
1D In Plane Semiconductor Probe Station Magnetic Field Probe Station
1D Semiconductor Probe Station
,In Plane Semiconductor Probe Station
,Magnetic Field Probe Station
Basic Properties
Trading Properties
The magnetic field probe station is primarily used for testing the electrical and magnetic properties of semiconductor materials, micro/nano devices, magnetic materials, and spintronic devices and related technologies. It can provide a magnetic field or variable temperature environment and perform high-precision DC/RF measurements. Our company designs and manufactures various magnetic field probe stations, which are stable, multifunctional, and upgradeable, suitable for experimental research and production in universities, research institutes, and the semiconductor industry.
Equipment Performance Indicator | Description |
---|---|
Magnetic Field Strength | 1 T@air gap 20 mm |
Magnetic Field Uniformity | ±1%φ1 mm |
Magnetic Field Resolution | PID closed-loop feedback regulation, resolution 0.05 mT |
Air Gap | Adjustable from 0-80 mm |
Sample Displacement Stage | XY-axis adjustable stroke ±15 mm, adjustment sensitivity 10 μm; T-axis 360-degree electric rotation |
Probe Seat | 4 groups of DC probes, 1 group of RF probes, 8-pin wire-bonded sample seat |
Optical Magnification | 0.75 X-5 X |
Source Meter | SR830, N5173B, Keithley 6221, Keithley 2182A |
Testing Functions | RH, second harmonic, ST-FMR, spin pumping, all with magnetic field angle testing. |

- Second Harmonic

- ST-FMR