Force Modulation Scanning Atomic Microscope High Resolution Science Microscope 0.04 Nm

Product Description:

The Atomic Force Microscope is a cutting-edge instrument designed for high-resolution imaging and analysis at the nanoscale level. With its advanced capabilities, this microscope offers unparalleled performance in nanotechnology research and development.

One of the key features of the Atomic Force Microscope is its impressive scanning speed range, which allows for precise and efficient imaging from 0.1Hz to 30Hz. This wide range enables users to capture dynamic processes and intricate details with exceptional clarity and accuracy.

When it comes to sample size, the Atomic Force Microscope offers versatility and flexibility, accommodating samples of up to 25 mm in size. This generous sample size capability makes it ideal for a wide range of applications across various industries, from materials science to biological research.

For researchers and scientists who require atomic resolution imaging, the Atomic Force Microscope delivers outstanding results with a remarkable resolution of 0.04 nm. This level of precision allows users to visualize and analyze samples at the atomic scale, providing invaluable insights into the structure and properties of materials.

The scanning range of the Atomic Force Microscope is equally impressive, covering dimensions of 100 μm x 100 μm x 10 μm. This extensive scanning range enables comprehensive imaging of samples with varying sizes and topographies, making it a versatile tool for nanoscale investigations.

Equipped with multiple scanning modes, including contact, tapping, non-contact, lateral force, and force modulation, the Atomic Force Microscope offers flexibility and adaptability to suit different experimental requirements. Whether studying surface interactions, mechanical properties, or electrical characteristics, this microscope provides the necessary tools for in-depth analysis.

In summary, the Atomic Force Microscope is a state-of-the-art instrument that excels in nanoscale imaging and analysis, offering atomic resolution capabilities and advanced scanning features. With its exceptional performance and versatility, this microscope is a valuable asset for researchers and scientists working in diverse fields requiring precise and detailed characterization at the nanoscale level.

Features:

• Product Name: Atomic Force Microscope
• Sample Stage: Motorized XY Stage With 100 μm Resolution
• Scanning Modes:
  • Contact
  • Tapping
  • Non-contact
  • Lateral Force
  • Force Modulation
• Scanning Range: 100 μm X 100 μm X 10μm
• Sample Size: Up To 25 mm
• Scanning Speed: 0.1Hz-30Hz

Technical Parameters:

Applications:

Product Application Occasions and Scenarios for Truth Instruments Atomic Force Microscope AtomEdge Pro:

The Truth Instruments AtomEdge Pro, a Scanning Force Microscope (SFM), is a versatile tool suitable for various applications across different fields. With its advanced features and precision, it is ideal for the following occasions and scenarios:

1. Nanoscale Imaging: The AtomEdge Pro, with a resolution of 0.04 nm, is perfect for high-resolution imaging at the nanoscale level. It can be used in nanotechnology research, material science, and biological applications where detailed imaging is crucial.

2. Multi-Mode Measurement: This SFM offers multiple measurement modes, making it suitable for a wide range of research areas. Whether you need to perform topography, phase imaging, or force spectroscopy, the AtomEdge Pro can handle various measurement techniques efficiently.

3. Material Characterization: Researchers and scientists can use the AtomEdge Pro to analyze surface properties, mechanical characteristics, and material compositions. Its scanning range of 100 μm x 100 μm x 10 μm allows for detailed material characterization with high precision.

4. Quality Control and Inspection: The AtomEdge Pro can be utilized in industrial settings for quality control and inspection purposes. Whether inspecting small components or analyzing surface defects, this SFM provides accurate and reliable data for manufacturing processes.

5. Research and Development: From academia to industry, the AtomEdge Pro is a valuable tool for research and development activities. Its motorized XY stage with 100 μm resolution and scanning speed range of 0.1Hz-30Hz make it efficient for conducting experiments, testing samples, and exploring new technologies.

6. Educational Purposes: The AtomEdge Pro can also be used in educational settings to teach students about nanotechnology, microscopy techniques, and surface analysis. Its user-friendly interface and precise measurements make it an excellent instrument for classroom demonstrations and hands-on learning experiences.

With its origin in China, the Truth Instruments AtomEdge Pro is a reliable and high-performance SFM that caters to a wide range of applications and scenarios, making it a valuable asset in various research, industrial, and educational environments.