Probe Station For Variable Temperature And Magnetic Field Testing Product Description: The 1D In-Plane Magnetic Field Probe Station is a sophisticated tool designed for precise magnetoresistance measurement in research and testing applications. This magnetic probe station is equipped with advanced features to ensure accurate and reliable data collection, making it an essential instrument for researchers and scientists working in the field of magnetoresistance measurement. The

Wafer-Level Manual In-Plane Magnetic Field Probe Station Product Introduction The wafer-level manual in-plane magnetic field probe station PS1D-Manu8 is a high-precision device designed for wafer testing, suitable for electrical and magnetic measurements in laboratories and enterprises. It provides a highly uniform in-plane magnetic field to ensure stable testing environments and is compatible with multiple sample sizes to meet diverse testing needs. With manually adjustable

Cryo Probe Station For In Plane Magnetic Device Transport Testing Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for advanced research in electrical transport property testing and spin pumping measurement. This versatile system offers precise control and measurement capabilities for studying a wide range of materials and devices. Key features of this probe station include: Sample Rotation Range: 360 Degrees - The

Cryogenic Prober For Spintronics And Semiconductor Device Testing Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a versatile and advanced Spintronics Testing Platform designed for precise and accurate spin pumping measurement at low temperatures. This cutting-edge probe station offers exceptional capabilities for researchers and engineers working on spin-related experiments. Key Features: Probe Arm Stroke: X+Z, 50 Mm-25 Mm-25 Mm Sample Temperature

Automated MRAM Tester For Production And Batch Final Testing Product Description: The Magnetic Chip Final Test Machine is an advanced Automated Tri-temp MRAM Tester designed to provide precise and reliable testing for magnetic chips. Equipped with cutting-edge features, this machine ensures accurate results and efficient performance. Excitation System3: The True Zero Value Of The Magnetic Field Under Zero Magnetic Field Is ≤0.1 Oe. This feature guarantees the machine's

ATE For Non Destructive Magnetic And Electrical Chip Properties Product Description: One of the key highlights of this product is its Excitation System2, which ensures the uniformity of the X-axis magnetic field with an impressive accuracy of ≤±1% at 2000 Oe within a Φ35 mm spherical space. This level of precision guarantees consistent and reliable test results, particularly when analyzing in-plane magnetic fields. Moreover, the Excitation System4 of the machine boasts a

Superconducting Magnet Probe Station For Hall And SOT Testing Product Description: The Cryogenic Vertical Superconducting Magnetic Field Probe Station is a cutting-edge product designed for precise and efficient testing of semiconductor devices and spintronic devices. Equipped with standard 4 probe arms, this probe station can support up to 8 probe arms, providing flexibility and scalability for various testing needs. Featuring X-Y-Z probe arm stroke dimensions of 50 mm, 25

Multi Functional Atomic Force Microscope With MFM EFM PFM Modes Product Description: One of the key features of the AFM is its low noise levels in both the Z direction and XY direction, ensuring accurate and reliable measurements. The noise level in the Z direction is an impressive 0.04 Nm, providing exceptional sensitivity for capturing subtle surface variations and interactions. In the XY direction, the noise level is maintained at 0.4 Nm, further enhancing the precision of