Атомный силовый микроскоп

Многофункциональный микроскоп атомной силы

Multi-Functional Atomic Force Microscope Product Model: AtomEdge Pro Product Description: The AtomEdge Pro multi-functional atomic force microscope canperform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. lt features multiple working modes such as ...

Микроскоп атомной силы на уровне пластины

Wafer-Level Atomic Force Microscope Product Model: Atommax Product Overview: Using micro-cantilever probe structures, this instrument enables 3D morphology characterization of conductive, semiconductive, and insulating solid materials, achieving wafer-level large-sample morphology characterization. ...

Атомно-силовой микроскоп базового типа

Product Name Basic-type Atomic Force Microscope - AtomExplorer Product Introduction The AtomExplorer Basic-type Atomic Force Microscope delivers sub-nanometer resolution for observing material surface topography and texture. It captures fine structures and minute features on material surfaces across ...

Многофункциональный атомно-силовой микроскоп для материалов с низким уровнем шума, с режимами MFM, EFM, PFM

Multi Functional Atomic Force Microscope With MFM EFM PFM Modes Product Description: One of the key features of the AFM is its low noise levels in both the Z direction and XY direction, ensuring accurate and reliable measurements. The noise level in the Z direction is an impressive 0.04 nm, ...

Микроскоп высокой сканирующей силы 0,15 Нм Микроскоп высокого разрешения для волокна

High Scanning Force Microscope For Wafe Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument used for high-resolution imaging and surface analysis in various fields such as nanotechnology, materials science, and biology. With its advanced capabilities and precise ...

Все в одном Микроскоп атомной силы Многофункциональные биологические микроскопы для гибкой и точной работы

All In One Atomic Force Microscope For Flexible Precise Operation Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool designed for nanoscale electrical measurement and analysis. This advanced instrument offers unparalleled capabilities in scanning and imaging at the ...

0.15 Нм высокоразрешительные микроскопы индивидуальные атомные микроскопы

Advanced Atomic Force Microscope For High-Resolution Imaging Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-resolution imaging and nanoscale analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM offers atomic resolution imaging capabilities ...

Биологический микроскоп атомной силы высокоточный сканирующий зондовый микроскоп разрешение 0,15 Нм

High Precision Scanning Probe Microscope 0.15 nm Resolution Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers exceptional capabilities for nanometer resolution surface analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM product provides ...

Микроскоп атомной силы высокого разрешения 0,04 Нм Промышленный микроскоп для анализа на наномасштабе

High-Resolution Atomic Force Microscope For Nanoscale Analysis Product Description: The Atomic Force Microscope (AFM) is a versatile tool for surface analysis, commonly used in various scientific and industrial applications. This cutting-edge device offers exceptional scanning capabilities and ...

1 2 3 4 5 › »