Σταθμός μαγνητικού ανιχνευτή

Σε επίπεδο και κατακόρυφο μαγνητικό σταθμό ανίχνευσης 140 MT Wafer Prober για προηγμένες δοκιμές

In Plane And Vertical Magnetic Probe Station For Advanced Testing Product Description: The 2D In Plane-Vertical Magnetic Probe Station is a versatile tool designed for precise measurements and analysis in various applications such as electrical flipping measurement and wafer testing. This product features an adjustable air gap ranging from 0 to 40 mm, allowing flexibility in experimental setups and accommodating different sample sizes. With a Vertical Magnetic Field Strength

Αναβαθμίσιμος Σταθμός Διερεύνησης 2D για Αισθητήρες Μαγνητικού Πεδίου για Έρευνα Ακριβείας και Παραγωγή

Upgradeable 2D Probe Station For Precision Research And Production Product Description: The 2D In Plane-Vertical Magnetic Probe Station is a cutting-edge product designed for precise measurements and analysis of magnetic fields in various applications. This advanced probe station allows for detailed examination of 2D vector fields, making it an ideal tool for researchers and professionals working in fields such as second harmonic testing and spintronics. Key Features: Air Gap

Ευέλικτοι Σταθμοί Δοκιμών Μαγνητικών Ανιχνευτών σε Επίπεδο Wafer, Χειροκίνητοι Σταθμοί Ανίχνευσης για Μαγνητικές Δοκιμές

Manual In Plane Probe Station For Wafer Level Magnetic Testing Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for precise and efficient magnetoresistance testing in research and development settings. With a magnetic field strength of 50 MT, this probe station provides reliable and accurate measurements for a wide range of applications. Equipped with PID closed-loop feedback regulation, the magnetic field

Σταθμός Δοκιμής RF Υψηλής Ακρίβειας 50 MT Manual Wafer Prober Για Μαγνητοαντίσταση

Wafer Prober For High Precision Magnetoresistance And RF Testing Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge product designed for RH Testing, offering precise and efficient testing functions for various applications. This advanced probe station is equipped with PID Closed-loop Feedback Regulation for Magnetic Field Resolution, providing an impressive resolution of 0.05 MT for accurate measurements. One of the key

Σταθμός Δοκιμών Μαγνητικής Ανιχνεύσεως 50 MT RH για Μέτρηση Μαγνητικών Μεμβρανών

Cost Effective Wafer Probe Station For Magnetic Film Measurement Product Description: Introducing the Wafer-Level Manual In-Plane Magnetic Field Probe Station, a cutting-edge solution for wafer-level electrical measurement with a focus on RH Testing. This innovative probe station is designed to provide precise testing functions for in-plane magnetic fields with a magnetic field resolution of PID Closed-loop Feedback Regulation and an impressive resolution of 0.05 MT. One of

Εγχειρίδιο Εργαστηρίου Σταθμού Δοκιμής Wafer Σταθμός Δοκιμής Μαγνητικού Πεδίου Με Περιστροφή 360

Manual Wafer Probe Station With 360 Rotation For Lab Research Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for research and development (R&D) in the field of magnetic field analysis. This innovative probe station offers precise control and accurate measurements for studying in-plane magnetic fields with ease and efficiency. One of the key features of this probe station is its optical magnification capabiliti

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