Found
31
products for "high resolution microscope
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저온 고장 레이저 케어 현미경 마이크로 영역 이미지 현미경
Low Temp High Field Laser Kerr Microscope For Micro Region Imaging Product Description: The Cryogenic High-Magnetic-Field Laser Kerr Microimaging System is a cutting-edge research tool designed for low temperature magneto-optics studies, offering high-resolution imaging capabilities for precise analysis of magnetic materials. With an impressive optical resolution of 450 Nm, this system provides researchers with detailed images of samples at the nanoscale level, allowing for -
높은 안정성 AFM 현미경 0.1 Hz - 30 Hz 재료 생물학 및 전자 영상 촬영용 AFM 시스템
High Stability AFM For Materials Biology And Electronics Imaging Product Description: The Atomic Force Microscope is a cutting-edge scientific instrument that offers high-resolution imaging and precise measurements for a wide range of applications in nanotechnology, material science, and biological research. This advanced microscope utilizes XYZ Three-axis Full Sample Scanning method, allowing for detailed analysis of samples with exceptional accuracy. One of the key features -
극저온 MOKE 커 효과 현미경 히스테리시스 루프 측정 장비 (2차원 강자성체 분석용)
Cryogenic Kerr Microscope For 2D Ferromagnetic Material Analysis Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool designed to provide high sensitivity and precise measurement capabilities for magnetic domain imaging and magnetization measurement in scientific research applications. Key features of this instrument include: Kerr Angle Resolution: Achieving a remarkable 0.3 Mdeg (RMS) Kerr angle resolution, ensuring -
모든 것 하나에 원자력 현미경 다기능 생물학 현미경 유연한 정밀 작동
All In One Atomic Force Microscope For Flexible Precise Operation Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool designed for nanoscale electrical measurement and analysis. This advanced instrument offers unparalleled capabilities in scanning and imaging at the nanoscale level, making it an essential device for researchers and scientists working in various fields. Key Product Attributes: Scanning Range: 100 μm X 100 μm x 10 μm Noise Level in the -
정밀 커 현미경 극저온 MOKE 시스템, 스핀트로닉 재료 자화 영상화
Cryo MOKE System For Magnetization Imaging Of Spintronic Materials Product Description: The Cryogenic High-Magnetic-Field Laser Kerr Microimaging System is a cutting-edge instrument designed for researchers and scientists working with low temperature Kerr microscopy applications. This advanced system offers exceptional temperature stability with a range of ±50 mK, ensuring precise and reliable measurements even in demanding experimental conditions. Featuring a high Kerr angle -
고 민감성 MOKE 시스템 히스테레시 루프 측정 도구 약 자석성 및 2차원 물질 연구
High Sensitivity MOKE for Weak Magnetism and 2D Material Study Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool specifically designed for the characterization of weak magnetic materials. This advanced system offers unparalleled Magnetic Field Resolution through PID Closed-loop Feedback Regulation, with an impressive resolution of 0.02 MT. This level of precision enables researchers to explore the intricate magnetic -
고 민감성 케어 현미경 다기능 모케 현미경 자석 얇은 필름
High Sensitivity Kerr Microscope For Magnetic Thin Films Product Description: The Multifunctional Spin-Test Magneto-Optic Kerr Microscope is a cutting-edge instrument designed for advanced research in the field of spintronics. This state-of-the-art MOKE microscope offers automated measurements and precise analysis capabilities, making it an essential tool for researchers working with spintronic devices. Equipped with an Electrical Source Meter, specifically the Keithley 6221 -
스핀 테스트 마그네토 광학 커 현미경 다기능 연구 현미경 재료 분석용
Material Analysis With Multifunctional SpinTest MagnetoOptic Kerr Microscope Product Description: The Multifunctional Spin-Test Magneto-Optic Kerr Microscope is a cutting-edge instrument designed for researchers and professionals in the field of spintronic devices. This advanced microscope offers unparalleled capabilities for studying magnetic thin films with exceptional precision and detail. One of the key features of this microscope is its Magnetic Field Resolution, which -
00.04nm 원자력 현미경 0.1Hz - 30Hz AFM 현미경 정밀 나노 스케일 표면 분석
Atomic Force Microscope For Precise Nanoscale Surface Analysis Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers multi-mode measurement capabilities for surface analysis at the atomic resolution level. This advanced microscope allows for detailed examination of samples with a size of up to 25 mm, providing researchers with invaluable insights into various materials and structures. One of the key features of the Atomic Force