Français
Deutsch
Italiano
Русский
Español
Português
Nederlandse
Ελληνικά
日本語
한국
Polski
فارسی
বাংলা
ไทย
Tiếng Việt
العربية
हिन्दी
Türkçe
Indonesia
SiteMap
Products
Atomic Force Microscope
- Biological Atomic Force Microscope High Precision Scanning Probe Microscope 0.15 Nm Resolution
- High Resolution Atomic Force Microscope 0.04 Nm Industrial Microscope For Nanoscale Analysis
- Force Modulation Scanning Atomic Microscope High Resolution Science Microscope 0.04 Nm
- 0.1 Hz - 30 Hz Atomic Force Microscope Nanoscale Scanning Probe Microscopes
Kerr Microscope
- Magneto Optic Kerr Microscope 250 Nm Spin Test Microscope For Comprehensive Material Characterization
- Multifunctional MOKE Microscope 250 Nm Magneto Optical Kerr Effect Microscope For SOT Analysis
- Permanent Magnet Kerr Microscope Vector MOKE Microscope 450 Nm For 3D Analysis Of Hard Magnetic Materials
- MOKE Wafer Scanner EFEM Wafer Measurement System For Hysteresis And Magnetic Uniformity Maps
Vibrating Sample Magnetometer
- Low Noise Vibrating Sample Magnetometer High Speed VSM Versatile For Reliable Magnetic Characterization
- Precise Control Vibrating Magnetometer 77 K - 950 K Temperature Range VSM For Powders Films
- Versatile And Sensitive Vibrating Sample Magnetometer Low Noise Magnetic Property Measurement System
- Turnkey VSM Systems High Accuracy Vibrating Magnetometer For Fast And Reliable Magnetic Measurements
Magneto Optical Cryostat
- Fast Cooldown Magneto Optical Cryostat 1 Top Window MO-Cryostat For Advanced Material Research
- High Field Optical Cryostat 1.7 K - 350 K Temperature Range MO-Cryo With Multi Directional Optical Access
- 1.7 K-350 K Superconducting Magnet Cryostat – High-Stability Opto-Magnetic Testing
- Superconducting Magnet Cryostat – Multi-Optical Windows For Low-Temp/High-Field Tests
Cryogenic Probe Station
- Precise Cryogenic Probe Station Cryogen Free Probe Station For Automated Magnetic Measurements
- Cryogen Free Automated Probe Station Low Temperature Vacuum Probe Station For 4 K Device Measurements
- Vacuum Cryogenic Probe Station Electrical Testing Automated Probe Station
- 4 K Closed Loop Semiconductor Probe Station Vacuum Wafer Probe Station For 2 Inch Wafer Testing
MRAM Tester
- Precision MRAM Tester Automated Final Test System For Magnetic Chip Production Lines
- Tri Temp Magnetic Chip Tester Precision Final Tester For High Reliability Verification
- Tri Temp Magnetic Chip Tester Versatile Final Tester For High Reliability Verification
- Automated MRAM Tester Magnetic Chip Final Test Machine For Production And Batch Final Testing
Magnetic Probe Station
- Vector Magnetic Probe Station Scalable Wafer Probe Station For 2D Device Characterization
- In Plane And Vertical Magnetic Probe Station 140 MT Wafer Prober For Advanced Testing
- Upgradeable 2D Probe Station Magnetic Field Probe Station For Precision Research And Production
- Programmable Probe Station Precise RF Probe Station For Expandable Research And Development
