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Products
Atomic Force Microscope
- Wafer-Level Atomic Force Microscoperoscope
- Multi Functional Atomic Force Microscope Low Noise Materials Microscope With MFM EFM PFM Modes
- High Stability AFM Microscope 0.1 Hz - 30 Hz AFM Systems For Materials Biology And Electronics Imaging
- 0.1 Hz - 30 Hz Atomic Force Microscope 0.04 Nm High Precision Microscope With Multiple Modes
Kerr Microscope
- Advanced Kerr Microscope High Resolution Microscope For Micromagnetics And Domain Imaging
- Wafer Scale Hysteresis Loop Tracer For Non Contact Magnetic Metrology
- High Magnetic Field Kerr Microscope High Sensitivity MOKE System For Weak Magnetism And 2D Material Study
- MOKE Wafer Scanner EFEM Wafer Measurement System For Hysteresis And Magnetic Uniformity Maps
Vibrating Sample Magnetometer
- High Speed Vibrating Sample Magnetometer Versatile Magnetic Property Measurement System
- High Sensitivity Vibrating Sample Magnetometer Wide Temperature Range VSM For Advanced Material Research
- Accurate Magnetic Property Measurement System High Sensitivity VSM
- Low Noise Vibrating Sample Magnetometer High Speed VSM Versatile For Reliable Magnetic Characterization
Magneto Optical Cryostat
- High Field Optical Cryostat 1.7 K - 350 K Temperature Range MO Cryo With Multi Directional Optical Access
- Fast Cooldown Magneto Optical Cryostat 1 Top Window MO Cryostat For Advanced Material Research
- 1 Top Window Magneto Optical Cryostat Superconducting Magnet Cryostat With Low Vibration Optical Access
- High Field Optical Cryostat Superconducting Magnet Cryostat For Low Temperature Magneto Optics
Cryogenic Probe Station
- Precise Cryogenic Probe Station Versatile Optical Probe Station For IV CV Microwave And Optical Testing
- 4K Closed Loop Semiconductor Probe Station Vacuum Wafer Probe Station For 2 Inch Wafer Testing
- Vacuum Cryogenic Probe Station Electrical Testing Automated Probe Station
- Cryogen Free Automated Probe Station Low Temperature Vacuum Probe Station For 4K Device Measurements
MRAM Tester
- Tri Temp Magnetic Chip Tester Precision Final Tester For High Reliability Verification
- Precision MRAM Tester Automated Final Test System For Magnetic Chip Production Lines
- Tri Temp Magnetic Chip Tester Versatile Final Tester For High Reliability Verification
- Automated MRAM Tester Magnetic Chip Final Test Machine For Production And Batch Final Testing
Magnetic Probe Station
- Magnetic Field Probe Station 0.05 MT Probing Station For Variable Temperature Testing
- Lab Manual Wafer Probe Station Magnetic Field Probing Station With 360 Rotation
- 50 MT Magnetic Probe Station RH Testing Wafer Probe Stations For Magnetic Film Measurement
- High Precision RF Probe Station 50 MT Manual Wafer Prober For Magnetoresistance
