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Microscope à force atomique
Microscope à force atomique multifonctionnel, microscope à faible bruit pour matériaux, avec modes MFM, EFM et PFM
Multi Functional Atomic Force Microscope With MFM EFM PFM Modes Product Description: One of the key features of the AFM is its low noise levels in both the Z direction and XY direction, ensuring accurate and reliable measurements. The noise level in the Z direction is an impressive 0.04 Nm, providing exceptional sensitivity for capturing subtle surface variations and interactions. In the XY direction, the noise level is maintained at 0.4 Nm, further enhancing the precision of
Microscope à force atomique multifonctionnel, microscope à faible bruit pour matériaux, avec modes MFM, EFM et PFM
Microscope AFM à haute stabilité 0,1 Hz - 30 Hz Systèmes AFM pour les matériaux Biologie et électronique d'imagerie
High Stability AFM For Materials Biology And Electronics Imaging Product Description: The Atomic Force Microscope is a cutting-edge scientific instrument that offers high-resolution imaging and precise measurements for a wide range of applications in nanotechnology, material science, and biological research. This advanced microscope utilizes XYZ Three-axis Full Sample Scanning method, allowing for detailed analysis of samples with exceptional accuracy. One of the key features
Microscope AFM à haute stabilité 0,1 Hz - 30 Hz Systèmes AFM pour les matériaux Biologie et électronique d'imagerie
0,1 Hz - 30 Hz Microscope à force atomique 0,04 Nm Microscope de haute précision avec modes multiples
Advanced AFM With Multiple Modes For Nanoscale Characterization Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-precision surface analysis and nanoscale characterization. With a noise level in the Z direction of 0.04 Nm, this microscope offers exceptional sensitivity and accuracy in capturing surface details. One of the key features of this product is its generous sample size capacity of 25 mm, allowing for the examination of a
0,1 Hz - 30 Hz Microscope à force atomique 0,04 Nm Microscope de haute précision avec modes multiples
Microscope Kerr
Microscope de Kerr avancé - Microscope haute résolution pour la micromagnétique et l'imagerie de domaines
Advanced Kerr Microscope For Micromagnetics And Domain Imaging Product Description: The Permanent Magnet Kerr Microscope is a cutting-edge tool designed for advanced micromagnetics research, offering high-resolution imaging capabilities for in-depth studies. This innovative microscope features PID closed-loop feedback regulation for precise magnetic field resolution, with an impressive resolution of 0.05 MT. Equipped with an in-plane magnetic field configuration, this
Microscope de Kerr avancé - Microscope haute résolution pour la micromagnétique et l'imagerie de domaines
Traceur de boucle d'hystérésis à l'échelle d'une plaquette pour la métrologie magnétique sans contact
Wafer Scale Hysteresis Tracer For Non Contact Magnetic Metrology Product Description: The Wafer-Level Hysteresis Loop Measurement Instrument is a cutting-edge tool designed for precise and efficient characterization of magnetic properties at the wafer level. This instrument is essential for industries requiring accurate and reliable measurements for quality control and research purposes. One of the key features of this product is its exceptional Sample Repeatability, which is
Traceur de boucle d'hystérésis à l'échelle d'une plaquette pour la métrologie magnétique sans contact
Microscope de Kerr à champ magnétique élevé Système MOKE haute sensibilité pour l'étude du magnétisme faible et des matériaux 2D
High Sensitivity MOKE For Weak Magnetism And 2D Material Study Product Description: With a variable temperature range spanning from 4.2 K to 420 K, researchers have the flexibility to study a wide range of materials under different thermal conditions. This broad temperature range is ideal for investigating the properties of weak magnetic materials at low temperatures, providing valuable insights into their behavior and magnetic responses. One of the key features of this
Microscope de Kerr à champ magnétique élevé Système MOKE haute sensibilité pour l'étude du magnétisme faible et des matériaux 2D
Magnétomètre d'échantillon vibrant
Magnétomètre vibrant à échantillon à grande vitesse, système de mesure polyvalent des propriétés magnétiques
VSM For Thin Film ,Nanoparticle And Powder Magnetic Characterization Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge magnetic property measurement system that offers precise and reliable magnetic moment measurements. With exceptional repeatability of ±0.5% and stability of ±0.05% full range, this VSM ensures accurate and consistent results for your magnetic material analysis. Equipped with advanced magnetic field parameters, the VSM can generate
