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Microscopio Kerr

Qualità 0.5 Mdeg Microscopio Kerr di Precisione Criogenico per l'Analisi di Materiali Ferromagnetici 2D fabbrica

0.5 Mdeg Microscopio Kerr di Precisione Criogenico per l'Analisi di Materiali Ferromagnetici 2D

Cryogenic Kerr Microscope For 2D Ferromagnetic Material Analysis Product Description: The Cryogenic High-Magnetic-Field Laser Kerr Microimaging System is a cutting-edge scientific instrument designed for researchers and scientists working in the field of Low Temperature Magneto-Optics. This advanced system offers unparalleled capabilities for Micro-region Kerr measurement and Magnetization measurement, making it an essential tool for studying magnetic materials at the

Qualità Cryo MOKE System Investigazioni scientifiche Strumenti di misurazione per l'imaging di magnetizzazione fabbrica

Cryo MOKE System Investigazioni scientifiche Strumenti di misurazione per l'imaging di magnetizzazione

Cryo MOKE System For Magnetization Imaging Of Spintronic Materials Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool designed for precise and convenient in-plane and vertical magnetic field measurements. This instrument is an essential component of any Cryogenic Magnetic Imaging System and 2D Material Characterization System, providing researchers with valuable data for their scientific experiments. With an in-plane

Qualità Strumento per la misurazione di cicli di isteresi con microscopio MOKE Kerr criogenico per l'analisi di materiali ferromagnetici 2D fabbrica

Strumento per la misurazione di cicli di isteresi con microscopio MOKE Kerr criogenico per l'analisi di materiali ferromagnetici 2D

Cryogenic Kerr Microscope For 2D Ferromagnetic Material Analysis Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool designed to provide high sensitivity and precise measurement capabilities for magnetic domain imaging and magnetization measurement in scientific research applications. Key features of this instrument include: Kerr Angle Resolution: Achieving a remarkable 0.3 Mdeg (RMS) Kerr angle resolution, ensuring

Qualità Sistema MOKE ad alta sensibilità strumento di misura del ciclo di isteresi per il magnetismo debole e lo studio dei materiali 2D fabbrica

Sistema MOKE ad alta sensibilità strumento di misura del ciclo di isteresi per il magnetismo debole e lo studio dei materiali 2D

High Sensitivity MOKE for Weak Magnetism and 2D Material Study Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool specifically designed for the characterization of weak magnetic materials. This advanced system offers unparalleled Magnetic Field Resolution through PID Closed-loop Feedback Regulation, with an impressive resolution of 0.02 MT. This level of precision enables researchers to explore the intricate magnetic

Qualità Microscopio Kerr Laser MOKE per imaging di micro regioni a bassa temperatura e alto campo fabbrica

Microscopio Kerr Laser MOKE per imaging di micro regioni a bassa temperatura e alto campo

Low Temp High Field Laser Kerr Microscope For Micro Region Imaging Product Description: The Hysteresis Loop Measurement Instrument for Scientific Research is a cutting-edge tool designed for precise magnetization measurements in scientific research applications. This advanced instrument offers a range of features that make it ideal for studying magnetic properties with high accuracy and reliability. One of the key attributes of this instrument is its capability to measure In

Qualità Sistema MOKE a livello di wafer 0,3 Mdeg per cicli di isteresi rapida e controllo dei processi fabbrica

Sistema MOKE a livello di wafer 0,3 Mdeg per cicli di isteresi rapida e controllo dei processi

Wafer Level MOKE For Rapid Hysteresis Loops And Process Control Product Description: The Wafer-Level Hysteresis Loop Measurement Instrument is a cutting-edge tool designed for non-destructive hysteresis loop measurement of magnetic stacks/devices, automatic extraction of hysteresis loop information including free layer and pinned layer Hc, Hex, and M (Kerr angle value), as well as rapid mapping of wafer magnetic characteristic distribution. With an impressive uptime of 90%,

Qualità Sistema di misurazione dei wafer ad alto campo MOKE Wafer Scanner per la caratterizzazione della MRAM e del film magnetico fabbrica

Sistema di misurazione dei wafer ad alto campo MOKE Wafer Scanner per la caratterizzazione della MRAM e del film magnetico

High Field Wafer MOKE For MRAM And Magnetic Film Characterization Product Description: MOKE Wafer Scanner is a cutting-edge instrument designed for precise and efficient Wafer-Level Hysteresis Loop Measurement of magnetic stacks and devices. This advanced tool offers a range of testing functions that make it an indispensable asset for researchers and manufacturers in the field of thin film magnetic wafer inspection. One of the key features of the MOKE Wafer Scanner is its non

Qualità Spin Test Magneto Microscopio Ottico Kerr Microscopio di Ricerca Multifunzionale Per Analisi dei Materiali fabbrica

Spin Test Magneto Microscopio Ottico Kerr Microscopio di Ricerca Multifunzionale Per Analisi dei Materiali

Material Analysis With Multifunctional SpinTest MagnetoOptic Kerr Microscope Product Description: The Multifunctional Spin-Test Magneto-Optic Kerr Microscope is a cutting-edge instrument designed for researchers and professionals in the field of spintronic devices. This advanced microscope offers unparalleled capabilities for studying magnetic thin films with exceptional precision and detail. One of the key features of this microscope is its Magnetic Field Resolution, which

Qualità MOKE Wafer Scanner EFEM Sistema di Misura Wafer per Mappe di Isteresi e Uniformità Magnetica fabbrica

MOKE Wafer Scanner EFEM Sistema di Misura Wafer per Mappe di Isteresi e Uniformità Magnetica

MOKE Wafer Scanner For Hysteresis And Magnetic Uniformity Maps Product Description: Introducing the Wafer-Level Hysteresis Loop Measurement Instrument, a cutting-edge tool in Spintronics Metrology designed to meet the demanding requirements of advanced research and development in the field. This innovative product offers unparalleled capabilities for precise and efficient measurement of magnetic properties at the wafer level. One of the key features of this state-of-the-art

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