مجهر القوة الذرية

مجهر القوة الذرية عالي الدقة 0.04 نانومتر مجهر صناعي لتحليل النطاق النانوي

High-Resolution Atomic Force Microscope For Nanoscale Analysis Product Description: The Atomic Force Microscope (AFM) is a versatile tool for surface analysis, commonly used in various scientific and industrial applications. This cutting-edge device offers exceptional scanning capabilities and precise imaging for detailed analysis of samples. One of the key features of the AFM is its impressive Scanning Speed range, which allows for precise scanning at speeds ranging from 0

المجهر الذري لتحليل تعديل القوة المجهر العلمي عالي الدقة 0.04 نسمة

Force Modulation Scanning Atomic Force Microscope With High Resolution Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-resolution imaging and analysis at the nanoscale level. With its advanced capabilities, this microscope offers unparalleled performance in nanotechnology research and development. One of the key features of the Atomic Force Microscope is its impressive scanning speed range, which allows for precise and efficient

0.1 هرتز - 30 هرتز مجهر القوة الذرية مجهر المسح الصناعي على نانو المستوى

Advanced Scanning Probe Microscope for Nanoscale Measurements Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool that offers multi-mode measurement capabilities with nanometer resolution, making it an essential instrument for various research and industrial applications. With a remarkable resolution of 0.04 nm, the AFM provides high-precision imaging and measurement of surface topography at the nanoscale level. This exceptional resolution allows

مسح ثلاثي الأبعاد 100 ميكرومتر × 100 ميكرومتر لأبحاث علوم المواد النانوية

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge scientific instrument designed to provide high-resolution imaging and precise surface characterization at the nanoscale. This advanced microscope is engineered to meet the demanding requirements of various research and industrial applications, particularly in fields such as semiconductors, materials science, and nanotechnology. With its exceptional capability for multi-mode measurement, the AFM offers

أساليب الاتصال/النقر لتحليل المواد دون نانومتر على نطاق نانوي

Product Description: The Atomic Force Microscope (AFM) is an advanced Scanning Force Microscope designed to provide exceptional imaging and measurement capabilities at the nanoscale. Engineered for precision and versatility, this AFM model supports a wide range of scanning rates from 0.1 Hz up to 30 Hz, allowing users to tailor the scanning speed according to their specific application needs. Whether conducting detailed surface analysis or rapid sample inspections, this

التصوير ثلاثي الأبعاد على نطاق نانوي لأبحاث أشباه الموصلات والمواد المتقدمة

Product Description: The Atomic Force Microscope (AFM) is a highly advanced and versatile instrument designed to provide precise surface characterization through multiple modes of operation. This multifunctional microscope integrates a range of techniques including Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Force Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), Scanning Capacitive Microscopy (SCM), and Magnetic Force Microscopy (MFM). Additionally, it

محور Z منخفض الضوضاء لتمييز المواد النانوية بدقة عالية

Product Description: The Atomic Force Microscope (AFM) is an advanced, all-in-one AFM system designed to deliver unparalleled precision and versatility for nanoscale imaging and measurements. Utilizing an XYZ three-axis full-sample scanning method, this AFM enables comprehensive and accurate surface analysis by allowing complete freedom of movement across the sample in all three spatial dimensions. This capability ensures high-resolution imaging and detailed characterization

أنماط MFM/KPFM لتمييز المواد النانوية عالية الدقة

Product Description: The Atomic Force Microscope (AFM) is a state-of-the-art scanning force microscope designed to provide unparalleled imaging and measurement capabilities at the nanoscale. With its advanced XYZ three-axis full-sample scanning method, this AFM allows precise and comprehensive examination of sample surfaces, ensuring high accuracy and repeatability in nanoscale research and industrial applications. The full-sample scanning capability enables the microscope to

مجهر القوة الذرية بتردد 0.1 هرتز - 30 هرتز، مجهر عالي الدقة 0.04 نيوتن متر مع أوضاع متعددة

Advanced AFM With Multiple Modes For Nanoscale Characterization Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-precision surface analysis and nanoscale characterization. With a noise level in the Z direction of 0.04 Nm, this microscope offers exceptional sensitivity and accuracy in capturing surface details. One of the key features of this product is its generous sample size capacity of 25 mm, allowing for the examination of a

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