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原子力顕微鏡
高解像度原子力顕微鏡 0.04 Nm ナノスケール解析のための産業顕微鏡
High-Resolution Atomic Force Microscope For Nanoscale Analysis Product Description: The Atomic Force Microscope (AFM) is a versatile tool for surface analysis, commonly used in various scientific and industrial applications. This cutting-edge device offers exceptional scanning capabilities and precise imaging for detailed analysis of samples. One of the key features of the AFM is its impressive Scanning Speed range, which allows for precise scanning at speeds ranging from 0
高解像度原子力顕微鏡 0.04 Nm ナノスケール解析のための産業顕微鏡
生物原子力顕微鏡 高精度スキャン探査機顕微鏡 0.15 Nm解像度
High Precision Scanning Probe Microscope 0.15 Nm Resolution Product Description: The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers exceptional capabilities for nanometer resolution surface analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM product provides precise imaging and measurement of samples with dimensions up to 200 mm. One of the key features of this AFM is its versatility in probe types. Users can choose from a variety of
生物原子力顕微鏡 高精度スキャン探査機顕微鏡 0.15 Nm解像度
0.15 nm 高分解能顕微鏡 カスタマイズされた原子顕微鏡
Advanced Atomic Force Microscope For High-Resolution Imaging Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-resolution imaging and nanoscale analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM offers atomic resolution imaging capabilities that are essential for a wide range of research applications. Equipped with multiple imaging modes including Contact, Tapping, Non-Contact, Lateral Force, Force Modulation, and
0.15 nm 高分解能顕微鏡 カスタマイズされた原子顕微鏡
カー顕微鏡
ヒステレシス・ループ・インストラム 精度測定 ループ・トレーサ 1 Mdeg
Easy To Use Hysteresis Loop Instrument For Precision Measurements Product Description: The Miniature Hysteresis Loop Measurement Instrument is a high-quality inspection tool designed for efficiently characterizing the hysteresis loop of PMA films within just 15 seconds. This non-destructive magnetic tester offers precise measurements with a magnetic field resolution of 0.05 MT, ensuring accurate results for quality inspection purposes. With a vertical magnetic field of 650 MT
ヒステレシス・ループ・インストラム 精度測定 ループ・トレーサ 1 Mdeg
恒久磁石ケール顕微鏡 ベクトル顕微鏡モーク 450Nm 硬磁性物質の3D分析
Vector MOKE Microscope For 3D Analysis Of Hard Magnetic Materials Product Description: The Permanent Magnet Kerr Microscope is a cutting-edge tool designed for high-resolution imaging and detailed observation of magnetic materials. With a variable temperature range of 298 K to 798 K, this microscope enables researchers to study material properties across a wide temperature spectrum, allowing for in-depth analysis of magnetic behavior under varying thermal conditions.
恒久磁石ケール顕微鏡 ベクトル顕微鏡モーク 450Nm 硬磁性物質の3D分析
デスクトップMOKEシステム 破壊性のない薄膜ヒステレシス分析のためのヒステレシスループトレーサ
Desktop MOKE for Non destructive Thin Film Hysteresis Analysis Product Description: The Miniature Hysteresis Loop Measurement Instrument is a cutting-edge device designed for rapid magnetic film analysis and precise measurement of coercivity using MOKE magnetometer technology. This advanced instrument features an intuitive operating system with a 10.4-inch all-in-one touch control panel running on the WIN7 system, providing a user-friendly interface for efficient data
デスクトップMOKEシステム 破壊性のない薄膜ヒステレシス分析のためのヒステレシスループトレーサ
マグニートー光クライオスタット
高場光学結晶器 1.7 K - 350 K 温度範囲 MO クリオ 多方向光学アクセス
High Field Optical Cryostat With Multi Directional Optical Access Product Description: The Magneto Optical Cryostat is a cutting-edge research tool designed for precise measurements in the fields of 2D Materials, High Magnetic Field, and Magneto optical measurements. This innovative cryostat offers exceptional performance and versatility, making it ideal for a wide range of experimental setups. Featuring 16 DC Lines and 4 20 GHz RF Lines, the Magneto Optical Cryostat provides
高場光学結晶器 1.7 K - 350 K 温度範囲 MO クリオ 多方向光学アクセス
高速冷却磁気光学クライオスタット 1 トップウィンドウ MOクライオスタット 先端材料研究用
Fast Cooldown MO-Cryostat for Advanced Material Research Product Description: The Ultra-Low-Temperature Superconducting-Magnet Integrated Optical Property Measurement Cryostat is a cutting-edge system designed for researchers working with quantum materials and conducting cryogenic microscopy experiments. This advanced cryostat offers precise control over temperature stability, sample space, magnetic field strength, and optical windows, making it an ideal solution for a wide
高速冷却磁気光学クライオスタット 1 トップウィンドウ MOクライオスタット 先端材料研究用
極低温プローブステーション
4Kデバイス測定用のクライゲーゲンフリーの自動プローブステーション低温真空プローブステーション
Cryogen Free Probe Station For Automated 4K Device Measurements Product Description: The Cryogenic Probe Station is a cutting-edge device designed for cryogen-free, cost-effective, and precise cryogenic device characterization. With its advanced features and capabilities, this probe station offers unparalleled performance for research and testing applications. One of the key highlights of the Cryogenic Probe Station is its probe arm configuration. The standard configuration
4Kデバイス測定用のクライゲーゲンフリーの自動プローブステーション低温真空プローブステーション
自動磁気測定のための精密冷凍探査ステーション
Cryogen Free Probe Station For Automated Magnetic Measurements Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for researchers and scientists working with Spintronic Devices. This advanced probe station offers precise control and measurement capabilities for studying the electrical transport properties of materials under High Magnetic Fields. Key Features: Vacuum: The probe station is equipped with a Low-temperature
自動磁気測定のための精密冷凍探査ステーション
MRAMテスター
三温磁気チップテスター 高信頼性検証用精密最終テスター
Tri Temp Magnetic Chip Tester For High Reliability Verification Product Description: Introducing the cutting-edge Magnetic Chip Final Test Machine, the ultimate solution for ATE for Magnetic Chips. This innovative product is designed to meet the demanding requirements of testing magnetic chips with precision and accuracy. The Socket Test Seat of the Magnetic Chip Final Test Machine is engineered to withstand extreme temperatures ranging from -60°C to 170°C, ensuring reliable
三温磁気チップテスター 高信頼性検証用精密最終テスター
磁気チップ製造ライン向け精密MRAMテスター自動最終テストシステム
Automated Final Test System For Magnetic Chip Production Lines Product Description: Excitation System1: One of the key features of this magnetic chip final test machine is the excitation system's capability to generate a maximum magnetic field intensity of ±2000 Oe along the X-axis. This high magnetic field intensity ensures thorough testing of magnetic chips for a wide range of applications. Excitation System3: Another remarkable attribute of this MRAM tester is the
