Brief: Discover the AtomEdge Pro Multi Functional AFM Atomic Force Microscopy, offering nanometer and atomic resolution for precise 3D scanning of materials, electronic devices, and biological samples. With multiple working modes and integrated functional modules, it provides flexible, stable, and scalable solutions for advanced research.
Related Product Features:
Performs 3D scanning imaging on materials, electronic devices, and biological samples with nanometer precision.
Features multiple working modes including contact, tap, and non-contact for flexible operation.
Integrates functional modes like magnetic force microscopy, electrostatic force microscopy, and piezoelectric force microscopy.
Offers strong stability and good scalability with customizable functional modules.
Supports a scanning range of 100 μm x 100 μm x 10 μm with high resolution up to 4096x4096 pixels.
Low noise levels: 0.4 nm in XY direction and 0.04 nm in Z direction for precise measurements.
Versatile applications in various fields including biology, materials science, and electronics.
Includes advanced scanning modes like phase imaging, lift mode, and multi-directional scanning.
Faqs:
What is the scanning range of the AtomEdge Pro AFM?
The AtomEdge Pro AFM has a scanning range of 100 μm x 100 μm x 10 μm, suitable for a wide variety of sample sizes.
What functional modes does the AtomEdge Pro AFM support?
It supports multiple functional modes including magnetic force microscopy (MFM), electrostatic force microscopy (EFM), scanning Kelvin microscopy (KPFM), and piezoelectric force microscopy (PFM).
Can the AtomEdge Pro AFM be customized for specific research needs?
Yes, the AtomEdge Pro AFM allows flexible customization of functional modules to meet specific research requirements, providing targeted solutions for various fields.