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rf probe station

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  • 확장 가능한 연구 및 개발을 위한 프로그래밍 가능한 RF 정밀 탐사 역

    Programmable Probe Station For Expandable Research And Development Product Description: The 1D In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for precise and efficient testing of DC and RF devices. This versatile probe station offers a wide range of features and capabilities to meet the demands of modern research and development applications. One of the key features of this magnetic probe station is its optical magnification range, which spans from 0
  • 고 정밀 RF 프로브 스테이션 50 MT 수동 웨이퍼 프로버

    Wafer Prober For High Precision Magnetoresistance And RF Testing Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge product designed for RH Testing, offering precise and efficient testing functions for various applications. This advanced probe station is equipped with PID Closed-loop Feedback Regulation for Magnetic Field Resolution, providing an impressive resolution of 0.05 MT for accurate measurements. One of the key
  • 정밀 장치 테스트를 위해 평면 자기 탐사 스테이션 다재다능 DC 탐사 스테이션

    In Plane Magnetic Probe Station For Precision Device Testing Product Description: The 1D In-Plane Magnetic Field Probe Station is a versatile and advanced tool designed for precise measurements of magnetic fields in a variety of research and industrial applications. Equipped with a range of source meters including the SR830, N5173B, Keithley 6221, and Keithley 2182A, this probe station offers unparalleled flexibility and compatibility with different experimental setups. One
  • 변동 온도 테스트를 위한 자기장 탐사역 0.05 MT 탐사역

    Probe Station For Variable Temperature And Magnetic Field Testing Product Description: The 1D In-Plane Magnetic Field Probe Station is a sophisticated tool designed for precise magnetoresistance measurement in research and testing applications. This magnetic probe station is equipped with advanced features to ensure accurate and reliable data collection, making it an essential instrument for researchers and scientists working in the field of magnetoresistance measurement. The
  • 0.05 MT 자기장 프로브 스테이션 정밀 반도체 프로버 (스핀트로닉스 및 반도체 테스트용)

    Magnetic Probe Station For Spintronics And Semiconductor Testing Product Description: The 1D In-Plane Magnetic Field Probe Station is a cutting-edge device designed for precise and efficient characterization of spintronic devices. This advanced probe station offers a myriad of features and capabilities that make it an indispensable tool for researchers and engineers working in the field of spintronics. The probe station is equipped with 4 groups of DC probes, 1 group of RF
  • 1D 평면 반도체 탐사 기지 자기장 탐사 기지

    1D In-Plane Magnetic Field Probe Station Product Introduction The magnetic field probe station is primarily used for testing the electrical and magnetic properties of semiconductor materials, micro/nano devices, magnetic materials, and spintronic devices and related technologies. It can provide a magnetic field or variable temperature environment and perform high-precision DC/RF measurements. Our company designs and manufactures various magnetic field probe stations, which
  • 50 MT 자기 탐사 역 RH 테스트 웨이퍼 자기 필름 측정용 탐사 역

    Cost Effective Wafer Probe Station For Magnetic Film Measurement Product Description: Introducing the Wafer-Level Manual In-Plane Magnetic Field Probe Station, a cutting-edge solution for wafer-level electrical measurement with a focus on RH Testing. This innovative probe station is designed to provide precise testing functions for in-plane magnetic fields with a magnetic field resolution of PID Closed-loop Feedback Regulation and an impressive resolution of 0.05 MT. One of
  • 2D 평면 수직 자기 프로브 스테이션 고정밀 광학 프로브 스테이션

    2D In Plane-Vertical Magnetic Probe Station Product Introduction The 2D magnetic field probe station PS2DY-MS is a high-precision device specifically developed for room-temperature variable magnetic field electrical testing environments. It supports both in-plane and vertical magnetic field directions, providing a uniform magnetic field environment. Combined with testing source meters and flexible probe configurations, it can perform non-destructive standard tests such as