
Lab Manual Wafer Probe Station Magnetic Field Probing Station With 360 Rotation
Lab Manual Wafer Probe Station
,Magnetic Field Probing Station
,Lab Probing Station
Basic Properties
Trading Properties
Manual Wafer Probe Station With 360 Rotation For Lab Research
Product Description:
The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for research and development (R&D) in the field of magnetic field analysis. This innovative probe station offers precise control and accurate measurements for studying in-plane magnetic fields with ease and efficiency.
One of the key features of this probe station is its optical magnification capabilities, ranging from 0.75X to 5X. This allows users to closely examine samples and analyze magnetic field patterns with enhanced clarity and detail.
Equipped with PID closed-loop feedback regulation, the probe station boasts an impressive magnetic field resolution of 0.05 MT. This high level of accuracy ensures reliable and consistent measurement results, making it ideal for demanding research applications.
The probe station is designed with 4 groups of DC probes, providing versatile and flexible probing options for various sample configurations. This enables users to conduct detailed magnetic field measurements with precision and convenience.
Ensuring superior performance, the probe station offers magnetic field uniformity better than ±1%φ1 mm. This exceptional level of uniformity guarantees reliable and reproducible results, making it a valuable tool for research and analysis.
Compatible with sample sizes up to 8 inches and below, this probe station accommodates a wide range of sample types and sizes, offering versatility and adaptability for different research needs.
Features:
- Product Name: Wafer-Level Manual In-Plane Magnetic Field Probe Station
- Magnetic Field Strength: 50 MT
- Magnetic Field Resolution: PID Closed-loop Feedback Regulation, Resolution 0.05 MT
- Optical Magnification: 0.75 X-5 X
- Sample Size: Compatible With 8-inch And Below
- Magnetic Field Uniformity: Better Than ±1%φ1 Mm
Technical Parameters:
Probe Seat: | 4 Groups Of DC Probes |
Testing Functions: | RH Testing |
Magnetic Field Resolution: | PID Closed-loop Feedback Regulation, Resolution 0.05 MT |
Magnetic Field Uniformity: | Better Than ±1%φ1 Mm |
Magnetic Field Strength: | 50 MT |
Optical Magnification: | 0.75 X-5 X |
Sample Size: | Compatible With 8-inch And Below |
Applications:
Truth Instruments presents the Wafer-Level Manual In-Plane Magnetic Field Probe Station, model number PS1D-Manu8, designed and manufactured in CHINA. This innovative product is ideal for a variety of Product Application Occasions and Scenarios due to its remarkable attributes.
With a Sample Size compatibility of 8-inch and below, this probe station offers a Flexible and Versatile solution for magnetic field testing. The Magnetic Field Resolution is ensured through PID Closed-loop Feedback Regulation, providing Precise Control with a resolution of 0.05 MT. This level of accuracy makes it suitable for a wide range of applications requiring detailed magnetic field analysis.
The Magnetic Field Uniformity of this probe station is exceptional, with a tolerance Better Than ±1%φ1 mm. This high level of consistency ensures reliable and repeatable results across various experiments and testing scenarios. Additionally, the Magnetic Field Strength capability of up to 50 MT allows for thorough testing of magnetic properties with ease.
One of the key Testing Functions of this probe station is RH Testing, enabling users to conduct comprehensive magnetic field assessments. Whether in research facilities, academic institutions, or industrial settings, the PS1D-Manu8 offers a Flexible and Versatile solution for magnetic field analysis.