Magnétomètre vibrant à échantillon à grande vitesse, système de mesure polyvalent des propriétés magnétiques
échantillon vibrant à haute sensibilité magnétomètre large plage de température VSM pour la recherche de matériaux avancés
VSM With Wide Temperature Range For Advanced Material Research Product Description: The Vibrating Sample Magnetometer features a sweep field speed of 0.5 T/second, allowing for efficient and rapid data collection. With a sample holder rotation range of ±360-degree electric rotation, this instrument offers flexibility and ease of use for various experimental setups. Equipped with impressive magnetic field parameters, the Vibrating Sample Magnetometer boasts a magnetic field
échantillon vibrant à haute sensibilité magnétomètre large plage de température VSM pour la recherche de matériaux avancés
Système de mesure précise des propriétés magnétiques VSM de haute sensibilité
High Sensitivity VSM For Accurate Magnetic Property Measurements Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge Magnetic Characterization System that offers precise and automated measurement capabilities for analyzing magnetic properties of various materials. This advanced instrument is equipped with multiple features that make it a valuable tool for research and industrial applications. One of the key features of the VSM is its Sample Holder
Système de mesure précise des propriétés magnétiques VSM de haute sensibilité
Cryostat optique magnéto
Cryostat optique à haut champ 1,7 K - 350 K Plage de température MO Cryo avec accès optique multidirectionnel
High Field Optical Cryostat With Multi Directional Optical Access Product Description: The Magneto Optical Cryostat is a cutting-edge research tool designed for precise measurements in the fields of 2D Materials, High Magnetic Field, and Magneto optical measurements. This innovative cryostat offers exceptional performance and versatility, making it ideal for a wide range of experimental setups. Featuring 16 DC Lines and 4 20 GHz RF Lines, the Magneto Optical Cryostat provides
Cryostat optique à haut champ 1,7 K - 350 K Plage de température MO Cryo avec accès optique multidirectionnel
Cryostat magnéto-optique à refroidissement rapide 1 fenêtre supérieure MO Cryostat pour la recherche de matériaux avancés
Fast Cooldown MO-Cryostat for Advanced Material Research Product Description: The Ultra-Low-Temperature Superconducting-Magnet Integrated Optical Property Measurement Cryostat is a cutting-edge system designed for researchers working with quantum materials and conducting cryogenic microscopy experiments. This advanced cryostat offers precise control over temperature stability, sample space, magnetic field strength, and optical windows, making it an ideal solution for a wide
Cryostat magnéto-optique à refroidissement rapide 1 fenêtre supérieure MO Cryostat pour la recherche de matériaux avancés
1 Cryostat magnéto-optique à fenêtre supérieure, aimant supraconducteur, cryostat avec accès optique à faibles vibrations
Superconducting Magnet Cryostats with Low Vibration Optical Access Product Description: The Ultra-Low-Temperature Superconducting-Magnet Integrated Optical Property Measurement Cryostat is a cutting-edge system designed to provide precise and reliable measurements in the field of magneto optical measurements and Raman spectroscopy. This advanced cryostat offers a wide temperature range from 1.7 K to 350 K, making it ideal for a variety of research applications requiring
1 Cryostat magnéto-optique à fenêtre supérieure, aimant supraconducteur, cryostat avec accès optique à faibles vibrations
Station de sonde cryogénique
Station de sonde cryogénique de précision Station de sonde optique polyvalente pour micro-ondes IV CV et tests optiques
Cryogenic Probe Station For IV CV Microwave And Optical Testing Product Description: Introducing our cutting-edge Cryogenic Probe Station, a revolutionary solution designed for precise and efficient testing in a wide range of applications. This advanced system offers unparalleled performance and versatility, making it an ideal choice for researchers and engineers seeking a cost-effective and reliable testing solution. The Cryogenic Probe Station features a Probe Arm Stroke of
Station de sonde cryogénique de précision Station de sonde optique polyvalente pour micro-ondes IV CV et tests optiques
Station de sonde à demi-conducteur en boucle fermée 4K Station de sonde à plaquette sous vide pour les tests de plaquettes de 2 pouces
4K Closed Loop Cryogenic Probe Station For 2 Inch Wafer Testing Product Description: The Cryogenic Probe Station is an essential tool for researchers and scientists working in the field of low-temperature measurements. This advanced equipment is designed to provide precise control over the thermal environment during experiments, ensuring accurate and reliable results. With its innovative features and high-performance capabilities, the Cryogenic Probe Station is ideal for a
