1D In-Plane Magnetic Field Probe Station Product Introduction The magnetic field probe station is primarily used for testing the electrical and magnetic properties of semiconductor materials, micro/nano devices, magnetic materials, and spintronic devices and related technologies. It can provide a magnetic field or variable temperature environment and perform high-precision DC/RF measurements. Our company designs and manufactures various magnetic field probe stations, which

Magnetic Probe Station For Spintronics And Semiconductor Testing Product Description: The 1D In-Plane Magnetic Field Probe Station is a cutting-edge device designed for precise and efficient characterization of spintronic devices. This advanced probe station offers a myriad of features and capabilities that make it an indispensable tool for researchers and engineers working in the field of spintronics. The probe station is equipped with 4 groups of DC probes, 1 group of RF

High Sensitivity VSM Accurate Vibrating Sample Magnetometer Systems Product Description: Introducing the Vibrating Sample Magnetometer, a cutting-edge device designed for precise and efficient magnetic measurements. This advanced instrument is equipped with a range of features that make it an essential tool for researchers and scientists seeking accurate data on magnetic properties. The sample holder of the Vibrating Sample Magnetometer offers a remarkable ±360-degree

Product Description: The Atomic Force Microscope (AFM) is a highly advanced instrument designed for multifunctional measurement, offering unparalleled versatility and precision in nanoscale imaging and analysis. This state-of-the-art AFM integrates a variety of measurement modes, including Electrostatic Force Microscope (EFM), Scanning Kelvin Probe Force Microscope (KPFM), Piezoelectric Force Microscope (PFM), Magnetic Force Microscope (MFM), and Force Curve analysis, making

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge nanoscale characterization platform designed to provide unparalleled precision and versatility in surface analysis. With a sample size capacity of up to 25 mm, this instrument is ideal for investigating a wide range of materials and structures at the nanoscale, making it an essential tool for researchers and engineers across various scientific disciplines. One of the standout features of this AFM is its

Automated Cryogenic Probe Station With 3T Superconducting Magnet Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge instrument designed for precise measurements in a variety of research and testing applications. This advanced probe station offers exceptional temperature stability with a range from 10 K to 420 K, maintaining a remarkably low temperature variation of less than ±20 MK. Equipped with a vertical superconducti

VSM For Thin Film ,Nanoparticle And Powder Magnetic Characterization Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge magnetic property measurement system that offers precise and reliable magnetic moment measurements. With exceptional repeatability of ±0.5% and stability of ±0.05% full range, this VSM ensures accurate and consistent results for your magnetic material analysis. Equipped with advanced magnetic field parameters, the VSM can generate

All In One Atomic Force Microscope For Flexible Precise Operation Product Description: The Atomic Force Microscope (AFM) is a cutting-edge tool designed for nanoscale electrical measurement and analysis. This advanced instrument offers unparalleled capabilities in scanning and imaging at the nanoscale level, making it an essential device for researchers and scientists working in various fields. Key Product Attributes: Scanning Range: 100 μm X 100 μm x 10 μm Noise Level in the