High-Stability AFM With MFM/EFM Modes For Scientific Research

Product Description:

The Basic-type Atomic Force Microscope (AFM) is a versatile and high-performance instrument designed specifically for advanced nano structure analysis in both industrial R&D environments and laboratory settings. Combining precision, flexibility, and ease of use, this AFM model caters to researchers and engineers who require detailed surface characterization at the nanoscale, offering a comprehensive solution for various applications in material science, electronics, biology, and more.

One of the standout features of this Basic-type AFM is its multiple operating modes, which include Tap Mode, Contact Mode, Lift Mode, and Phase Imaging Mode. These diverse modes enable users to obtain high-resolution topographical images as well as detailed information about surface properties, mechanical behavior, and compositional variations. Tap Mode and Contact Mode are ideal for capturing surface morphology with minimal sample damage, while Lift Mode allows for non-contact measurements, reducing potential artifacts. Phase Imaging Mode provides additional contrast based on material properties, making this system highly adaptable for complex sample analysis.

To ensure the longevity of the delicate AFM tips and maintain measurement accuracy, the instrument incorporates advanced Tip Protection Technology through its Safe Needle Insertion Mode. This innovative feature carefully manages the approach of the probe to the sample surface, preventing tip damage and reducing the likelihood of sample contamination. As a result, users benefit from enhanced reliability and reduced operational costs, especially during prolonged or repetitive measurement sessions.

The Basic-type AFM supports a wide range of image sampling points, from as low as 32*32 up to an exceptionally high resolution of 4096*4096. This extensive range allows for both quick scans with lower resolution and highly detailed imaging for in-depth analysis, providing flexibility depending on the application requirements. Whether performing rapid surface assessments or conducting meticulous nano scale investigations, the instrument delivers precise and reproducible data every time.

In addition to standard topographical imaging, this AFM is equipped with multifunctional measurement capabilities that expand its utility significantly. It can be configured to operate as an Electrostatic Force Microscope (EFM), Scanning Kelvin Probe Force Microscope (KPFM), Piezoelectric Force Microscope (PFM), and Magnetic Force Microscope (MFM). These specialized modes enable researchers to probe electrical, piezoelectric, and magnetic properties at the nanoscale, making it an indispensable tool for multidisciplinary research and industrial development projects.

The scanning range of the Basic-type AFM is another critical attribute that makes it suitable for a wide variety of samples and applications. It offers two selectable scanning ranges: 100 μm * 100 μm * 10 μm and 30 μm * 30 μm * 5 μm. This versatility allows users to study both relatively large surface areas and smaller, more detailed regions with exceptional precision. The ample vertical scanning range ensures that samples with significant topographical variation can be accurately characterized without compromising image quality.

Designed with both usability and performance in mind, this Industrial R&D microscope and Laboratory AFM equipment is ideal for researchers focusing on nano structure analysis. Its combination of advanced operating modes, comprehensive multifunctional measurement options, and robust tip protection technology make it a reliable and powerful instrument for cutting-edge nanoscale research. Whether the application involves materials characterization, semiconductor inspection, biomolecular studies, or any other nano-focused investigation, the Basic-type Atomic Force Microscope provides the necessary tools to achieve insightful and high-quality results.

Features:

• Product Name: Basic-type Atomic Force Microscope
• High stability AFM for precise nano structure analysis
• Multifunctional Measurements including Electrostatic Force Microscope (EFM), Scanning Kelvin Probe Microscope (KPFM), Piezoelectric Force Microscope (PFM), and Magnetic Force Microscope (MFM)
• Operating Modes: Tap Mode, Contact Mode, Lift Mode, and Phase Imaging Mode
• XYZ Three-Axis Full-Sample Scanning method for comprehensive surface analysis
• Image Sampling Points range from 32*32 up to 4096*4096 for high-resolution imaging
• Supports samples with size up to Φ 25 mm
• Ideal Industrial R&D microscope for advanced material and surface research

Technical Parameters:

Applications:

The Truth Instruments AtomExplorer Basic-type Atomic Force Microscope (AFM) is a versatile and powerful tool designed for advanced nano structure analysis across various scientific and industrial fields. Originating from China, this state-of-the-art instrument offers a wide range of multifunctional measurements, including Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), and Magnetic Force Microscopy (MFM), making it ideal for comprehensive surface characterization at the nanoscale.

The AtomExplorer AFM is perfectly suited for applications requiring precise nanoscale topography imaging. Its scanning range options of 100 μm * 100 μm * 10 μm and 30 μm * 30 μm * 5 μm allow for detailed surface mapping of diverse materials and samples. With image sampling points ranging from 32*32 up to 4096*4096, users can achieve high-resolution images essential for detailed morphological studies and quantitative analysis.

This product excels in research environments where nano structure analysis is critical. It supports multiple operating modes such as Tap Mode, Contact Mode, Lift Mode, and Phase Imaging Mode, providing flexibility to adapt to different sample types and measurement requirements. The innovative Tip Protection Technology, featuring a Safe Needle Insertion Mode, ensures the longevity and safety of the AFM probe, reducing downtime and maintenance costs.

Magnetic Force Microscopy (MFM) functionality makes the AtomExplorer an excellent choice for investigating magnetic properties at the nanoscale, which is indispensable in materials science, data storage research, and magnetic device development. Additionally, the AFM’s capability to perform piezoelectric and electrostatic force measurements expands its usability to fields like semiconductor research, energy harvesting materials, and nanotechnology development.

Industries such as electronics, biotechnology, materials science, and surface engineering benefit greatly from the AtomExplorer’s precise nanoscale imaging and multifunctional measurement capabilities. Whether for academic research, quality control, or product development, this AFM model offers reliable performance and adaptability.

Pricing for the Truth Instruments AtomExplorer is negotiable; interested customers are encouraged to contact the manufacturer directly for a detailed quote tailored to their specific application needs. This ensures that users receive the optimal configuration and support for their unique nanoscale analysis projects.