Station de sonde à demi-conducteur en boucle fermée 4K Station de sonde à plaquette sous vide pour les tests de plaquettes de 2 pouces
Station de sonde cryogénique sous vide Épreuves électriques Station de sonde automatisée
Cost Effective Cryo Probe Station For Automated Electrical Testing Product Description: The Cryogenic Probe Station is an essential tool for cryogenic device characterization, providing a cost-effective solution for researchers and engineers in various industries. This closed-cycle probe station offers precise control and stability for conducting experiments at low temperatures. Key Features: Vacuum: The Cryogenic Probe Station boasts a low-temperature vacuum level of
Station de sonde cryogénique sous vide Épreuves électriques Station de sonde automatisée
Testeur de MRAM
Testeur de précision de puce magnétique tri-temp Testeur final pour la vérification de haute fiabilité
Tri Temp Magnetic Chip Tester For High Reliability Verification Product Description: Introducing the cutting-edge Magnetic Chip Final Test Machine, the ultimate solution for ATE for Magnetic Chips. This innovative product is designed to meet the demanding requirements of testing magnetic chips with precision and accuracy. The Socket Test Seat of the Magnetic Chip Final Test Machine is engineered to withstand extreme temperatures ranging from -60°C to 170°C, ensuring reliable
Testeur de précision de puce magnétique tri-temp Testeur final pour la vérification de haute fiabilité
Système de test final automatisé pour testeur MRAM de précision pour les lignes de production de puces magnétiques
Automated Final Test System For Magnetic Chip Production Lines Product Description: Excitation System1: One of the key features of this magnetic chip final test machine is the excitation system's capability to generate a maximum magnetic field intensity of ±2000 Oe along the X-axis. This high magnetic field intensity ensures thorough testing of magnetic chips for a wide range of applications. Excitation System3: Another remarkable attribute of this MRAM tester is the
Système de test final automatisé pour testeur MRAM de précision pour les lignes de production de puces magnétiques
Testeur de puce magnétique tri-temporelle Testeur final polyvalent pour une vérification de haute fiabilité
Tri Temp Magnetic Chip Tester For High Reliability Verification Product Description: Introducing the Magnetic Chip Final Test Machine, a cutting-edge product designed for non-destructive testing in the semiconductor industry. This advanced MRAM tester is equipped with state-of-the-art features to ensure accurate and reliable testing results. The Electric Displacement Stage Module of the Magnetic Chip Final Test Machine offers precise control with a θ-axis Adjustment Range of
Testeur de puce magnétique tri-temporelle Testeur final polyvalent pour une vérification de haute fiabilité
Station de sonde magnétique
Station de sonde de champ magnétique 0,05 MT Station de sonde pour les essais à température variable
Probe Station For Variable Temperature And Magnetic Field Testing Product Description: The 1D In-Plane Magnetic Field Probe Station is a sophisticated tool designed for precise magnetoresistance measurement in research and testing applications. This magnetic probe station is equipped with advanced features to ensure accurate and reliable data collection, making it an essential instrument for researchers and scientists working in the field of magnetoresistance measurement. The
Station de sonde de champ magnétique 0,05 MT Station de sonde pour les essais à température variable
Manuel de laboratoire Station de sondage de plaquettes Champ magnétique Station de sondage avec rotation à 360 degrés
Manual Wafer Probe Station With 360 Rotation For Lab Research Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for research and development (R&D) in the field of magnetic field analysis. This innovative probe station offers precise control and accurate measurements for studying in-plane magnetic fields with ease and efficiency. One of the key features of this probe station is its optical magnification capabiliti
Manuel de laboratoire Station de sondage de plaquettes Champ magnétique Station de sondage avec rotation à 360 degrés
Station de sondes magnétiques 50 MT pour tests RH, stations de sondes de plaquettes pour la mesure de films magnétiques
Cost Effective Wafer Probe Station For Magnetic Film Measurement Product Description: Introducing the Wafer-Level Manual In-Plane Magnetic Field Probe Station, a cutting-edge solution for wafer-level electrical measurement with a focus on RH Testing. This innovative probe station is designed to provide precise testing functions for in-plane magnetic fields with a magnetic field resolution of PID Closed-loop Feedback Regulation and an impressive resolution of 0.05 MT. One of
