Low Temperature Probe Station For Magnetic Transport Measurements Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge solution designed for precise measurements in low-temperature environments. This Cryogen Free system offers exceptional performance in sample analysis with its advanced features and capabilities. One of the key highlights of this product is its remarkable Vibration control, ensuring Sample Stage Vibration is less than 1

Cryogenic Vertical Superconducting Magnetic Field Probe Station Product Introduction The PS1DP-Cryo closed-loop cryogenic superconducting magnet probe station, based on a 4 K closed-loop cryogenic probe station, adds a ±3 T superconducting magnet, providing a low-temperature strong magnetic field environment for 2-inch samples. It can accommodate samples for electrical transport testing of 2D materials, spintronic devices, superconducting materials, and Hall effect testing of

Superconducting Magnet Optical Cryostat-MO-Cryo Product Introduction The MO-Cryo superconducting Magnet optical cryostat integrates ultra-low temperatures, strong magnetic fields, and optical testing into a highly integrated and flexible cryogenic system. With 7 side optical windows, 1 top optical window, and 1 bottom window, it enables multi-directional and free optical measurements in a cryogenic strong magnetic-field environment. The internal large sample space accommodate

Turnkey VSM Systems For Fast And Reliable Magnetic Measurements Product Description: The Vibrating Sample Magnetometer (VSM) is a cutting-edge Magnetic Characterization System designed for precise and high-accuracy measurement of magnetic moments in various materials, including Multiferroics. With exceptional capabilities and advanced features, this VSM product offers unmatched performance in magnetic moment measurement, temperature control, sample holder rotation, and

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument designed for high-precision surface analysis and nanoscale electrical measurement. Renowned for its versatility and advanced functionality, this AFM offers a comprehensive suite of features that make it an indispensable tool in both research and industrial applications. With a scanning rate adjustable between 0.1 and 30 Hz, users can tailor the imaging speed to suit a wide range of sample

Product Description: The Atomic Force Microscope (AFM) is a state-of-the-art instrument designed to provide unparalleled precision and versatility in surface property mapping at the nanoscale. Engineered to meet the demanding requirements of advanced research and industrial applications, this AFM offers a comprehensive suite of features that make it an indispensable tool for scientists and engineers working with semiconductors, magnetic materials, and a variety of other

Product Description: The Atomic Force Microscope (AFM) is a highly advanced instrument designed for multifunctional measurement, offering unparalleled versatility and precision in nanoscale imaging and analysis. This state-of-the-art AFM integrates a variety of measurement modes, including Electrostatic Force Microscope (EFM), Scanning Kelvin Probe Force Microscope (KPFM), Piezoelectric Force Microscope (PFM), Magnetic Force Microscope (MFM), and Force Curve analysis, making

Multifunctional Spin-Test Magneto-Optic Kerr Microscope Product Model: KMPL-S Equipment Description: This instrument enables high-resolution magnetic domain imaging of magnetic materials and spintronic chips, with a resolution of up to 250 nm. It is equipped with a highly intelligent control system and multifunctional magnetic field probe station, integrating optical imaging, multi-dimensional magnetic fields, electrical transport characterization, microwave testing, and