AFM Empowers Research Team to Publish Multiple Papers in Top International Journals

Recently, the research team from the Research Institute of Clean Energy and Fuel Chemistry, School of Chemical Engineering at the University of Science and Technology Liaoning has consecutively published a series of latest research findings in the top-tier hydrogen energy journal, International Journal of Hydrogen Energy, and the authoritative interface chemistry journal, Journal of Colloid and Interface Science. The AtomEdge Pro multifunctional Atomic Force Microscope (AFM), independently developed by Truth Instruments, provided crucial nanoscale interface charge dynamics characterization for the aforementioned research. Leveraging its in-situ photo-assisted Kelvin Probe Force Microscopy (KPFM) technology, it has become a core tool for revealing the mechanisms of material performance enhancement.

Screenshot of the publication in the Journal of Colloid and Interface Science

Screenshot of publications in the International Journal of Hydrogen Energy

The instrument model used in the series of papers (Truth Instruments, AtomEdge Pro)

In photoelectrochemical research, the electrochemical reactions triggered by the interaction between light and materials—such as water splitting for hydrogen production and the development of novel solar cells—are highly dependent on the charge behavior at the material's surface and interfaces. The efficiency of charge separation, transport, and recombination directly determines the ultimate performance of the device. KPFM technology offers unique in-situ characterization capabilities in this field, specifically demonstrated in the following aspects:

• Precise Band Structure Characterization: KPFM can accurately measure the work function of photoelectrode materials such as TiO₂, BiVO₄, and perovskites. This allows for the analysis of key parameters like band bending and carrier concentration, providing a theoretical basis for material design and optimization.

• Visualization of Charge Dynamics:

  • Spatial Heterogeneity Analysis: KPFM clearly reveals the potential distribution across different grains, grain boundaries, and defects on the material surface. It identifies "high-efficiency regions" for charge separation and "recombination traps," providing spatial guidance for material modification.

  • Real-time Monitoring under Operando Conditions: By performing in-situ KPFM measurements under illumination, the processes of photogenerated charge generation, separation, and accumulation can be observed in real time. This also enables the quantitative evaluation of photovoltage and its spatial distribution.

AFM topography images and corresponding 3D surface potential projections of the photoanode measured by in-situ photo-assisted KPFM in the dark and under illumination.

• Interfacial Behavior Studies: At heterojunctions or semiconductor-electrolyte interfaces, KPFM can probe the built-in electric field and charge transfer processes. This reveals the energy level alignment and transport mechanisms, offering direct evidence for the design of interface engineering and modification layers.

• In-situ Multi-technique Correlation: KPFM can be synergistically combined with methods like in-situ spectroscopy and theoretical calculations to build a multi-dimensional, multi-scale comprehensive analysis system. For example, during a photoelectrochemical reaction, KPFM tracks surface potential changes in real time, Raman spectroscopy identifies reaction intermediates and adsorbed species, and theoretical calculations simulate charge behavior and reaction pathways at the atomic/electronic level. The synergy of these three techniques achieves a full-chain analysis from macroscopic signals to microscopic structures and theoretical models, greatly enhancing the depth and accuracy of understanding complex reaction mechanisms.

Evaluation of multi-dimensional mechanism analysis and performance combining in-situ Raman spectroscopy with in-situ photo-assisted KPFM experiments.

The in-situ KPFM technology integrated into the AtomEdge Pro not only significantly enhances the observational capability of interfacial charge dynamics but also provides robust data support for the rational design of high-performance photoelectric materials and devices.

AtomEdge Pro Multifunctional Atomic Force Microscope

The AtomEdge Pro can perform 3D scanning imaging of materials, electronic devices, and biological samples, achieving sub-angstrom-level morphological characterization. It features multiple operating modes, including contact, tapping, and non-contact, providing users with more flexible and precise operational choices. Furthermore, it integrates various functional modes such as Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (SKPM), and Piezoresponse Force Microscopy (PFM), offering strong stability and excellent expandability. Additionally, functional modules can be flexibly customized according to user needs, providing targeted solutions for specific research fields and creating a multi-purpose, high-efficiency detection platform.

Truth Instruments' contribution to the publication of high-level papers by the research team at the University of Science and Technology Liaoning in top international journals once again highlights the breakthrough capabilities of domestic high-end scientific research instruments. In the future, Truth Instruments will continue to deepen its technological innovation, offering more flexible modular designs and more stable performance. This will help Chinese research teams unlock more "from 0 to 1" discoveries, making domestic instruments a vital force supporting top-tier global research.