English
Français
Deutsch
Italiano
Español
Português
Nederlandse
Ελληνικά
日本語
한국
Polski
فارسی
বাংলা
ไทย
Tiếng Việt
العربية
हिन्दी
Türkçe
Indonesia
Атомный силовый микроскоп
Универсальная платформа обнаружения – пользовательские модули и многосиловая микроскопия для материаловедения
Product Description: The Atomic Force Microscope (AFM) is a cutting-edge nanoscale characterization platform designed to provide unparalleled precision and versatility in surface analysis. With a sample size capacity of up to 25 mm, this instrument is ideal for investigating a wide range of materials and structures at the nanoscale, making it an essential tool for researchers and engineers across various scientific disciplines. One of the standout features of this AFM is its
Атомно-силовой микроскоп для точного анализа поверхности и нанометрового масштабирования в научных исследованиях и промышленных применениях
Multi-Functional Atomic Force Microscope - AtomEdge Pro Product Introduction The AtomEdge Pro multi-functional atomic force microscope can perform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. It features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy, electrostat
