磁気プローブステーション

平面および垂直磁気プローブステーション 140 MT ウェーハプローバー高度なテスト用

In Plane And Vertical Magnetic Probe Station For Advanced Testing Product Description: The 2D In Plane-Vertical Magnetic Probe Station is a versatile tool designed for precise measurements and analysis in various applications such as electrical flipping measurement and wafer testing. This product features an adjustable air gap ranging from 0 to 40 mm, allowing flexibility in experimental setups and accommodating different sample sizes. With a Vertical Magnetic Field Strength

アップグレード可能な2Dプローブステーション磁場プローブステーション精密研究および生産用

Upgradeable 2D Probe Station For Precision Research And Production Product Description: The 2D In Plane-Vertical Magnetic Probe Station is a cutting-edge product designed for precise measurements and analysis of magnetic fields in various applications. This advanced probe station allows for detailed examination of 2D vector fields, making it an ideal tool for researchers and professionals working in fields such as second harmonic testing and spintronics. Key Features: Air Gap

汎用磁気探査ステーションワッファーレベルマニュアル探査ステーション磁気試験

Manual In Plane Probe Station For Wafer Level Magnetic Testing Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for precise and efficient magnetoresistance testing in research and development settings. With a magnetic field strength of 50 MT, this probe station provides reliable and accurate measurements for a wide range of applications. Equipped with PID closed-loop feedback regulation, the magnetic field

高精度RF探査ステーション 50 MT マグネトレジスタンスのためのマニュアル・ウェーファー探査機

Wafer Prober For High Precision Magnetoresistance And RF Testing Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge product designed for RH Testing, offering precise and efficient testing functions for various applications. This advanced probe station is equipped with PID Closed-loop Feedback Regulation for Magnetic Field Resolution, providing an impressive resolution of 0.05 MT for accurate measurements. One of the key

50 MT 磁気プローブステーション RH テスト磁性膜測定用ウェーハプローブステーション

Cost Effective Wafer Probe Station For Magnetic Film Measurement Product Description: Introducing the Wafer-Level Manual In-Plane Magnetic Field Probe Station, a cutting-edge solution for wafer-level electrical measurement with a focus on RH Testing. This innovative probe station is designed to provide precise testing functions for in-plane magnetic fields with a magnetic field resolution of PID Closed-loop Feedback Regulation and an impressive resolution of 0.05 MT. One of

ラボマニュアルワッファー探査ステーション 360 回転する磁場探査ステーション

Manual Wafer Probe Station With 360 Rotation For Lab Research Product Description: The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for research and development (R&D) in the field of magnetic field analysis. This innovative probe station offers precise control and accurate measurements for studying in-plane magnetic fields with ease and efficiency. One of the key features of this probe station is its optical magnification capabiliti

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磁気プローブステーション

平面および垂直磁気プローブステーション 140 MT ウェーハプローバー 高度なテスト用

アップグレード可能な2Dプローブステーション 磁場プローブステーション 精密研究および生産用

汎用磁気探査ステーション ワッファーレベル マニュアル探査ステーション 磁気試験