중국의 비디오 채널 Truth Instruments Co., Ltd.
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Atomic Force Microscope

다른 화면
September 10, 2025
카테고리 연결: 원자력 현미경
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태그:
#AFM 현미경 #AFM 시스템 #스캔 탐사 현미경
개요: Discover the Advanced Atomic Force Microscope, a cutting-edge tool for high-resolution imaging and nanoscale analysis. With atomic resolution and versatile imaging modes, this AFM is perfect for research in material science, biotechnology, and nanotechnology. Explore its features and applications today!
관련 제품 특징:
  • Atomic resolution imaging with 0.15 nm precision for detailed nanoscale analysis.
  • Versatile imaging modes including Contact, Tapping, Non-Contact, Lateral Force, Force Modulation, and Phase Imaging.
  • Accommodates sample sizes up to 200 mm for flexible research applications.
  • Scanning range of 100 μm x 100 μm x 10 μm for comprehensive sample imaging.
  • Multiple probe types including Silicon, Diamond, Gold, Platinum, and Carbon Nanotube for tailored experiments.
  • Scanning angle range of 0-360° for precise control and multi-angle imaging.
  • Ideal for material science, biotechnology, nanotechnology, pharmaceuticals, and surface chemistry.
  • High-resolution imaging capabilities for studying biological samples, polymers, thin films, and nanomaterials.
질문과대답:
  • What imaging modes does the Advanced Atomic Force Microscope support?
    The AFM supports Contact, Tapping, Non-Contact, Lateral Force, Force Modulation, and Phase Imaging modes for versatile sample analysis.
  • What is the maximum sample size the Atomic Force Microscope can accommodate?
    The AFM can handle sample sizes up to 200 mm, making it suitable for a wide range of research applications.
  • What types of probes are compatible with this Atomic Force Microscope?
    The AFM supports various probe types, including Silicon, Diamond, Gold, Platinum, and Carbon Nanotube, allowing for customized experiments based on sample requirements.
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