
MOKE Wafer Scanner EFEM Wafer Measurement System For Hysteresis And Magnetic Uniformity Maps
MOKE Wafer Scanner
,EFEM Wafer Measurement System
,EFEM Wafer Scanner
Basic Properties
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MOKE Wafer Scanner For Hysteresis And Magnetic Uniformity Maps
Product Description:
Introducing the Wafer-Level Hysteresis Loop Measurement Instrument, a cutting-edge tool in Spintronics Metrology designed to meet the demanding requirements of advanced research and development in the field. This innovative product offers unparalleled capabilities for precise and efficient measurement of magnetic properties at the wafer level.
One of the key features of this state-of-the-art Wafer Magnetometer is its exceptional Sample Repeatability, boasting a performance level of Better Than 10 μm. This high level of repeatability ensures the accuracy and consistency of measurement results, allowing researchers to rely on the data obtained with confidence.
Furthermore, the Wafer Magnetometer is equipped with advanced technology that ensures Magnetic Field Uniformity of Better Than ±1% at Φ1 Mm. This exceptional uniformity across the magnetic field ensures that measurements are not affected by variations in field strength, leading to more reliable and accurate data analysis.
When it comes to Testing Efficiency, the Wafer-Level Hysteresis Loop Measurement Instrument excels with a throughput of 12 WPH at ±1.3 T, allowing for rapid and efficient characterization of magnetic properties. With the ability to measure 9 sites on a 200 Mm wafer simultaneously, this instrument enables researchers to streamline their workflow and increase productivity.
Researchers will also appreciate the flexibility offered by the Wafer Magnetometer in terms of Sample Size compatibility. This instrument is designed to work with wafers up to 12 inches in size and supports fragment testing, making it versatile and adaptable to a wide range of sample types and sizes.
Another standout feature of the Wafer-Level Hysteresis Loop Measurement Instrument is its impressive Kerr Angle Resolution of 0.3 Mdeg (RMS). This high resolution allows for detailed and accurate measurement of magnetic properties, enabling researchers to gain valuable insights into the behavior of materials at the nanoscale.
In conclusion, the Wafer-Level Hysteresis Loop Measurement Instrument is a powerful tool that offers unmatched capabilities for precise and efficient measurement of magnetic properties at the wafer level. With its advanced features, superior performance, and versatility, this instrument is a must-have for researchers working in the field of Spintronics Metrology.
Features:
- Product Name: Wafer-Level Hysteresis Loop Measurement Instrument
- Sample Size: Compatible With 12-inch And Below, Supports Fragment Testing
- Magnetic Field Uniformity: Better Than ±1%@Φ1 Mm
- Sample Repeatability: Better Than 10 μm
- Magnetic Field: Vertical ±2.4 T; In-plane ±1.3 T
- Uptime: 90%
Technical Parameters:
Testing Efficiency | 12 WPH@±1.3 T /9 Sites Measurement/200 Mm Wafer |
Sample Size | Compatible With 12-inch And Below, Supports Fragment Testing |
Kerr Angle Resolution | 0.3 Mdeg (RMS) |
Magnetic Field Resolution | PID Closed-loop Feedback Regulation, 0.01 MT |
Sample Repeatability | Better Than 10 μm |
EFEM | Optional |
Uptime | 90% |
Magnetic Field | Vertical ±2.4 T; In-plane ±1.3 T |
Magnetic Field Uniformity | Better Than ±1%@Φ1 Mm |
Testing Functions | Non-destructive Hysteresis Loop Measurement Of Magnetic Stacks/devices, Automatic Extraction Of Hysteresis Loop Information (free Layer And Pinned Layer Hc, Hex, M (Kerr Angle Value)), And Rapid Mapping Of Wafer Magnetic Characteristic Distribution |
Applications:
Truth Instruments introduces the Wafer-MOKE, a cutting-edge Wafer-Level Hysteresis Loop Measurement Instrument designed for precise and efficient thin film magnetic wafer inspection. Originating from CHINA, this innovative product offers superior performance and accuracy in measuring magnetic properties on wafers.
The Wafer-MOKE from Truth Instruments boasts exceptional magnetic field uniformity, surpassing ±1% at Φ1 mm, ensuring reliable and consistent results. Its magnetic field resolution is top-notch with PID closed-loop feedback regulation, achieving an impressive 0.01 MT for precise measurements.
When it comes to testing efficiency, the Wafer-MOKE excels with a testing speed of 12 wafers per hour at ±1.3 T and 9 sites measurement on a 200 mm wafer. This high throughput capability makes it ideal for high-volume production environments requiring quick and accurate measurements.
For added flexibility, the Wafer-MOKE offers an optional EFEM feature, allowing users to customize their setup based on specific requirements. This adaptability ensures seamless integration into various wafer inspection processes, enhancing overall productivity.
Moreover, the sample repeatability of the Wafer-MOKE is exceptional, surpassing 10 μm, guaranteeing consistent and reliable results across multiple tests. This reliability is crucial for ensuring quality control and meeting stringent industry standards.
In conclusion, the Truth Instruments Wafer-MOKE is the ultimate solution for MOKE wafer scanners and thin film magnetic wafer inspection applications. Its advanced features, precision, and efficiency make it a must-have instrument for industries requiring accurate and rapid wafer-level hysteresis loop measurements.