원자력 현미경

생물학적 원자력 현미경 고정도 스캔 탐사 현미경 0.15 Nm 해상도

High Precision Scanning Probe Microscope 0.15 Nm Resolution Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers exceptional capabilities for nanometer resolution surface analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM product provides precise imaging and measurement of samples with dimensions up to 200 mm. One of the key features of this AFM is its versatility in probe types. Users can choose from a variety of

웨이퍼 레벨 원자력 현미경 0.1Hz - 30Hz 프로브 현미경

Wafer-Level Atomic Force Microscope Product Model: AtomMax Product Overview: Using micro-cantilever probe structures, this instrument enables 3D morphology characterization of conductive, semiconductive, and insulating solid materials, achieving wafer-level large-sample morphology characterization. Combined with an optical image, the electrically driven sample positioning stage allows for 1 μm positioning accuracy within a 200 x 200 mm area. with fully automated operations

다기능 AFM 원자력 현미경 정밀 생물학 현미경

Multi-Functional Atomic Force Microscope Product Model: AtomEdge Pro Product Description: The AtomEdge Pro multi-functional atomic force microscope canperform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. lt features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy,

고해상도 원자력 현미경 0.04 Nm 산업용 현미경, 나노 스케일 분석용

High-Resolution Atomic Force Microscope For Nanoscale Analysis Product Description: The Atomic Force Microscope (AFM) is a versatile tool for surface analysis, commonly used in various scientific and industrial applications. This cutting-edge device offers exceptional scanning capabilities and precise imaging for detailed analysis of samples. One of the key features of the AFM is its impressive Scanning Speed range, which allows for precise scanning at speeds ranging from 0

힘 변조 스캔 원자 현미경 고해상도 과학 현미경 0.04 Nm

Force Modulation Scanning Atomic Force Microscope With High Resolution Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-resolution imaging and analysis at the nanoscale level. With its advanced capabilities, this microscope offers unparalleled performance in nanotechnology research and development. One of the key features of the Atomic Force Microscope is its impressive scanning speed range, which allows for precise and efficient

0.1Hz - 30Hz 원자력 현미경 나노 스케일 스캔 탐사 현미경

Advanced Scanning Probe Microscope for Nanoscale Measurements Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool that offers multi-mode measurement capabilities with nanometer resolution, making it an essential instrument for various research and industrial applications. With a remarkable resolution of 0.04 nm, the AFM provides high-precision imaging and measurement of surface topography at the nanoscale level. This exceptional resolution allows

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