AtomExplorer AFM: Integrated MFM, EFM & KFM For Material Analysis

Product Description:

The Basic-type Atomic Force Microscope (AFM) is a cutting-edge instrument designed to deliver exceptional performance and versatility for a wide range of surface analysis applications. Engineered with advanced technology, this AFM microscope offers sub-nanometer resolution AFM capabilities, enabling researchers and engineers to observe and measure surface topography and properties with unparalleled precision. Its outstanding Z-axis noise level of just 0.04 nanometers ensures that even the most subtle surface features can be detected and analyzed accurately, making it an indispensable tool in nanotechnology, materials science, and semiconductor research.

One of the standout features of the Basic-type Atomic Force Microscope is its multifunctional measurement capabilities. It supports a variety of advanced scanning probe techniques, including Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Force Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), and Magnetic Force Microscopy (MFM). These multifunctional measurements allow users to investigate not only the surface morphology but also the electrical, piezoelectric, and magnetic properties of samples with high sensitivity and spatial resolution. This versatility makes the AFM ideal for comprehensive nanoscale characterization across multiple scientific disciplines.

The instrument operates in several modes to accommodate different sample types and measurement needs. It supports Tap Mode, Contact Mode, Lift Mode, and Phase Imaging Mode, providing flexibility for users to choose the optimal scanning approach. Tap Mode helps reduce sample damage and tip wear by intermittently contacting the sample surface, while Contact Mode allows for continuous interaction with the surface, useful for hard samples. Lift Mode is particularly beneficial for magnetic and electric force measurements, and Phase Imaging Mode offers insights into material composition and mechanical properties by detecting phase shifts during scanning.

The Basic-type AFM features an extensive image sampling point range, from a minimum of 32*32 points up to a maximum of 4096*4096 points. This wide range of sampling resolutions enables users to balance between scan speed and image detail according to their specific experimental requirements. Higher sampling points result in more detailed images, revealing intricate surface structures and nanoscale features with exceptional clarity.

To ensure comprehensive surface analysis, the microscope utilizes an XYZ three-axis full-sample scanning method. This scanning technique provides complete three-dimensional movement and positioning of the sample stage, allowing precise control over lateral (X and Y axes) and vertical (Z axis) directions. The three-axis scanning capability facilitates the examination of complex sample geometries and large surface areas, enhancing the versatility and usability of the instrument in diverse research settings.

In summary, the Basic-type Atomic Force Microscope is a powerful and versatile tool that combines sub-nanometer resolution AFM imaging with multifunctional measurement capabilities, including Magnetic Force Microscopy (MFM) and other advanced techniques. Its low noise level, multiple operating modes, high image sampling capability, and XYZ three-axis scanning system make it an ideal choice for researchers seeking high-precision surface characterization. Whether investigating electrical, piezoelectric, magnetic, or topographical properties, this AFM microscope delivers reliable and detailed data, supporting breakthroughs in nanoscience and advanced material research.

Features:

• Product Name: Basic-type Atomic Force Microscope
• Scanning Method: XYZ Three-Axis Full-Sample Scanning for precise nanoscale topography imaging
• Multifunctional Measurements: Includes Electrostatic Force Microscope (EFM), Scanning Kelvin Probe Microscope (KPFM), Piezoelectric Force Microscope (PFM), and Magnetic Force Microscope (MFM) capabilities
• Scanning Range: 100 μm * 100 μm * 10 μm and 30 μm * 30 μm * 5 μm options available
• Z-Axis Noise Level: Ultra-low noise level of 0.04 nm ensures high-resolution imaging
• Operating Modes: Supports Tap Mode, Contact Mode, Lift Mode, and Phase Imaging Mode for versatile AFM Microscope applications
• Designed as a Basic Atomic Force Microscope suitable for detailed nanoscale topography imaging

Technical Parameters:

Applications:

The Truth Instruments AtomExplorer, a Basic-type Atomic Force Microscope (AFM) manufactured in China, is an advanced nanoscale microscope designed to provide detailed surface texture analysis with sub-nanometer resolution AFM capabilities. This versatile instrument is ideal for a wide range of product application occasions and scenarios in both research and industrial environments.

In academic and research laboratories, the AtomExplorer is extensively used for material science studies where precise surface characterization is critical. Its ability to operate in multiple modes—including Tap Mode, Contact Mode, Lift Mode, and Phase Imaging Mode—allows researchers to investigate the physical and chemical properties of various samples with exceptional accuracy. The sub-nanometer resolution AFM ensures that even the smallest surface features can be observed and analyzed, making it indispensable for nanotechnology research, semiconductor inspection, and biomolecular studies.

In the semiconductor industry, the AtomExplorer plays a crucial role in quality control and failure analysis. Its XYZ three-axis full-sample scanning method covers samples up to Φ 25 mm, providing comprehensive surface texture analysis for wafers, thin films, and microelectronic components. The high image sampling points range from 32*32 to 4096*4096, enabling detailed imaging and mapping of nanoscale surface irregularities, which are critical for device performance and reliability.

For industrial applications, the AtomExplorer’s low Z-axis noise level of 0.04 nm ensures stable and precise measurements even in challenging environments. This makes it suitable for use in fields such as coatings, polymers, and nanocomposites, where surface morphology affects product quality. The price is negotiable, allowing businesses to tailor the investment according to their specific needs and scale.

Additionally, the AtomExplorer is an excellent tool for educational purposes, providing students and trainees hands-on experience with cutting-edge AFM technology. Its robust design and ease of operation make it accessible for training in nanoscale surface characterization techniques. Overall, the Truth Instruments AtomExplorer is a reliable, high-performance nanoscale microscope that meets the demands of diverse application scenarios requiring precise surface texture analysis and sub-nanometer resolution AFM imaging.