원자력 현미경

고해상도 원자력 현미경 0.04 Nm 산업용 현미경, 나노 스케일 분석용

High-Resolution Atomic Force Microscope For Nanoscale Analysis Product Description: The Atomic Force Microscope (AFM) is a versatile tool for surface analysis, commonly used in various scientific and industrial applications. This cutting-edge device offers exceptional scanning capabilities and precise imaging for detailed analysis of samples. One of the key features of the AFM is its impressive Scanning Speed range, which allows for precise scanning at speeds ranging from 0

힘 변조 스캔 원자 현미경 고해상도 과학 현미경 0.04 Nm

Force Modulation Scanning Atomic Force Microscope With High Resolution Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-resolution imaging and analysis at the nanoscale level. With its advanced capabilities, this microscope offers unparalleled performance in nanotechnology research and development. One of the key features of the Atomic Force Microscope is its impressive scanning speed range, which allows for precise and efficient

0.1Hz - 30Hz 원자력 현미경 나노 스케일 스캔 탐사 현미경

Advanced Scanning Probe Microscope for Nanoscale Measurements Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool that offers multi-mode measurement capabilities with nanometer resolution, making it an essential instrument for various research and industrial applications. With a remarkable resolution of 0.04 nm, the AFM provides high-precision imaging and measurement of surface topography at the nanoscale level. This exceptional resolution allows

나노크기 재료 과학 연구를 위한 100μm×100μm 3D 스캐닝

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge scientific instrument designed to provide high-resolution imaging and precise surface characterization at the nanoscale. This advanced microscope is engineered to meet the demanding requirements of various research and industrial applications, particularly in fields such as semiconductors, materials science, and nanotechnology. With its exceptional capability for multi-mode measurement, the AFM offers

서브 나노미터 물질 나노 스케일 분석을 위한 접촉/타프 모드

Product Description: The Atomic Force Microscope (AFM) is an advanced Scanning Force Microscope designed to provide exceptional imaging and measurement capabilities at the nanoscale. Engineered for precision and versatility, this AFM model supports a wide range of scanning rates from 0.1 Hz up to 30 Hz, allowing users to tailor the scanning speed according to their specific application needs. Whether conducting detailed surface analysis or rapid sample inspections, this

반도체 및 첨단 재료 연구용 나노 스케일 3D 영상

Product Description: The Atomic Force Microscope (AFM) is a highly advanced and versatile instrument designed to provide precise surface characterization through multiple modes of operation. This multifunctional microscope integrates a range of techniques including Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Force Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), Scanning Capacitive Microscopy (SCM), and Magnetic Force Microscopy (MFM). Additionally, it

고정밀 나노 스케일 재료 특성 분석을 위한 저소음 Z축

Product Description: The Atomic Force Microscope (AFM) is an advanced, all-in-one AFM system designed to deliver unparalleled precision and versatility for nanoscale imaging and measurements. Utilizing an XYZ three-axis full-sample scanning method, this AFM enables comprehensive and accurate surface analysis by allowing complete freedom of movement across the sample in all three spatial dimensions. This capability ensures high-resolution imaging and detailed characterization

고정밀 나노 스케일 재료 특성화를 위한 MFM/KPFM 모드

Product Description: The Atomic Force Microscope (AFM) is a state-of-the-art scanning force microscope designed to provide unparalleled imaging and measurement capabilities at the nanoscale. With its advanced XYZ three-axis full-sample scanning method, this AFM allows precise and comprehensive examination of sample surfaces, ensuring high accuracy and repeatability in nanoscale research and industrial applications. The full-sample scanning capability enables the microscope to

0.1 Hz - 30 Hz 원자력 현미경 0.04 Nm 다중 모드 고정밀 현미경

Advanced AFM With Multiple Modes For Nanoscale Characterization Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-precision surface analysis and nanoscale characterization. With a noise level in the Z direction of 0.04 Nm, this microscope offers exceptional sensitivity and accuracy in capturing surface details. One of the key features of this product is its generous sample size capacity of 25 mm, allowing for the examination of a

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