Advanced AFM With Multiple Modes For Nanoscale Characterization Product Description: The Atomic Force Microscope is a cutting-edge instrument designed for high-precision surface analysis and nanoscale characterization. With a noise level in the Z direction of 0.04 Nm, this microscope offers exceptional sensitivity and accuracy in capturing surface details. One of the key features of this product is its generous sample size capacity of 25 mm, allowing for the examination of a

Manual Wafer Probe Station With 360 Rotation For Lab Research Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for research and development (R&D) in the field of magnetic field analysis. This innovative probe station offers precise control and accurate measurements for studying in-plane magnetic fields with ease and efficiency. One of the key features of this probe station is its optical magnification capabiliti

Manual In Plane Probe Station For Wafer Level Magnetic Testing Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for precise and efficient magnetoresistance testing in research and development settings. With a magnetic field strength of 50 MT, this probe station provides reliable and accurate measurements for a wide range of applications. Equipped with PID closed-loop feedback regulation, the magnetic field

Tri Temp Magnetic Chip Tester For High Reliability Verification Product Description: Introducing the Magnetic Chip Final Test Machine, a cutting-edge product designed for non-destructive testing in the semiconductor industry. This advanced MRAM tester is equipped with state-of-the-art features to ensure accurate and reliable testing results. The Electric Displacement Stage Module of the Magnetic Chip Final Test Machine offers precise control with a θ-axis Adjustment Range of

Cost Effective Cryo Probe Station For Automated Electrical Testing Product Description: The Cryogenic Probe Station is an essential tool for cryogenic device characterization, providing a cost-effective solution for researchers and engineers in various industries. This closed-cycle probe station offers precise control and stability for conducting experiments at low temperatures. Key Features: Vacuum: The Cryogenic Probe Station boasts a low-temperature vacuum level of

Superconducting Magnet Probe Station For Hall And SOT Testing Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge product designed for precise and efficient testing of semiconductor devices and spintronic devices. Equipped with standard 4 probe arms, this probe station can support up to 8 probe arms, providing flexibility and scalability for various testing needs. Featuring X-Y-Z probe arm stroke dimensions of 50 mm, 25

Cryo Prober For Spintronics 2D Materials And Superconductors Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge product that offers advanced capabilities for precise measurements in various research and testing applications. This state-of-the-art system comes equipped with a standard configuration of 4 probe arms, with the flexibility to support up to 8 probe arms, allowing for versatile testing setups. One of the

Vertical Field Cryo Probe Station For Low Temperature Testing Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge system designed for precise research and testing in the field of strong magnetic fields. This innovative product features a superconducting magnet that generates a powerful vertical magnetic field with a strength of up to ±3 T, making it ideal for a wide range of applications requiring high magnetic field