Μικροσκόπιο ατομικής δύναμης

Πολυλειτουργικό μικροσκόπιο ατομικής δύναμης

Multi-Functional Atomic Force Microscope Product Model: AtomEdge Pro Product Description: The AtomEdge Pro multi-functional atomic force microscope canperform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. lt features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy,

Μικροσκόπιο Ατομικής Δύναμης Επιπέδου Κουφίδας

Wafer-Level Atomic Force Microscope Product Model: Atommax Product Overview: Using micro-cantilever probe structures, this instrument enables 3D morphology characterization of conductive, semiconductive, and insulating solid materials, achieving wafer-level large-sample morphology characterization. Combined with an optical image, the electrically driven sample positioning stage allows for 1 μm positioning accuracy within a 200 x 200 mm area. with fully automated operations

Ατομικό μικροσκόπιο δύναμης βασικού τύπου

Product Name Basic-type Atomic Force Microscope - AtomExplorer Product Introduction The AtomExplorer Basic-type Atomic Force Microscope delivers sub-nanometer resolution for observing material surface topography and texture. It captures fine structures and minute features on material surfaces across scales from nanometers to micrometers, providing detailed visual information on material, chip and other sample surface topography. This product also integrates Magnetic Force

Πολυλειτουργικό Ατομικό Μικροσκόπιο Δυνάμεων Χαμηλού Θορύβου, Μικροσκόπιο Υλικών με Λειτουργίες MFM, EFM, PFM

Multi Functional Atomic Force Microscope With MFM EFM PFM Modes Product Description: One of the key features of the AFM is its low noise levels in both the Z direction and XY direction, ensuring accurate and reliable measurements. The noise level in the Z direction is an impressive 0.04 nm, providing exceptional sensitivity for capturing subtle surface variations and interactions. In the XY direction, the noise level is maintained at 0.4 nm, further enhancing the precision of

Μικροσκόπιο υψηλής δύναμης σάρωσης 0,15 nm Μικροσκόπιο υψηλής ανάλυσης για κύμα

High Scanning Force Microscope For Wafe Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument used for high-resolution imaging and surface analysis in various fields such as nanotechnology, materials science, and biology. With its advanced capabilities and precise measurements, the AFM is an essential tool for researchers and scientists seeking detailed insights into surface properties at the nanoscale level. One of the key features of the AFM is

Ατομικό μικροσκόπιο δύναμης ενός σε όλα, πολυλειτουργικά βιολογικά μικροσκόπια για ευέλικτη και ακριβή λειτουργία

All In One Atomic Force Microscope For Flexible Precise Operation Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool designed for nanoscale electrical measurement and analysis. This advanced instrument offers unparalleled capabilities in scanning and imaging at the nanoscale level, making it an essential device for researchers and scientists working in various fields. Key Product Attributes: Scanning Range: 100 μm X 100 μm x 10 μm Noise Level in the

Μικροσκόπια Υψηλής Ανάλυσης 0,15 nm Προσαρμοσμένα Ατομικά Μικροσκόπια

Advanced Atomic Force Microscope For High-Resolution Imaging Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-resolution imaging and nanoscale analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM offers atomic resolution imaging capabilities that are essential for a wide range of research applications. Equipped with multiple imaging modes including Contact, Tapping, Non-Contact, Lateral Force, Force Modulation, and

Μικροσκόπιο βιολογικής ατομικής δύναμης υψηλής ακρίβειας μικροσκόπιο ανίχνευσης ανίχνευσης 0.15 nm Ανάλυση

High Precision Scanning Probe Microscope 0.15 nm Resolution Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers exceptional capabilities for nanometer resolution surface analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM product provides precise imaging and measurement of samples with dimensions up to 200 mm. One of the key features of this AFM is its versatility in probe types. Users can choose from a variety of

Μικροσκόπιο Ατομικής Δύναμης υψηλής ανάλυσης 0,04 nm Βιομηχανικό μικροσκόπιο για ανάλυση σε νανοκλίμακα

High-Resolution Atomic Force Microscope For Nanoscale Analysis Product Description: The Atomic Force Microscope (AFM) is a versatile tool for surface analysis, commonly used in various scientific and industrial applications. This cutting-edge device offers exceptional scanning capabilities and precise imaging for detailed analysis of samples. One of the key features of the AFM is its impressive Scanning Speed range, which allows for precise scanning at speeds ranging from 0.1

1 2 3 4 5 › »