High-Vacuum 4K Probe: 0-67GHz, 4-8 Arms & Cost-Effective Electrical Characterization

Product Description:

The Cryogenic Probe Station is an advanced and versatile instrument designed for precise cryogenic electrical characterization (I-V/C-V) measurements. It is engineered to meet the demanding requirements of researchers and engineers working with low-temperature semiconductor devices, quantum materials, and other cryogenic applications. This probe station offers exceptional performance, combining flexibility, accuracy, and reliability to facilitate comprehensive electrical testing at temperatures ranging from 4 K to 420 K.

One of the key features of this cryogenic probe station is its sample holder options, which include Ground, Coaxial, and Triaxial configurations. These options allow users to customize the setup according to their specific measurement needs, ensuring optimal signal integrity and noise reduction. The availability of different sample holder types makes it suitable for a wide range of devices and experimental setups, enabling researchers to achieve high-quality data with minimal interference.

Temperature stability and control are critical in cryogenic electrical characterization, and this probe station excels in this area. The thermal anchor design ensures that the temperature difference between the probe holder and the sample stage remains below 10 K. This tight thermal coupling minimizes thermal gradients and helps maintain uniform temperature conditions across the sample during measurements. Such precise thermal management is essential for obtaining reliable and reproducible I-V and C-V data at cryogenic temperatures.

The sample temperature range of 4 K to 420 K covers most cryogenic and near-room-temperature applications. This broad range provides researchers with the flexibility to study materials and devices under various thermal conditions, from deep cryogenic environments to elevated temperatures. The ability to perform electrical characterization over this extensive temperature window is invaluable for understanding temperature-dependent electrical properties and device behavior.

The Cryogenic Probe Station comes standard with four probe arms, allowing simultaneous multi-point measurements on a single sample. For more complex experiments requiring additional probing points, the system supports up to eight probe arms. This scalability enhances the station’s utility for advanced device characterization, including multi-terminal measurements and complex circuit testing. The precision and stability of the probe arms ensure accurate contact with the sample, reducing measurement errors and improving data quality.

High-frequency electrical measurements are supported by the station’s microwave probing capabilities. It can accommodate microwave probes operating from 0 to 40 GHz using K-type connectors, and from 0 to 67 GHz with 1.85 mm connectors. This wide frequency range enables comprehensive electrical characterization of high-speed and microwave devices under cryogenic conditions. The integration of microwave probe options makes the system highly versatile, catering to cutting-edge research in RF and microwave electronics.

Additionally, the Cryogenic Probe Station is known for its low-leakage current performance, with leakage currents below 100 fA at 1 V. This ultra-low leakage characteristic is crucial for sensitive electrical measurements, particularly in cryogenic environments where noise and leakage currents can severely impact data accuracy. The station’s design emphasizes minimizing leakage and noise, enabling reliable I-V and C-V characterization even for devices with extremely low current levels.

In summary, the Cryogenic Probe Station is a state-of-the-art tool that combines flexibility, precision, and advanced features to support comprehensive cryogenic electrical characterization (I-V/C-V) experiments. Its multiple sample holder options, excellent thermal management with a thermal anchor maintaining less than 10 K temperature difference between probe holder and sample stage, and broad operational temperature range from 4 K to 420 K make it ideal for diverse research applications. The standard four probe arms, expandable up to eight, alongside high-frequency microwave probing capabilities up to 67 GHz, provide unmatched versatility. Furthermore, its low-leakage current performance ensures high-fidelity measurements essential for cutting-edge cryogenic research. This probe station stands out as an indispensable instrument for scientists and engineers seeking reliable and precise electrical characterization at cryogenic temperatures.

Features:

• Product Name: Cryogenic Probe Station
• Probe Arm Stroke: X-Y-Z, 50 mm - 25 mm - 25 mm
• Electrical Leakage Current: Less than 100 fA at 1V, ensuring accurate measurements
• Optical Microscope: 0.75* to 3.75* continuous zoom for precise sample observation
• Temperature Stability: ±<1.20 mK in the range of 4 K to 420 K for reliable cryogenic testing
• Vibration: Sample stage vibration less than 1 μm peak-to-peak, minimizing measurement noise
• Supports cryogenic electrical characterization (I-V/C-V) probe station applications
• Model: PS-Cryo 4K cryogenic probe station designed for advanced low-temperature testing
• Low-leakage current (<100fA@1V) cryogenic probe station for high precision electrical measurements

Technical Parameters:

Applications:

The Truth Instruments PS-Cryo cryogenic probe station is a highly specialized tool designed for advanced research and development applications requiring precise electrical measurements at extremely low temperatures. Originating from China, this state-of-the-art probe station is ideal for scenarios involving 2-inch sample 4K-420K cryogenic probe station testing, offering a versatile temperature range from 4 K to 420 K. Its ability to maintain a low-temperature vacuum environment of less than 1.2E-3Pa ensures minimal interference from atmospheric particles, making it perfect for sensitive experiments in condensed matter physics, semiconductor device characterization, and quantum computing research.

The PS-Cryo model features a sample holder that accommodates samples up to 51 mm in diameter, allowing for the testing of a variety of 2-inch samples with ease. Researchers and engineers can benefit from the precise X-Y-Z probe arm stroke capabilities of 50 mm, 25 mm, and 25 mm respectively, facilitating accurate positioning and probing of microelectronic devices and novel materials. This flexibility is essential in scenarios where minute adjustments are critical for obtaining reliable data at cryogenic temperatures.

In applications where vibration control is paramount, the PS-Cryo excels as a low-vibration high-vacuum cryogenic probe station. This attribute is particularly important in experiments such as superconductivity measurements, Hall effect testing, and nanoelectronics, where external vibrations can compromise measurement integrity. The station’s robust design minimizes mechanical disturbances, ensuring stable and reproducible results.

The PS-Cryo is also well-suited for industrial and academic laboratories focusing on developing next-generation electronic components, including two-dimensional materials, spintronic devices, and advanced sensors. Its wide temperature range supports studies of temperature-dependent electrical properties, phase transitions, and other phenomena critical to material science and device engineering.

Overall, the Truth Instruments PS-Cryo 2-inch sample 4K-420K cryogenic probe station offers unparalleled precision, versatility, and reliability in low-temperature electrical characterization. Whether in fundamental research or applied technology development, this cryogenic probe station provides an indispensable platform for exploring the frontiers of low-temperature physics and electronics.