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AFM For Wafe

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September 28, 2025
Category Connection: Atomic Force Microscope
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Tags:
#AFM Microscope #AFM Systems #Scanning Probe Microscope
Brief: Discover the High Scanning Force Microscope for Wafe, a cutting-edge Atomic Force Microscope (AFM) with 0.15 nm resolution. Ideal for nanotechnology, materials science, and biology, this AFM offers versatile imaging modes, precise force sensitivity, and supports samples up to 200 mm x 5200 mm. Perfect for high-resolution surface analysis and nanoscale research.
Related Product Features:
  • High-resolution imaging with 0.15 nm resolution for detailed surface analysis.
  • Versatile imaging modes including Topography, Phase, Friction, and Lateral Force.
  • Exceptional force resolution of 0.15 nN for precise mechanical property measurements.
  • Supports large sample sizes up to 200 mm x 5200 mm for diverse research applications.
  • Multiple scanning modes: Contact, Tapping, and Non-contact for flexible imaging approaches.
  • Advanced software compatibility with Windows for seamless data analysis.
  • Ideal for semiconductor research, materials science, and biological studies.
  • Robust design for reliable performance in high-precision nanoscale imaging.
Faqs:
  • What is the resolution of the High Scanning Force Microscope for Wafe?
    The AFM offers an impressive resolution of 0.15 nm, enabling detailed surface analysis and precise measurements.
  • What imaging modes are available with this AFM?
    The AFM supports multiple imaging modes, including Topography, Phase, Friction, and Lateral Force, for comprehensive surface characterization.
  • What sample sizes can the AFM accommodate?
    The AFM can handle samples up to 200 mm x 5200 mm, making it suitable for a wide range of research applications.
  • What are the scanning modes available with this AFM?
    The AFM offers Contact, Tapping, and Non-contact scanning modes, providing flexibility for different imaging requirements and sample types.
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