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Mikroskop Kerr

Jakość 0.5 Mdeg Kerr Microscope Precision Cryogenic Microscope For 2D Ferromagnetic Material Analysis fabryka

0.5 Mdeg Kerr Microscope Precision Cryogenic Microscope For 2D Ferromagnetic Material Analysis

Cryogenic Kerr Microscope For 2D Ferromagnetic Material Analysis Product Description: The Cryogenic High-Magnetic-Field Laser Kerr Microimaging System is a cutting-edge scientific instrument designed for researchers and scientists working in the field of Low Temperature Magneto-Optics. This advanced system offers unparalleled capabilities for Micro-region Kerr measurement and Magnetization measurement, making it an essential tool for studying magnetic materials at the

Jakość System MOKE kriogeniczny do obrazowania magnetyzacji w badaniach naukowych fabryka

System MOKE kriogeniczny do obrazowania magnetyzacji w badaniach naukowych

Cryo MOKE System For Magnetization Imaging Of Spintronic Materials Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool designed for precise and convenient in-plane and vertical magnetic field measurements. This instrument is an essential component of any Cryogenic Magnetic Imaging System and 2D Material Characterization System, providing researchers with valuable data for their scientific experiments. With an in-plane

Jakość Kriogeniczny MOKE Mikroskop Kerra do Pomiaru Pętli Histerezy dla Analizy 2D Materiałów Ferromagnetycznych fabryka

Kriogeniczny MOKE Mikroskop Kerra do Pomiaru Pętli Histerezy dla Analizy 2D Materiałów Ferromagnetycznych

Cryogenic Kerr Microscope For 2D Ferromagnetic Material Analysis Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool designed to provide high sensitivity and precise measurement capabilities for magnetic domain imaging and magnetization measurement in scientific research applications. Key features of this instrument include: Kerr Angle Resolution: Achieving a remarkable 0.3 Mdeg (RMS) Kerr angle resolution, ensuring

Jakość Wysokoczuły system MOKE do pomiaru pętli histerezy dla badania słabego magnetyzmu i materiałów 2D fabryka

Wysokoczuły system MOKE do pomiaru pętli histerezy dla badania słabego magnetyzmu i materiałów 2D

High Sensitivity MOKE for Weak Magnetism and 2D Material Study Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool specifically designed for the characterization of weak magnetic materials. This advanced system offers unparalleled Magnetic Field Resolution through PID Closed-loop Feedback Regulation, with an impressive resolution of 0.02 MT. This level of precision enables researchers to explore the intricate magnetic

Jakość Mikroskop Kerr o niskiej temperaturze i wysokim polu laserowy Mikroskop MOKE do obrazowania mikro-regionów fabryka

Mikroskop Kerr o niskiej temperaturze i wysokim polu laserowy Mikroskop MOKE do obrazowania mikro-regionów

Low Temp High Field Laser Kerr Microscope For Micro Region Imaging Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool designed for precise magnetization measurements in scientific research applications. This advanced instrument offers a range of features that make it ideal for studying magnetic properties with high accuracy and reliability. One of the key attributes of this instrument is its capability to measure In

Jakość System MOKE na poziomie płytki 0,3 Mdeg dla szybkich pętli histerezy i kontroli procesu fabryka

System MOKE na poziomie płytki 0,3 Mdeg dla szybkich pętli histerezy i kontroli procesu

Wafer Level MOKE For Rapid Hysteresis Loops And Process Control Product Description: The Wafer-Level Hysteresis Loop Measurement Instrument is a cutting-edge tool designed for non-destructive hysteresis loop measurement of magnetic stacks/devices, automatic extraction of hysteresis loop information including free layer and pinned layer Hc, Hex, and M (Kerr angle value), as well as rapid mapping of wafer magnetic characteristic distribution. With an impressive uptime of 90%,

Jakość System Pomiaru Płytki w Wysokim Polu MOKE Skaner Płytki dla MRAM i Charakterystyki Filmów Magnetycznych fabryka

System Pomiaru Płytki w Wysokim Polu MOKE Skaner Płytki dla MRAM i Charakterystyki Filmów Magnetycznych

High Field Wafer MOKE For MRAM And Magnetic Film Characterization Product Description: MOKE Wafer Scanner is a cutting-edge instrument designed for precise and efficient Wafer-Level Hysteresis Loop Measurement of magnetic stacks and devices. This advanced tool offers a range of testing functions that make it an indispensable asset for researchers and manufacturers in the field of thin film magnetic wafer inspection. One of the key features of the MOKE Wafer Scanner is its non

Jakość Spin Test Magneto Optic Kerr Microscope Multifunctional Research Microscope For Material Analysis fabryka

Spin Test Magneto Optic Kerr Microscope Multifunctional Research Microscope For Material Analysis

Material Analysis With Multifunctional SpinTest MagnetoOptic Kerr Microscope Product Description: The Multifunctional Spin-Test Magneto-Optic Kerr Microscope is a cutting-edge instrument designed for researchers and professionals in the field of spintronic devices. This advanced microscope offers unparalleled capabilities for studying magnetic thin films with exceptional precision and detail. One of the key features of this microscope is its Magnetic Field Resolution, which

Jakość Skaner płytek MOKE EFEM System pomiaru płytek do map histerezy i jednorodności magnetycznej fabryka

Skaner płytek MOKE EFEM System pomiaru płytek do map histerezy i jednorodności magnetycznej

MOKE Wafer Scanner For Hysteresis And Magnetic Uniformity Maps Product Description: Introducing the Wafer-Level Hysteresis Loop Measurement Instrument, a cutting-edge tool in Spintronics Metrology designed to meet the demanding requirements of advanced research and development in the field. This innovative product offers unparalleled capabilities for precise and efficient measurement of magnetic properties at the wafer level. One of the key features of this state-of-the-art

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