchers and scientists seeking accurate data on magnetic properties. The sample holder of the Vibrating Sample Magnetometer offers a remarkable ±360-degree
汎用的で敏感な振動サンプル磁気計 低騒音磁気特性測定システム
マグニートー光クライオスタット
1.7 K - 350 K マグネット オプティカル クリオスタット 超伝導性MO クリオスタット
Superconducting Magnet Optical Cryostat-MO-Cryo Product Introduction The MO-Cryo superconducting Magnet optical cryostat integrates ultra-low temperatures, strong magnetic fields, and optical testing into a highly integrated and flexible cryogenic system. With 7 side optical windows, 1 top optical window, and 1 bottom window, it enables multi-directional and free optical measurements in a cryogenic strong magnetic-field environment. The internal large sample space accommodate
1.7 K - 350 K マグネット オプティカル クリオスタット 超伝導性MO クリオスタット
高場光学結晶器 1.7 K - 350 K 温度範囲 MO クリオ 多方向光学アクセス
High Field Optical Cryostat With Multi Directional Optical Access Product Description: The Magneto Optical Cryostat is a cutting-edge research tool designed for precise measurements in the fields of 2D Materials, High Magnetic Field, and Magneto optical measurements. This innovative cryostat offers exceptional performance and versatility, making it ideal for a wide range of experimental setups. Featuring 16 DC Lines and 4 20 GHz RF Lines, the Magneto Optical Cryostat provides
高場光学結晶器 1.7 K - 350 K 温度範囲 MO クリオ 多方向光学アクセス
高速冷却磁気光学クライオスタット 1 トップウィンドウ MOクライオスタット 先端材料研究用
Fast Cooldown MO-Cryostat for Advanced Material Research Product Description: The Ultra-Low-Temperature Superconducting-Magnet Integrated Optical Property Measurement Cryostat is a cutting-edge system designed for researchers working with quantum materials and conducting cryogenic microscopy experiments. This advanced cryostat offers precise control over temperature stability, sample space, magnetic field strength, and optical windows, making it an ideal solution for a wide
高速冷却磁気光学クライオスタット 1 トップウィンドウ MOクライオスタット 先端材料研究用
極低温プローブステーション
垂直磁場クライオプローブステーション 液体ヘリウムフリー低温プローブステーション
Vertical Field Cryo Probe Station For Low Temperature Testing Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge system designed for precise research and testing in the field of strong magnetic fields. This innovative product features a superconducting magnet that generates a powerful vertical magnetic field with a strength of up to ±3 T, making it ideal for a wide range of applications requiring high magnetic field
垂直磁場クライオプローブステーション 液体ヘリウムフリー低温プローブステーション
高精度冷凍探査ステーション スピントロニクス 2D 材料と超伝導体のための冷凍探査ステーション
Cryo Prober For Spintronics 2D Materials And Superconductors Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge product that offers advanced capabilities for precise measurements in various research and testing applications. This state-of-the-art system comes equipped with a standard configuration of 4 probe arms, with the flexibility to support up to 8 probe arms, allowing for versatile testing setups. One of the
高精度冷凍探査ステーション スピントロニクス 2D 材料と超伝導体のための冷凍探査ステーション
4本アーム自動プローブステーション 精密磁気プローブステーション 3T超伝導マグネット付き
Automated Cryogenic Probe Station With 3T Superconducting Magnet Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge instrument designed for precise measurements in a variety of research and testing applications. This advanced probe station offers exceptional temperature stability with a range from 10 K to 420 K, maintaining a remarkably low temperature variation of less than ±20 MK. Equipped with a vertical superconducti
4本アーム自動プローブステーション 精密磁気プローブステーション 3T超伝導マグネット付き
MRAMテスター
三温磁気チップテスター 高信頼性検証用精密最終テスター
Tri Temp Magnetic Chip Tester For High Reliability Verification Product Description: Introducing the cutting-edge Magnetic Chip Final Test Machine, the ultimate solution for ATE for Magnetic Chips. This innovative product is designed to meet the demanding requirements of testing magnetic chips with precision and accuracy. The Socket Test Seat of the Magnetic Chip Final Test Machine is engineered to withstand extreme temperatures ranging from -60°C to 170°C, ensuring reliable
三温磁気チップテスター 高信頼性検証用精密最終テスター
磁気チップ製造ライン向け精密MRAMテスター自動最終テストシステム
Automated Final Test System For Magnetic Chip Production Lines Product Description: Excitation System1: One of the key features of this magnetic chip final test machine is the excitation system's capability to generate a maximum magnetic field intensity of ±2000 Oe along the X-axis. This high magnetic field intensity ensures thorough testing of magnetic chips for a wide range of applications. Excitation System3: Another remarkable attribute of this MRAM tester is the
磁気チップ製造ライン向け精密MRAMテスター自動最終テストシステム
Tri Temp Magnetic Chip Tester Versatile Final Tester For High Reliability Verification
Tri Temp Magnetic Chip Tester For High Reliability Verification Product Description: Introducing the Magnetic Chip Final Test Machine, a cutting-edge product designed for non-destructive testing in the semiconductor industry. This advanced MRAM tester is equipped with state-of-the-art features to ensure accurate and reliable testing results. The Electric Displacement Stage Module of the Magnetic Chip Final Test Machine offers precise control with a θ-axis Adjustment Range of
Tri Temp Magnetic Chip Tester Versatile Final Tester For High Reliability Verification
磁気プローブステーション
磁場探査ステーション 0.05 MT 変動温度試験のための探査ステーション
Probe Station For Variable Temperature And Magnetic Field Testing Product Description: The 1D In-Plane Magnetic Field Probe Station is a sophisticated tool designed for precise magnetoresistance measurement in research and testing applications. This magnetic probe station is equipped with advanced features to ensure accurate and reliable data collection, making it an essential instrument for researchers and scientists working in the field of magnetoresistance measurement. The
磁場探査ステーション 0.05 MT 変動温度試験のための探査ステーション
ラボ マニュアル ワッファー 探査 ステーション 360 回転する磁場探査 ステーション
Manual Wafer Probe Station With 360 Rotation For Lab Research Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for research and development (R&D) in the field of magnetic field analysis. This innovative probe station offers precise control and accurate measurements for studying in-plane magnetic fields with ease and efficiency. One of the key features of this probe station is its optical magnification capabiliti
ラボ マニュアル ワッファー 探査 ステーション 360 回転する磁場探査 ステーション
50 MT 磁気プローブステーション RH テスト 磁性膜測定用ウェーハプローブステーション
Cost Effective Wafer Probe Station For Magnetic Film Measurement Product Description: Introducing the Wafer-Level Manual In-Plane Magnetic Field Probe Station, a cutting-edge solution for wafer-level electrical measurement with a focus on RH Testing. This innovative probe station is designed to provide precise testing functions for in-plane magnetic fields with a magnetic field resolution of PID Closed-loop Feedback Regulation and an impressive resolution of 0.05 MT. One of