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In Plane Magnetic Probe Station Versatile DC Probe Station For Precision Device Testing

In Plane Magnetic Probe Station For Precision Device Testing Product Description: The 1D In-Plane Magnetic Field Probe Station is a versatile and advanced tool designed for precise measurements of magnetic fields in a variety of research and industrial applications. Equipped with a range of source meters including the SR830, N5173B, Keithley 6221, and Keithley 2182A, this probe station offers unparalleled flexibility and compatibility with different experimental setups. One
Product Details
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In Plane Magnetic Probe Station

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Magnetic Probe Station Versatile

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Versatile DC Probe Station

Sample Displacement Stage: X-axis Adjustable Stroke ±15 Mm, Adjustment Sensitivity 10 μm; Taxis 360-degree Electric Rotation
Magnetic Field Resolution: PID Closed-loop Feedback Regulation, Resolution 0.05 MT
Optical Magnification: 0.75 X-5 X
Probe Seat: 4 Groups Of DC Probes, 1 Group Of RF Probes, 8-pin Wire-bonded Sample Seat
Source Meter: SR830, N5173B, Keithley 6221, Keithley 2182A
Air Gap: Adjustable From 0-80 Mm
Magnetic Field Uniformity: ±1%φ1 Mm
Magnetic Field Strength: 1 T@air Gap 20 Mm

Basic Properties

Brand Name: Truth Instruments
Model Number: PS1DX-MS

Trading Properties

Price: Price Negotiable | Contact us for a detailed quote
Payment Terms: T/T
Product Description

In Plane Magnetic Probe Station For Precision Device Testing

Product Description:

The 1D In-Plane Magnetic Field Probe Station is a versatile and advanced tool designed for precise measurements of magnetic fields in a variety of research and industrial applications. Equipped with a range of source meters including the SR830, N5173B, Keithley 6221, and Keithley 2182A, this probe station offers unparalleled flexibility and compatibility with different experimental setups.

One of the key features of the 1D In-Plane Magnetic Field Probe Station is its optical magnification capabilities, ranging from 0.75X to 5X. This allows for detailed and accurate observations of magnetic field interactions at various scales, providing valuable insights into the behavior of materials under different conditions.

With a magnetic field strength of 1 Tesla at an air gap of 20 mm, this probe station is capable of generating and measuring high-intensity magnetic fields with precision and reliability. The magnetic field uniformity of ±1% over a 1 mm diameter ensures consistent and repeatable results, making it ideal for demanding experimental requirements.

For enhanced accuracy and control, the 1D In-Plane Magnetic Field Probe Station features PID closed-loop feedback regulation with a resolution of 0.05 mT. This advanced regulation system ensures stable and consistent magnetic field measurements, enabling researchers to achieve reliable and reproducible results with confidence.

Designed with expandable functions and versatile capabilities, the 1D In-Plane Magnetic Field Probe Station offers researchers the flexibility to adapt to changing experimental needs and explore new research avenues. Whether studying magnetic materials, investigating magnetic field effects on electronic devices, or conducting fundamental research in magnetism, this probe station provides the tools and precision required for cutting-edge research.

In addition to its advanced magnetic field measurement capabilities, the 1D In-Plane Magnetic Field Probe Station also offers variable temperature control options, allowing researchers to study the effects of temperature on magnetic properties and behavior. By combining precise magnetic field measurements with variable temperature control, researchers can gain a comprehensive understanding of the complex interplay between magnetic fields and temperature in a wide range of materials and systems.

 

Features:

  • Product Name: 1D In-Plane Magnetic Field Probe Station
  • Air Gap: Adjustable From 0-80 mm
  • Probe Seat:
    • 4 Groups of DC Probes
    • 1 Group of RF Probes
    • 8-pin Wire-bonded Sample Seat
  • Source Meter: SR830, N5173B, Keithley 6221, Keithley 2182A
  • Magnetic Field Uniformity: ±1%φ1 mm
  • Sample Displacement Stage:
    • X-axis Adjustable Stroke ±15 mm
    • Adjustment Sensitivity 10 μm
    • Taxis 360-degree Electric Rotation
 

Technical Parameters:

Magnetic Field Uniformity ±1%φ1 Mm
Magnetic Field Strength 1 T@air Gap 20 Mm
Magnetic Field Resolution PID Closed-loop Feedback Regulation, Resolution 0.05 MT
Sample Displacement Stage X-axis Adjustable Stroke ±15 Mm, Adjustment Sensitivity 10 μm; Taxis 360-degree Electric Rotation
Source Meter SR830, N5173B, Keithley 6221, Keithley 2182A
Air Gap Adjustable From 0-80 Mm
Optical Magnification 0.75 X-5 X
Probe Seat 4 Groups Of DC Probes, 1 Group Of RF Probes, 8-pin Wire-bonded Sample Seat
 

Applications:

Product Name: Truth Instruments 1D In-Plane Magnetic Field Probe Station (Model: PS1DX-MS)

Place Of Origin: CHINA

Probe Seat: 4 Groups Of DC Probes, 1 Group Of RF Probes, 8-pin Wire-bonded Sample Seat

Magnetic Field Uniformity: ±1%φ1 Mm

Magnetic Field Strength: 1 T@air Gap 20 Mm

Air Gap: Adjustable From 0-80 Mm

Magnetic Field Resolution: PID Closed-loop Feedback Regulation, Resolution 0.05 MT

Product Application Occasions and Scenarios:

The Truth Instruments 1D In-Plane Magnetic Field Probe Station (Model: PS1DX-MS) is a versatile tool that finds applications in various industries and research fields.

DC and RF Device Testing: This probe station is ideal for conducting tests on DC and RF devices. With 4 groups of DC probes and 1 group of RF probes, it provides accurate measurements and analysis for different types of devices.

Hall Effect Testing: The precise magnetic field uniformity and strength of this probe station make it perfect for Hall effect testing in semiconductor materials. Researchers and engineers can rely on its consistent performance to study and analyze Hall effect phenomena.

Semiconductor Industry: In the semiconductor industry, where precision and accuracy are crucial, the Truth Instruments 1D In-Plane Magnetic Field Probe Station plays a vital role. Its adjustable air gap, high magnetic field resolution, and reliable feedback regulation make it a valuable tool for characterizing semiconductor materials and devices.

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