English
Français
Deutsch
Italiano
Русский
Español
Português
Nederlandse
Ελληνικά
한국
Polski
فارسی
বাংলা
ไทย
Tiếng Việt
العربية
हिन्दी
Türkçe
Indonesia
原子力顕微鏡
オールインワン検出プラットフォーム 材料科学のためのカスタムモジュールと多力顕微鏡
Product Description: The Atomic Force Microscope (AFM) is a cutting-edge nanoscale characterization platform designed to provide unparalleled precision and versatility in surface analysis. With a sample size capacity of up to 25 mm, this instrument is ideal for investigating a wide range of materials and structures at the nanoscale, making it an essential tool for researchers and engineers across various scientific disciplines. One of the standout features of this AFM is its
精密表面分析とナノメートルスケールイメージングのためのAFM - 科学研究および産業用途
Multi-Functional Atomic Force Microscope - AtomEdge Pro Product Introduction The AtomEdge Pro multi-functional atomic force microscope can perform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. It features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy, electrostat
