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high resolution microscope

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  • Microscope Kerr à laser à champ élevé et basse température pour l'imagerie de micro-régions

    Low Temp High Field Laser Kerr Microscope For Micro Region Imaging Product Description: The Cryogenic High-Magnetic-Field Laser Kerr Microimaging System is a cutting-edge research tool designed for low temperature magneto-optics studies, offering high-resolution imaging capabilities for precise analysis of magnetic materials. With an impressive optical resolution of 450 Nm, this system provides researchers with detailed images of samples at the nanoscale level, allowing for
  • Microscope AFM à haute stabilité 0,1 Hz - 30 Hz Systèmes AFM pour les matériaux Biologie et électronique d'imagerie

    High Stability AFM For Materials Biology And Electronics Imaging Product Description: The Atomic Force Microscope is a cutting-edge scientific instrument that offers high-resolution imaging and precise measurements for a wide range of applications in nanotechnology, material science, and biological research. This advanced microscope utilizes XYZ Three-axis Full Sample Scanning method, allowing for detailed analysis of samples with exceptional accuracy. One of the key features
  • Microscope cryogénique MOKE Kerr Instrument de mesure de la boucle d'hystérésis pour l'analyse des matériaux ferromagnétiques 2D

    Cryogenic Kerr Microscope For 2D Ferromagnetic Material Analysis Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool designed to provide high sensitivity and precise measurement capabilities for magnetic domain imaging and magnetization measurement in scientific research applications. Key features of this instrument include: Kerr Angle Resolution: Achieving a remarkable 0.3 Mdeg (RMS) Kerr angle resolution, ensuring
  • Microscopes à force atomique tout-en-un multifonctionnels pour la biologie, pour une opération précise et flexible

    All In One Atomic Force Microscope For Flexible Precise Operation Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool designed for nanoscale electrical measurement and analysis. This advanced instrument offers unparalleled capabilities in scanning and imaging at the nanoscale level, making it an essential device for researchers and scientists working in various fields. Key Product Attributes: Scanning Range: 100 μm X 100 μm x 10 μm Noise Level in the
  • Microscope Kerr de précision Système Cryo MOKE pour l' imagerie par magnétisation des matériaux spintronics

    Cryo MOKE System For Magnetization Imaging Of Spintronic Materials Product Description: The Cryogenic High-Magnetic-Field Laser Kerr Microimaging System is a cutting-edge instrument designed for researchers and scientists working with low temperature Kerr microscopy applications. This advanced system offers exceptional temperature stability with a range of ±50 mK, ensuring precise and reliable measurements even in demanding experimental conditions. Featuring a high Kerr angle
  • Système MOKE haute sensibilité - Instrument de mesure de boucle d'hystérésis pour l'étude du magnétisme faible et des matériaux 2D

    High Sensitivity MOKE for Weak Magnetism and 2D Material Study Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool specifically designed for the characterization of weak magnetic materials. This advanced system offers unparalleled Magnetic Field Resolution through PID Closed-loop Feedback Regulation, with an impressive resolution of 0.02 MT. This level of precision enables researchers to explore the intricate magnetic
  • Microscope Kerr à haute sensibilité, microscope MOKE multifonctionnel pour films minces magnétiques

    High Sensitivity Kerr Microscope For Magnetic Thin Films Product Description: The Multifunctional Spin-Test Magneto-Optic Kerr Microscope is a cutting-edge instrument designed for advanced research in the field of spintronics. This state-of-the-art MOKE microscope offers automated measurements and precise analysis capabilities, making it an essential tool for researchers working with spintronic devices. Equipped with an Electrical Source Meter, specifically the Keithley 6221
  • Microscope de recherche multifonctionnel pour l'analyse des matériaux

    Material Analysis With Multifunctional SpinTest MagnetoOptic Kerr Microscope Product Description: The Multifunctional Spin-Test Magneto-Optic Kerr Microscope is a cutting-edge instrument designed for researchers and professionals in the field of spintronic devices. This advanced microscope offers unparalleled capabilities for studying magnetic thin films with exceptional precision and detail. One of the key features of this microscope is its Magnetic Field Resolution, which
  • 0.04nm Microscope de force atomique 0.1Hz - 30Hz Microscope AFM pour l'analyse de surface à l'échelle nanométrique précise

    Atomic Force Microscope For Precise Nanoscale Surface Analysis Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers multi-mode measurement capabilities for surface analysis at the atomic resolution level. This advanced microscope allows for detailed examination of samples with a size of up to 25 mm, providing researchers with invaluable insights into various materials and structures. One of the key features of the Atomic Force