原子力顕微鏡

多機能原子間力顕微鏡

Multi-Functional Atomic Force Microscope Product Model: AtomEdge Pro Product Description: The AtomEdge Pro multi-functional atomic force microscope canperform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. lt features multiple working modes such as ...

ウェーハレベル原子間力顕微鏡

Wafer-Level Atomic Force Microscope Product Model: Atommax Product Overview: Using micro-cantilever probe structures, this instrument enables 3D morphology characterization of conductive, semiconductive, and insulating solid materials, achieving wafer-level large-sample morphology characterization. ...

基本型原子力顕微鏡

Product Name Basic-type Atomic Force Microscope - AtomExplorer Product Introduction The AtomExplorer Basic-type Atomic Force Microscope delivers sub-nanometer resolution for observing material surface topography and texture. It captures fine structures and minute features on material surfaces across ...

多機能原子力顕微鏡低騒音物質顕微鏡 MFM EFM PFMモード

Multi Functional Atomic Force Microscope With MFM EFM PFM Modes Product Description: One of the key features of the AFM is its low noise levels in both the Z direction and XY direction, ensuring accurate and reliable measurements. The noise level in the Z direction is an impressive 0.04 nm, ...

高スキャン力顕微鏡 0.15 nm 高解像度顕微鏡

High Scanning Force Microscope For Wafe Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument used for high-resolution imaging and surface analysis in various fields such as nanotechnology, materials science, and biology. With its advanced capabilities and precise ...

オールインワン原子間力顕微鏡多機能生物顕微鏡柔軟で精密な操作用

All In One Atomic Force Microscope For Flexible Precise Operation Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool designed for nanoscale electrical measurement and analysis. This advanced instrument offers unparalleled capabilities in scanning and imaging at the ...

0.15 nm 高分解能顕微鏡カスタマイズされた原子顕微鏡

Advanced Atomic Force Microscope For High-Resolution Imaging Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-resolution imaging and nanoscale analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM offers atomic resolution imaging capabilities ...

生物原子力顕微鏡高精度スキャン探査機顕微鏡 0.15 nm解像度

High Precision Scanning Probe Microscope 0.15 nm Resolution Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers exceptional capabilities for nanometer resolution surface analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM product provides ...

高解像度原子力顕微鏡 0.04 nm ナノスケール解析のための産業顕微鏡

High-Resolution Atomic Force Microscope For Nanoscale Analysis Product Description: The Atomic Force Microscope (AFM) is a versatile tool for surface analysis, commonly used in various scientific and industrial applications. This cutting-edge device offers exceptional scanning capabilities and ...

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