Master Nanoscale Surface Characterization With AtomExplorer AFM

Product Description:

The Basic-type Atomic Force Microscope (AFM) is a highly versatile and reliable Scanning Probe Microscope designed specifically for laboratories seeking advanced yet user-friendly AFM equipment. This model provides comprehensive capabilities for material surface characterization, enabling researchers and scientists to obtain detailed topographical and mechanical information at the nanoscale with exceptional precision.

One of the standout features of this Basic-type AFM is its multi-mode operating functionality. It supports Tap Mode, Contact Mode, Lift Mode, and Phase Imaging Mode, allowing users to tailor their scanning approach depending on the sample type and the specific surface properties they wish to analyze. Tap Mode is ideal for imaging delicate or soft samples by minimizing lateral forces, while Contact Mode offers direct interaction for robust surface profiling. Lift Mode allows for precise measurement of long-range forces and surface potentials, and Phase Imaging Mode provides detailed contrast based on material properties such as adhesion, stiffness, and viscoelasticity. This range of operating modes makes the Basic-type AFM a powerful tool for comprehensive material surface characterization.

The scanning method employed by this microscope is an XYZ three-axis full-sample scanning system. This ensures accurate and stable movement in all three spatial dimensions, allowing for extensive coverage and detailed imaging of samples up to a size of Φ 25 mm. The full-sample scanning capability ensures that researchers can examine large areas of material surfaces without compromising on resolution or data quality, which is crucial for applications requiring both macro- and nanoscale insights.

Image resolution and quality are critical in atomic force microscopy, and the Basic-type AFM excels in this area as well. It supports an impressive range of image sampling points from 32*32 up to 4096*4096 pixels, granting users the flexibility to balance between scanning speed and image detail. This high pixel density enables the capture of intricate surface features and fine structural details that are essential for thorough material analysis and research applications.

Another notable specification of this laboratory AFM equipment is its exceptional Z-axis noise level, which is as low as 0.04 nanometers. This ultra-low noise floor ensures highly stable and accurate height measurements, minimizing interference and artifacts that can obscure true surface features. Such precision is vital when characterizing materials at the atomic or molecular scale, where even minute fluctuations can significantly impact data interpretation.

With its robust design, advanced scanning capabilities, and versatile operating modes, the Basic-type Atomic Force Microscope stands out as an indispensable tool for laboratories engaged in cutting-edge material research. Whether used for studying polymers, metals, semiconductors, biological samples, or nanostructured materials, this AFM provides reliable and detailed insights into the surface morphology, mechanical properties, and phase distribution of a wide range of materials.

In summary, the Basic-type Atomic Force Microscope combines sophisticated technology with ease of use to deliver precise and comprehensive material surface characterization. Its support for multiple operating modes including Tap Mode, Contact Mode, Lift Mode, and Phase Imaging Mode, coupled with an XYZ three-axis full-sample scanning system and a wide range of image sampling points, makes it an essential piece of laboratory AFM equipment. The low Z-axis noise level of 0.04 nm further enhances its capability to provide high-quality, reproducible data, while accommodating samples up to Φ 25 mm in size ensures flexibility for various research needs. This AFM model is an excellent choice for scientists aiming to advance their understanding of material surfaces through detailed nanoscale imaging and analysis.

Features:

• Product Name: Basic-type Atomic Force Microscope
• Operating Modes: Tap Mode, Contact Mode, Lift Mode, Phase Imaging Mode
• Z-Axis Noise Level: 0.04 Nm for precise measurements
• Scanning Range: 100 μm * 100 μm * 10 μm / 30 μm * 30 μm * 5 μm suitable for various sample sizes
• Multifunctional Measurements including Electrostatic Force Microscope (EFM), Scanning Kelvin Microscope (KPFM), Piezoelectric Force Microscope (PFM), Magnetic Force Microscope (MFM)
• Image Sampling Points: Adjustable from 32 * 32 up to 4096 * 4096 for high-resolution imaging
• Ideal for material surface characterization and nanoscale topography imaging
• Advanced AFM Microscope designed for versatile research applications

Technical Parameters:

Applications:

The Truth Instruments AtomExplorer Basic-type Atomic Force Microscope (AFM) is a versatile and reliable laboratory AFM equipment designed to meet the diverse needs of nanoscale research and material characterization. Originating from China, this state-of-the-art instrument offers a wide range of functionalities, making it an essential tool for scientific laboratories, research institutions, and industrial R&D centers focused on surface analysis and nanoscale topography imaging.

One of the primary application occasions for the AtomExplorer is in the detailed study of surface morphology at the nanoscale. Its capability to capture high-resolution images with image sampling points ranging from 32*32 to 4096*4096 allows researchers to investigate surface features with exceptional clarity. This makes it invaluable in fields such as materials science, semiconductor research, and nanotechnology, where understanding surface structure is critical.

The AtomExplorer operates in multiple modes including Tap Mode, Contact Mode, Lift Mode, and Phase Imaging Mode, providing flexibility to analyze a wide variety of samples. Its low Z-axis noise level of 0.04 nm ensures precise and accurate measurements, which is crucial when working at the atomic scale. The sample size accommodation of up to Φ 25 mm further broadens the range of materials and devices that can be examined.

Moreover, the AtomExplorer supports multifunctional measurements such as Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Force Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), and Magnetic Force Microscopy (MFM). Among these, Kelvin Probe Force Microscopy is particularly significant for studying surface potential and work function variations, which is essential in semiconductor device fabrication, corrosion studies, and organic electronics.

This AFM system is ideal for laboratories aiming to expand their capabilities in nanoscale imaging and surface characterization without compromising on precision or versatility. Price is negotiable, and interested customers are encouraged to contact Truth Instruments for a detailed quote tailored to their specific research requirements. The AtomExplorer stands out as a cost-effective yet powerful solution for advancing nanoscale science and technology.