Cryo MOKE System For Magnetization Imaging Of Spintronic Materials Product Description: The Cryogenic High-Magnetic-Field Laser Kerr Microimaging System is a cutting-edge instrument designed for researchers and scientists working with low temperature Kerr microscopy applications. This advanced system offers exceptional temperature stability with a range of ±50 mK, ensuring precise and reliable measurements even in demanding experimental conditions. Featuring a high Kerr angle

High Sensitivity MOKE for Weak Magnetism and 2D Material Study Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool specifically designed for the characterization of weak magnetic materials. This advanced system offers unparalleled Magnetic Field Resolution through PID Closed-loop Feedback Regulation, with an impressive resolution of 0.02 MT. This level of precision enables researchers to explore the intricate magnetic

Material Analysis With Multifunctional SpinTest MagnetoOptic Kerr Microscope Product Description: The Multifunctional Spin-Test Magneto-Optic Kerr Microscope is a cutting-edge instrument designed for researchers and professionals in the field of spintronic devices. This advanced microscope offers unparalleled capabilities for studying magnetic thin films with exceptional precision and detail. One of the key features of this microscope is its Magnetic Field Resolution, which

High Sensitivity Kerr Microscope For Magnetic Thin Films Product Description: The Multifunctional Spin-Test Magneto-Optic Kerr Microscope is a cutting-edge instrument designed for advanced research in the field of spintronics. This state-of-the-art MOKE microscope offers automated measurements and precise analysis capabilities, making it an essential tool for researchers working with spintronic devices. Equipped with an Electrical Source Meter, specifically the Keithley 6221

Atomic Force Microscope For Precise Nanoscale Surface Analysis Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers multi-mode measurement capabilities for surface analysis at the atomic resolution level. This advanced microscope allows for detailed examination of samples with a size of up to 25 mm, providing researchers with invaluable insights into various materials and structures. One of the key features of the Atomic Force

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument designed for high-precision surface analysis and nanoscale electrical measurement. Renowned for its versatility and advanced functionality, this AFM offers a comprehensive suite of features that make it an indispensable tool in both research and industrial applications. With a scanning rate adjustable between 0.1 and 30 Hz, users can tailor the imaging speed to suit a wide range of sample

Customizable AFM System with Strong Scalability for Your Research Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-precision imaging and analysis in various scientific and industrial applications. With its advanced technology and superior performance, this instrument offers unparalleled capabilities for researchers and engineers working in fields such as nanotechnology, materials science, and semiconductor research. One of the key

High Sensitivity MOKE For Weak Magnetism And 2D Material Study Product Description: With a variable temperature range spanning from 4.2 K to 420 K, researchers have the flexibility to study a wide range of materials under different thermal conditions. This broad temperature range is ideal for investigating the properties of weak magnetic materials at low temperatures, providing valuable insights into their behavior and magnetic responses. One of the key features of this

Product Introduction Designed for in-depth research on permanent magnet materials, this advanced precision testing instrument enables high-resolution precise measurement and detailed observation of longitudinal, transverse, and vertical magneto-optical Kerr effects under stringent testing conditions (strong magnetic fields, ambient temperature, high temperatures). To ensure sample stability during testing under strong magnetic forces, it features an air-floating displacement