원자력 현미경

모든 것을 하나의 탐지 플랫폼으로 만들어집니다. 재료 과학을 위한 맞춤형 모듈 및 다중 힘 현미경

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge nanoscale characterization platform designed to provide unparalleled precision and versatility in surface analysis. With a sample size capacity of up to 25 mm, this instrument is ideal for investigating a wide range of materials and structures at the nanoscale, making it an essential tool for researchers and engineers across various scientific disciplines. One of the standout features of this AFM is its

과학 연구 및 산업 응용 분야에서 정밀 표면 분석 및 나노미터 규모 이미지 촬영을위한 AFM

Multi-Functional Atomic Force Microscope - AtomEdge Pro Product Introduction The AtomEdge Pro multi-functional atomic force microscope can perform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. It features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy, electrostat

« ‹ 1 2 3 4 5