Atomic Force Microscope

All-in-One Detection Platform – Custom Modules & Multi-Force Microscopy For Materials Science

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge nanoscale characterization platform designed to provide unparalleled precision and versatility in surface analysis. With a sample size capacity of up to 25 mm, this instrument is ideal for investigating a wide range of ...

AFM for Precise Surface Analysis and Nanometer Scale Imaging in Scientific Research and Industrial Applications

Multi-Functional Atomic Force Microscope - AtomEdge Pro Product Introduction The AtomEdge Pro multi-functional atomic force microscope can perform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. It features multiple working modes such as contact, tap, ...

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