High Precision RF Probe Station 50 MT Manual Wafer Prober For Magnetoresistance

Product Description:

The Wafer-Level Manual In-Plane Magnetic Field Probe Station is a cutting-edge product designed for RH Testing, offering precise and efficient testing functions for various applications. This advanced probe station is equipped with PID Closed-loop Feedback Regulation for Magnetic Field Resolution, providing an impressive resolution of 0.05 MT for accurate measurements.

One of the key features of this probe station is its exceptional Magnetic Field Uniformity, surpassing the industry standards with a uniformity better than ±1%φ1 Mm. This ensures consistent and reliable results across different testing scenarios, making it an ideal choice for demanding research and development projects.

With a Magnetic Field Strength of 50 MT, this probe station delivers robust performance capabilities, allowing users to conduct comprehensive tests with high magnetic field strength requirements. Whether it's DC probing or RF probing, this system is well-equipped to handle a wide range of testing needs with precision and efficiency.

Furthermore, the Wafer-Level Manual In-Plane Magnetic Field Probe Station offers Optical Magnification ranging from 0.75 X to 5 X, allowing users to magnify the details of the samples under test for enhanced visibility and analysis. This optical feature enhances the accuracy and quality of measurements, making it a valuable tool for wafer-level electrical measurement and analysis.

Designed to be cost-effective without compromising on performance, this probe station is a reliable solution for research laboratories, manufacturing facilities, and academic institutions looking to optimize their testing processes. The combination of advanced features, precise measurements, and user-friendly operation makes it a versatile and efficient tool for a wide range of applications.

Features:

• Product Name: Wafer-Level Manual In-Plane Magnetic Field Probe Station
• Probe Seat: 4 Groups Of DC Probes
• Magnetic Field Uniformity: Better Than ±1%φ1 Mm
• Testing Functions: RH Testing
• Optical Magnification: 0.75 X-5 X
• Magnetic Field Strength: 50 MT

Technical Parameters:

Applications:

Truth Instruments' Wafer-Level Manual In-Plane Magnetic Field Probe Station, model PS1D-Manu8, is an essential tool for high-precision magnetic field testing applications. Designed and manufactured in CHINA, this probe station is specifically engineered to provide accurate and reliable magnetic field measurements in a variety of scenarios.

The magnetic field strength of 50 MT makes this probe station suitable for a wide range of testing functions, with a focus on RH testing. The PID closed-loop feedback regulation system ensures precise control over the magnetic field resolution, achieving an impressive resolution of 0.05 MT. This level of accuracy is crucial for demanding applications that require high precision measurements.

One of the key features of this probe station is its compatibility with sample sizes of 8-inch and below, making it suitable for full wafer testing. The ability to test full wafers allows for comprehensive and efficient evaluation of magnetic field characteristics across a large surface area, saving time and resources in the testing process.

In addition to its high precision capabilities, the PS1D-Manu8 probe station offers optical magnification ranging from 0.75X to 5X, providing users with detailed insights into the magnetic field properties of their samples. This level of optical magnification is essential for analyzing subtle variations in magnetic field strength and distribution.

Overall, the Truth Instruments Wafer-Level Manual In-Plane Magnetic Field Probe Station is an indispensable tool for researchers, scientists, and engineers working in fields that require precise control and high precision magnetic field measurements. Its versatility, reliability, and advanced features make it a top choice for applications where accuracy and efficiency are paramount.