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1D In Plane Semiconductor Probe Station Magnetic Field Probe Station

1D In-Plane Magnetic Field Probe Station Product Introduction The magnetic field probe station is primarily used for testing the electrical and magnetic properties of semiconductor materials, micro/nano devices, magnetic materials, and spintronic devices and related technologies. It can provide a magnetic field or variable temperature environment and perform high-precision DC/RF measurements. Our company designs and manufactures various magnetic field probe stations, which
Product Details
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1D Semiconductor Probe Station

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In Plane Semiconductor Probe Station

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Magnetic Field Probe Station

Name: Semiconductor Probe Station
Probe Seat: 4 Groups Of DC Probes, 1 Group Of RF Probes, 8-pin Wire-bonded Sample Seat
Magnetic Field Uniformity: ±1%φ1 Mm
Magnetic Field Strength: 1 T@air Gap 20 Mm
Magnetic Field Resolution: PID Closed-loop Feedback Regulation, Resolution 0.05 MT
Sample Displacement Stage: X-axis Adjustable Stroke ±15 Mm, Adjustment Sensitivity 10 μm; Taxis 360-degree Electric Rotation
Optical Magnification: 0.75 X-5 X
Source Meter: SR830, N5173B, Keithley 6221, Keithley 2182A
Air Gap: Adjustable From 0-80 Mm

Basic Properties

Place of Origin: CHINA
Brand Name: Truth Instruments
Model Number: PS1DX-MS

Trading Properties

Price: Price Negotiable | Contact us for a detailed quote
Payment Terms: T/T
Product Description
1D In-Plane Magnetic Field Probe Station
Product Introduction

The magnetic field probe station is primarily used for testing the electrical and magnetic properties of semiconductor materials, micro/nano devices, magnetic materials, and spintronic devices and related technologies. It can provide a magnetic field or variable temperature environment and perform high-precision DC/RF measurements. Our company designs and manufactures various magnetic field probe stations, which are stable, multifunctional, and upgradeable, suitable for experimental research and production in universities, research institutes, and the semiconductor industry.

Equipment Performance
Equipment Performance Indicator Description
Magnetic Field Strength 1 T@air gap 20 mm
Magnetic Field Uniformity ±1%φ1 mm
Magnetic Field Resolution PID closed-loop feedback regulation, resolution 0.05 mT
Air Gap Adjustable from 0-80 mm
Sample Displacement Stage XY-axis adjustable stroke ±15 mm, adjustment sensitivity 10 μm; T-axis 360-degree electric rotation
Probe Seat 4 groups of DC probes, 1 group of RF probes, 8-pin wire-bonded sample seat
Optical Magnification 0.75 X-5 X
Source Meter SR830, N5173B, Keithley 6221, Keithley 2182A
Testing Functions RH, second harmonic, ST-FMR, spin pumping, all with magnetic field angle testing.
Application Cases
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